Method and device for setting a suitable evaluation parameter for a fluorescence microscope

US10338369B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10338369-B2
Application numberUS-201113577951-A
CountryUS
Kind codeB2
Filing dateJan 3, 2011
Priority dateFeb 12, 2010
Publication dateJul 2, 2019
Grant dateJul 2, 2019

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Abstract

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A method for setting an evaluation parameter for a fluorescence microscope includes exciting dye particles in a sample to fluoresce and detecting fluorescent light from the particles. A graphical representation of a distribution of the fluorescent light is determined and a signal is generated for use in displaying the graphical representation on a display unit. Each subregion of the graphical representation is associated with a comparison value that is representative of a light quantity in the subregion. A predefined threshold is used as an evaluation parameter and compared to the comparison values. The subregions having a comparison value that is greater than the threshold value are marked on the display unit with predefined markings. The threshold value is changed and the comparison values are compared to the changed threshold value. The marked regions are defined as events and a complete image of the sample is obtained based on the events.

First claim

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What is claimed is: 1. A method for setting and using a suitable evaluation parameter for stochastic localization microscopy imaging with a fluorescence microscope, the evaluation parameter being useable to prepare for generation of a complete localization microscopy image, the method comprising: prior to generating a complete localization microscopy image: exciting fluorescent dye particles in a sample to fluoresce; detecting fluorescent light originating from the fluorescent dye particles; determining, for a first one of a plurality of partial images taken during the detecting of the fluorescent light, a graphical representation of a distribution of the fluorescent light that is representative of a distribution of a light quantity on a detector of the fluorescence microscope; generating a signal representative of the graphical representation of the light distribution; displaying the graphical representation of the light distribution on a display unit based on the generated signal; associating each of a plurality of subregions of the graphical representation of the light distribution with a respective comparison value that is representative of a light quantity in the respective subregion; using a predefined threshold value as an evaluation parameter during taking of the partial images which are later used to form the complete localization microscopy image; comparing the comparison values to the threshold value; marking subregions having a comparison value that is greater than the threshold value on the display unit with predefined markings; changing the threshold value in accordance with a user input while the partial images continue to be taken, the threshold value being changed prior to defining an event and prior to determining a point representative of the event; comparing the comparison values to the changed threshold value after the user input; defining subregions having a comparison value that is greater than the changed threshold value as events and excluding from evaluation subregions having a comparison value that is lower than the changed threshold value; determining, for each of the defined events, a point representative of a position of the respective fluorescent dye particle that caused the event; and then generating the complete localization microscopy image of the sample using the partial images based on the points of the defined events. 2. The method as recited in claim 1 , wherein prior to defining the events, the subregions whose comparison value is greater than the changed threshold value are marked on the display unit with predefined markings. 3. The method as recited in claim 1 , wherein the displaying of the graphical representation of the light distribution, the marking of the subregions and the changing of the threshold value take place during the detecting the fluorescent light. 4. The method as recited in claim 1 , wherein the displaying the graphical representation of the light distribution and the marking of the subregions take place after the detecting the fluorescent light. 5. The method as recited in claim 1 , wherein a subset of all fluorescent dye particles of the sample is transferred from an inactive state to an active state, and the dye particles in the active state are excited to fluoresce, a number of the dye particles contained in the subset being such that an average distance between the dye particles in the subset is greater than a diffraction resolution limit of the fluorescence microscope. 6. The method as recited in claim 1 , wherein a subset of all fluorescent dye particles of the sample is transferred from an active state to an inactive state, and the remaining subset of dye particles in the active state is excited to fluoresce, a number of the dye particles contained in the subset being such that an average distance between the dye particles in the subset is greater than a diffraction resolution limit of the fluorescence microscope. 7. The method as recited in claim 6 , wherein the subset of all fluorescent dye particles of the sample is transferred from the active state to the inactive state by subjecting the sample to a bleaching process. 8. The method as recited in claim 1 , wherein fluorescent dye particles that automatically change from an inactive state to an active state with a defined probability are included in the sample, and all fluorescent dye particles of the sample are transferred to the inactive state, wherein after a defined period of time selected according to the defined probability, the dye particles in the active state are excited to fluoresce. 9. The method as recited in claim 1 , wherein the comparison value is an entire light quantity, light energy, luminous energy, luminance or light intensity within the subregion of the graphical representation of the light distribution with which the comparison value is associated. 10. The method as recited in claim 1 , wherein the threshold value is changed during an illumination of the sample over an extended period of time during which the partial images for generating the complete localization microscopy image are taken. 11. The method as recited in claim 10 , wherein the threshold value is changed a plurality of times during the illumination of the sample. 12. A device for setting and using a suitable evaluation parameter for stochastic localization microscopy with a fluorescence microscope, the evaluation parameter being useable to prepare for generation of a complete localization microscopy image, the device comprising: a light source configured to excite a fluorescent dye particles in a sample to fluoresce; a detector configured to detect fluorescent light originating from the fluorescent dye particles; a display unit; and an evaluation unit configured to: prior to generating a complete localization microscopy image: determine, for a first one of a plurality of partial images taken during the detecting of the fluorescent light, a graphical representation of a distribution of the fluorescent light that is representative of a distribution of a light quantity on the detector of the fluorescence microscope; generate a signal representative of the graphical representation of light distribution for use in displaying the graphical representation on the display unit; associate each of a plurality of subregions of the graphical representation of the light distribution with a respective comparison value that is representative of a light quantity in the respective subregion; use a predefined threshold value as an evaluation parameter during taking of the partial images which are later used to form the complete localization microscopy image; compare the comparison values to the threshold value; mark subregions having a comparison value that is greater than the threshold value on the display unit with predefined markings; change the threshold value after the subregions have been marked in accordance with a user input while the partial images continue to be taken, the threshold value being changed prior to defining an event and prior to determining a point representative of the event; compare the comparison values to the changed threshold value after the user input; define subregions having a comparison value that is greater than the changed threshold value as events and exclude from evaluation subregions having a comparison value that is lower than the changed threshold value; determine, for each of the defined events, a point representative of a position of the respective fluorescent dye particle that caused the event; and then generate the complete localization microscopy image of the sample using the partial images based on the points of the

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Classifications

  • providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison · CPC title

  • G02B21/16Primary

    adapted for ultraviolet illumination {; Fluorescence microscopes (G02B21/0076 takes precedence)} · CPC title

  • Optics for apodization or superresolution; Optical synthetic aperture systems · CPC title

  • Fluorescence microscopy (fluorescence microscopes per se G02B21/0076 and G02B21/16) · CPC title

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What does patent US10338369B2 cover?
A method for setting an evaluation parameter for a fluorescence microscope includes exciting dye particles in a sample to fluoresce and detecting fluorescent light from the particles. A graphical representation of a distribution of the fluorescent light is determined and a signal is generated for use in displaying the graphical representation on a display unit. Each subregion of the graphical r…
Who is the assignee on this patent?
Foelling Jonas, Leica Microsystems
What technology area does this patent fall under?
Primary CPC classification G02B21/16. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 02 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).