Group delay based averaging

Patent metadata

Field	Value
Publication number	US-10345339-B2
Application number	US-201615143429-A
Country	US
Kind code	B2
Filing date	Apr 29, 2016
Priority date	Dec 9, 2015
Publication date	Jul 9, 2019
Grant date	Jul 9, 2019

Abstract

Embodiments of the present invention provide techniques and methods for improving signal-to-noise ratio (SNR) when averaging two or more data signals by finding a group delay between the signals and using it to calculate an averaged result. In one embodiment, a direct average of the signals is computed and phases are found for the direct average and each of the data signals. Phase differences are found between each signal and the direct average. The phase differences are then used to compensate the signals. Averaging the compensated signals provides a more accurate result than conventional averaging techniques. The disclosed techniques can be used for improving instrument accuracy while minimizing effects such as higher-frequency attenuation. For example, in one embodiment, the disclosed techniques may enable a real-time oscilloscope to take more accurate S parameter measurements.

First claim

What is claimed is:

1. A method for measuring an output from a device under test in a test and measurement instrument based on two or more signals under test from the device under test, comprising:
acquiring at an interface the two or more signals under test from the device under test;
determining an average signal based on the two or more signals under test;
determining an average group delay for the average signal;
determining individual group delays for each of the two or more signals under test;
determining a difference between the average group delay and the individual group delay for each of the two or more signals under test;
generating compensated signals by compensating each difference between the average group delay and the individual group delay for each of the two or more signals under test;
averaging the compensated signals to produce an averaged result; and
outputting the averaged result as the output from the device under test.

2. The method of claim 1 , wherein:
determining the average group delay comprises determining a phase for the average signal;
determining individual group delays for each of the two or more signals under test comprises determining individual phases for each of the two or more signals under test; and
determining the difference between the average group delay and each of the individual group delays comprises determining differences between the average signal phase and the individual phases.

3. The method of claim 2 , wherein determining the phase of the average signal comprises:
transforming the average signal from a time domain to a frequency domain by a fast Fourier transform; and
obtaining a phase from the transformation; and
wherein determining the phases of the two or more signals under test comprises transforming the two or more signals under test from a time domain to a frequency domain by a fast Fourier transform, and obtaining phases from the results of the transformation.

4. The method of claim 2 , wherein determining the phase for the average signal comprises:
calculating a derivative of the average signal;
transforming the derivative of the average signal from a time domain to a frequency domain by a fast Fourier transform; and
obtaining a phase from the result of the transformation; and
wherein determining the phases of the two or more signals under test comprises:
calculating derivatives of the two or more data signals;
transforming the derivatives from a time domain to a frequency domain by a fast Fourier transform; and
obtaining phases from the results of the transformation.

5. The method of claim 2 , wherein determining the phase differences comprises:
unwrapping the phase of the average signal;
unwrapping the phases of the two or more signals under test; and
determining the phase differences by subtracting the unwrapped phase of the average signal from each of the unwrapped phases of the two or more signals under test.

6. The method of claim 2 , wherein the differences comprise first differences and compensating the differences comprises:
performing a straight-line fit for each of the differences by using a least mean squared method;
obtaining second differences based at least in part on the slopes of the straight-line fit; and
compensating the second differences.

7. The method of claim 6 , wherein compensating the differences further comprises:
determining time shifts for the two or more signals under test based on the second differences; and
multiplying the results of the transformations to the frequency domain of the two or more signals under test by exp(j*2π*f*Δt i ), where j represents the square root of negative 1, f represents frequency, and Δt i represents the time shifts.

8. The method of claim 3 , wherein transforming the average signal from the time domain to the frequency domain by the fast Fourier transform comprises determining a derivative of the average signal and transforming the derivative of the average signal from a time domain to a frequency domain by a fast Fourier transform; and
wherein transforming the two or more signals under test to the frequency domain comprises determining derivatives of each of the two or more signals under test and transforming the derivatives from a time domain to a frequency domain by a fast Fourier transform.

9. The method of claim 4 , wherein outputting the averaged result further comprises integrating the averaged result.

10. The method of claim 2 , wherein averaging the compensated signals to produce the averaged result comprises;
averaging the compensated signals in the frequency domain to produce an averaged frequency-domain result; and
producing an averaged result by the averaged frequency-domain result to a time domain by an inverse fast Fourier transform.

11. The method of claim 2 , wherein averaging the compensated signals to produce an averaged result comprises;
generating time-domain compensated signals by transforming each compensated signal to a time domain by an inverse fast Fourier transform; and
averaging the time-domain compensated signals to produce an averaged result.

12. A test and measurement instrument configured to compute a group-delay based averaged result of two or more signals under test, comprising:
a physical interface configured to obtain the two or more signals under test;
memory configured to store digital representations of the two or more signals under test, and the averaged result;
a processor, configured to:
determine an average signal based on the two or more signals under test;
determine an average group delay for the average signal;
determine individual group delays for each of the two or more signals under test;
determine a difference between the average group delay and the individual group delay for each of the two or more signals under test;
generate compensated signals by compensating each difference between the average group delay and the individual group delay for each of the two or more signals under test; and
average the compensated signals to produce an averaged result.

13. The test and measurement instrument of claim 12 , further comprising an analog-to-digital converter configured to convert the two or more signals under test to two or more digital signals under test.

14. The test and measurement instrument of claim 12 , wherein the process is further configured to:
determine the average group delay by determining a phase for the average signal;
determine individual group delays for each of the two or more signals under test by
determining individual phases for each of the two or more signals under test; and
determining the difference between the average group delay and each of the individual group delays comprises determining differences between the average signal phase and the individual phases.

15. The test and measurement instrument of claim 14 , wherein the processor is further configured to determine the phase of the average signal by:
transforming the average signal from a time domain to a frequency domain by a fast Fourier transform; and
obtaining a phase from the transformation; and
wherein determining the phases of the two or more signals under test comprises transforming the two or more signals under test from a time domain to a frequency domain by a fast Fourier transform, and obtaining phases from the results of the transformation.

16. The test and measurement instrument of claim 14 , wherein the processor is configured to determine determining the phase for the average signal bu:
calculating a derivative of the average signal;
transforming the

Assignees

• Tektronix Inc

Inventors

• Tan Kan
• Pickerd John J

Classifications

• G01R19/2509 Primary

  Details concerning sampling, digitizing or waveform capturing · CPC title

• G01R13/029 Primary

  Software therefor · CPC title

• G01R13/0218

  Circuits therefor · CPC title

• G01R23/175

  by delay means, e.g. tapped delay lines · CPC title

• G01R31/31709

  Jitter measurements; Jitter generators (measuring jitter, noise figure or signal-to-noise ratio per se G01R29/26; analysis of tester signals G01R31/31901) · CPC title