System for detecting and real time processing x-ray pulses from microcalorimeter detectors

US10345249B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-10345249-B1
Application numberUS-201715843319-A
CountryUS
Kind codeB1
Filing dateDec 15, 2017
Priority dateDec 15, 2017
Publication dateJul 9, 2019
Grant dateJul 9, 2019

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Abstract

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An x-ray spectrometer system includes: an excitation source that produces excitation particles and irradiates a sample with the excitation particles such that the sample produces x-rays; thermal detectors that: detect the x-rays from the sample; and produce digital x-ray data in response to detecting the x-rays from the sample, the x-ray data including x-ray pulses; and an analyzer that includes a multichannel receiver that receives, in parallel, the digital x-ray data from the thermal detectors and that: rejects pulse pileup in the digital x-ray data and produces pass data from the digital x-ray data; subjects the pass data to an optimal filter to produce filter data; determines a pulse height of x-ray pulses in the filter data to produce pulse data; combines the pulse data to produce combined data; and calibrates the combined data to produce calibrated data.

First claim

Opening claim text (preview).

What is claimed is: 1. A process for performing real time analysis of x-ray pulses from a plurality of thermal detectors, the process comprising: introducing a sample to an x-ray spectrometer comprising the thermal detectors, the thermal detectors comprising a micro-calorimeter absorber and a transition edge sensor; irradiating the sample with excitation particles; producing x-rays by the sample in response to irradiation with the excitation particles; detecting the x-rays by the thermal detectors; producing digital x-ray data by the thermal detectors in response to detecting the x-rays from the sample; receiving, in parallel by a multichannel receiver, the digital x-ray data from the thermal detectors, the x-ray data comprising a plurality of x-ray pulses; rejecting pulse pileup in the digital x-ray data to produce pass data from the digital x-ray data; subjecting the pass data to a Wiener filter to produce filter data; determining a pulse height of x-ray pulses in the filter data to produce pulse data; combining the pulse data to produce combined data; and calibrating the combined data to produce calibrated data to perform analysis, in real time, of the x-ray pulses from the thermal detectors. 2. A process for performing real time analysis of x-ray pulses from a plurality of thermal detectors, the process comprising: receiving digital x-ray data from the thermal detectors comprising a micro-calorimeter absorber and a transition edge sensor, the x-ray data comprising a plurality of x-ray pulses; rejecting pulse pileup in the digital x-ray data to produce pass data from the digital x-ray data; subjecting the pass data to a Wiener filter to produce filter data; determining a pulse height of x-ray pulses in the filter data to produce pulse data; combining the pulse data to produce combined data; and calibrating the combined data to produce calibrated data to perform analysis, in real time, of the x-ray pulses from the thermal detectors. 3. An x-ray spectrometer system comprising: an excitation source that produces excitation particles and irradiates a sample with the excitation particles such that the sample produces x-rays in response to irradiation with the excitation particles; a plurality of thermal detectors, the thermal detectors comprising a micro-calorimeter absorber and a transition edge sensor, and that: detects the x-rays from the sample; and produces digital x-ray data in response to detecting the x-rays from the sample, the x-ray data comprising a plurality of x-ray pulses; and an analyzer that comprises a multichannel receiver that receives, in parallel, the digital x-ray data from the thermal detectors and that: rejects pulse pileup in the digital x-ray data and produces pass data from the digital x-ray data; subjects the pass data to a Wiener filter to produce filter data; determines a pulse height of x-ray pulses in the filter data to produce pulse data; combines the pulse data to produce combined data; and calibrates the combined data to produce calibrated data in which analysis is performed, in real time, on the x-ray pulses from the thermal detectors.

Assignees

Inventors

Classifications

  • Photon detectors for X-rays, light, e.g. photomultipliers · CPC title

  • Detectors; Associated components or circuits therefor · CPC title

  • provided with temperature control or heating means · CPC title

  • Signal processing, e.g. mixing of two or more signals · CPC title

  • the radiation being X-rays · CPC title

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What does patent US10345249B1 cover?
An x-ray spectrometer system includes: an excitation source that produces excitation particles and irradiates a sample with the excitation particles such that the sample produces x-rays; thermal detectors that: detect the x-rays from the sample; and produce digital x-ray data in response to detecting the x-rays from the sample, the x-ray data including x-ray pulses; and an analyzer that include…
Who is the assignee on this patent?
Us Commerce
What technology area does this patent fall under?
Primary CPC classification G01N23/20033. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 09 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).