Non-destructive inspection methods and systems

US10346966B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10346966-B2
Application numberUS-201415527684-A
CountryUS
Kind codeB2
Filing dateDec 18, 2014
Priority dateDec 18, 2014
Publication dateJul 9, 2019
Grant dateJul 9, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A non-destructive inspection method that comprises obtaining one or more images corresponding to an X-ray, scanning electron microscope, or CT scan of an object, assigning numeric values to pixels of the images, comparing the numeric values to reference numeric values, and identifying an anomaly in the object based on the comparison. A non-destructive inspection system that comprises at least one processor, a memory in communication with the processor and storing instructions that causes the processor to obtain an image corresponding to an X-ray, scanning electron microscope, or CT scan of an object, assign numeric values to pixels of the image, compare the assigned numeric values to reference numeric values, and identify an anomaly in the object based on the comparison.

First claim

Opening claim text (preview).

What is claimed is: 1. A non-destructive inspection method that comprises: obtaining a first image of an object, wherein the first image comprises at least one of an X-ray, SEM, or CT scan of the object; determining numeric values for one or more pixels of the first image based, at least in part, on a color scale resolution for the first image; calibrating the numeric values based, at least in part, on an image of a reference object; comparing one or more of the calibrated numeric values to reference numeric values; and identifying an anomaly in the object based, at least in part, on the comparison. 2. The method of claim 1 , further comprising: obtaining a plurality of images of the object; determining numeric values for one or more pixels of each of the plurality of images based, at least in part, on a color scale resolution for the plurality of images; comparing one or more of the calibrated numeric values to reference numeric values; and identifying a three-dimensional anomaly in the object based on the comparison. 3. The method of claim 1 , wherein the anomaly corresponds to a density or porosity anomaly. 4. The method of claim 1 , wherein the anomaly corresponds to a shape anomaly. 5. The method of claim 1 , wherein the anomaly corresponds to a particle distribution anomaly. 6. The method of claim 1 , wherein the anomaly corresponds to a contaminant anomaly. 7. The method of claim 1 , further comprising displaying a message regarding the anomaly. 8. The method of claim 1 , further comprising displaying a representation of the anomaly. 9. The method of claim 1 , wherein the object is an explosive pellet for use in a downhole environment. 10. The method of claim 1 , wherein the object is a liner for use in a downhole environment. 11. The method of claim 1 , further comprising obtaining the reference numeric values from scanning a calibration disk. 12. A non-destructive inspection system that comprises: a processor; a memory in communication with the processor and storing instructions that, when executed, causes the processor to: obtain a first image of an object, wherein the first image comprises at least one of an X-ray, SEM, or CT scan of the object; determine numeric values for one or more pixels of the first image based, at least in part, on a color scale resolution for the first image; calibrate the numeric values based, at least in part, on an image of a reference object; and compare one or more of the calibrated numeric values to reference numeric values to enable identification of an anomaly in the object. 13. The system of claim 12 , wherein the instructions, when executed, cause the processor to: obtain a plurality of images of the object; determine numeric values for one or more pixels of each of the plurality of images based, at least in part, on a color scale resolution for the plurality of images; and compare display one or more of the calibrated numeric values to reference numeric values to enable identification of an anomaly in the object. 14. The system of claim 12 , wherein the anomaly corresponds to a density or porosity anomaly. 15. The system of claim 12 , wherein the anomaly corresponds to a shape anomaly. 16. The system of claim 12 , wherein the anomaly corresponds to a particle distribution anomaly. 17. The system of claim 12 , wherein the anomaly corresponds to a contaminant anomaly. 18. The system of claim 12 , further comprising a monitor in communication with the processor, wherein the processor causes a message regarding the anomaly to be displayed via the monitor. 19. The system of claim 12 , further comprising a monitor in communication with the processor, wherein the processor causes a representation of the anomaly to be displayed via the monitor. 20. The system of claim 12 , wherein the object is an explosive pellet or liner for use in a downhole environment. 21. The system of claim 12 , wherein the reference numeric values are associated with a scanned calibration disk.

Assignees

Inventors

Classifications

  • X-ray image · CPC title

  • Fixed Constructions · mapped topic

  • Determination of colour characteristics · CPC title

  • from scanning electron microscope · CPC title

  • Testing or checking of ammunition {(apparatus for measuring the energy of projectiles G01L5/14)} · CPC title

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What does patent US10346966B2 cover?
A non-destructive inspection method that comprises obtaining one or more images corresponding to an X-ray, scanning electron microscope, or CT scan of an object, assigning numeric values to pixels of the images, comparing the numeric values to reference numeric values, and identifying an anomaly in the object based on the comparison. A non-destructive inspection system that comprises at least o…
Who is the assignee on this patent?
Halliburton Energy Services Inc
What technology area does this patent fall under?
Primary CPC classification G01N23/04. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 09 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).