Handle Substrate, Composite Substrate for Semiconductor, and Semiconductor Circuit Board and Method for Manufacturing the Same
US-2016005643-A1 · Jan 7, 2016 · US
US10336625B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10336625-B2 |
| Application number | US-201715797127-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 30, 2017 |
| Priority date | May 13, 2015 |
| Publication date | Jul 2, 2019 |
| Grant date | Jul 2, 2019 |
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An alumina sintered body according to the present invention includes a surface having a degree of c-plane orientation of 5% or more, the degree of c-plane orientation being determined by a Lotgering method using an X-ray diffraction profile obtained through X-ray irradiation at 2θ=20° to 70°. The alumina sintered body contains Mg and F, a Mg/F mass ratio is 0.05 to 3500, and a Mg content is 30 to 3500 ppm by mass. The alumina sintered body has a crystal grain size of 15 to 200 μm. When a field of view of 370.0 μm long×372.0 μm wide is photographed with a 1000-fold magnification and the photograph is visually observed, a number of pores having a diameter of 0.2 to 0.6 μm is 250 or less.
Opening claim text (preview).
What is claimed is: 1. An alumina sintered body comprising: a surface having a degree of c-plane orientation of 5% or more, the degree of c-plane orientation being determined by a Lotgering method using an X-ray diffraction profile obtained through X-ray irradiation at 2θ=20° to 70°, wherein the alumina sintered body contains Mg and F, a Mg/F mass ratio is 0.05 to 3500, and a Mg content is 30 to 3500 ppm by mass, the alumina sintered body has a crystal grain size of 15 to 200 μm, when a field of view of 370.0 μm long×372.0 μm wide is photographed with a 1000-fold magnification and the photograph is visually observed, a number of pores having a diameter of 0.2 to 0.6 μm is 250 or less, and a volume fraction of the pores having a diameter of 0.2 to 0.6 μm in the alumina sintered body is 130 ppm by volume or less. 2. The alumina sintered body according to claim 1 , wherein when a field of view of 370.0 μm long×372.0 μm wide is photographed using a scanning electron microscope with a 1000-fold magnification and the photograph is visually observed, a number of foreign substances having a diameter of 0.2 to 0.6 μm is 50 or less. 3. The alumina sintered body according to claim 1 , wherein when a field of view of 1340.4 μm long×1607.0 μm wide is photographed with a 500-fold magnification and the photograph is visually observed, a number of pores having a diameter of 1 μm or more is 50 or less. 4. The alumina sintered body according to claim 1 , wherein the alumina sintered body has, at a thickness of 0.5 mm, an in-line transmittance at 450 to 1000 nm of 60% or more. 5. The alumina sintered body according to claim 4 , wherein the in-line transmittance is 80% or more. 6. The alumina sintered body according to claim 1 , wherein a F content is 200 ppm or less. 7. The alumina sintered body according to claim 1 , wherein contents of impurity elements other than Mg, C, and F are 50 ppm or less. 8. The alumina sintered body according to claim 1 , wherein the Mg/F mass ratio is 0.2 to 3.5 and the Mg content is 100 to 1500 ppm by mass. 9. The alumina sintered body according to claim 1 , wherein the crystal grain size is 20 to 100 μm. 10. The alumina sintered body according to claim 1 , wherein an XRC full width at half maximum in rocking curve measurement is 15° or less. 11. A base substrate for an optical device, comprising the alumina sintered body according to claim 1 .
Compositional purity · CPC title
Aspect ratio of the grains · CPC title
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Pressing at temperatures other than sintering temperatures · CPC title
Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions · CPC title
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