Method for etching piezoelectric film and method for manufacturing piezoelectric element
US-2016027996-A1 · Jan 28, 2016 · US
US10340440B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10340440-B2 |
| Application number | US-201615086620-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 31, 2016 |
| Priority date | Apr 3, 2015 |
| Publication date | Jul 2, 2019 |
| Grant date | Jul 2, 2019 |
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An electronic device includes a base material, a first metal film disposed on the base material and containing nitrogen and chromium, and a second metal film disposed on the first metal film and containing gold. In the first metal film, the number of nitrogen atoms may be between 20% to 100% of the number of chromium atoms. Further, the distribution of nitrogen atoms in the first metal film is larger in a third region sandwiched between a first region on the base material side of the first metal film and a second region on the second metal film side than in the first region and in the second region.
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What is claimed is: 1. An electronic device, comprising: a base material having a first surface; a first metal film disposed on the first surface and containing nitrogen and chromium; and a second metal film disposed on a surface of the first metal film on the opposite side to the first surface and containing gold, wherein: the first metal film includes a region in which the number of nitrogen atoms in the first metal film is between 20% to 100% of the number of chromium atoms. 2. The electronic device according to claim 1 , wherein the first metal film includes a region in which the number of nitrogen atoms in the first metal film is between 20% to 50% of the number of chromium atoms. 3. The electronic device according to claim 1 , wherein the first metal film includes a region in which the number of nitrogen atoms in the first metal film is between 40% to 100% of the number of chromium atoms. 4. The electronic device according to claim 1 , wherein the first metal film includes a region in which the number of nitrogen atoms in the first metal film is between 40% to 50% of the number of chromium atoms. 5. The electronic device according to claim 1 , wherein the base material contains at least one of quartz crystal, glass, and silicon. 6. The electronic device according to claim 1 further comprising: a piezoelectric substrate; an excitation electrode disposed on the piezoelectric substrate; and a connection electrode disposed on the piezoelectric substrate and electrically connected to the excitation electrode, wherein the base material is the piezoelectric substrate, and at least one of the excitation electrode and the connection electrode includes the first metal film and the second metal film. 7. An electronic apparatus comprising the electronic device according to claim 1 . 8. A moving object comprising the electronic device according to claim 1 . 9. An electronic device, comprising: a base material having a first surface; a first metal film disposed on the first surface and containing nitrogen and chromium; and a second metal film disposed on a surface of the first metal film on the opposite side to the first surface and containing gold, wherein: the first metal film includes a first region located on the base material side, a second region located on the second metal film side, and a third region interposed between the first region and the second region, and the third region includes a region in which the distribution of nitrogen atoms is larger than in the first region and in the second region. 10. The electronic device according to claim 9 , wherein the first metal film includes a region in which the number of nitrogen atoms in the first metal film is between 20% to 100% of the number of chromium atoms. 11. The electronic device according to claim 9 , wherein the first metal film includes a region in which the number of nitrogen atoms in the first metal film is between 20% to 50% of the number of chromium atoms. 12. The electronic device according to claim 9 , wherein the first metal film includes a region in which the number of nitrogen atoms in the first metal film is between 40% to 100% of the number of chromium atoms. 13. The electronic device according to claim 9 , wherein the first metal film includes a region in which the number of nitrogen atoms in the first metal film is between 40% to 50% of the number of chromium atoms. 14. The electronic device according to claim 9 , wherein the base material contains at least one of quartz crystal, glass, and silicon. 15. The electronic device according to claim 9 further comprising: a piezoelectric substrate; an excitation electrode disposed on the piezoelectric substrate; and a connection electrode disposed on the piezoelectric substrate and electrically connected to the excitation electrode, wherein the base material is the piezoelectric substrate, and at least one of the excitation electrode and the connection electrode includes the first metal film and the second metal film. 16. An electronic apparatus comprising the electronic device according to claim 9 .
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