Mass spectrometer with ion frequency selection

US10332736B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10332736-B2
Application numberUS-201414773902-A
CountryUS
Kind codeB2
Filing dateJan 24, 2014
Priority dateMar 11, 2013
Publication dateJun 25, 2019
Grant dateJun 25, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An object of the invention is to provide a mass spectrometer system capable of obtaining a mass spectrum with high resolution as the mass number of an ion becomes higher. In the mass spectrometer system of the invention, a control unit 8 controls a mass spectrometry unit 4 so that a direct current voltage U, an amplitude V of a radio-frequency voltage, and a frequency F of the radio-frequency voltage, which are applied to a quadrupole electrode 13 , are increased as a mass-to-charge ratio m/z of an ion of a target for mass spectrometry becomes larger. By controlling in this manner, the ion frequency when the ion passes through the inside of the mass spectrometry unit 4 is increased as the mass number of an ion becomes higher, and therefore, it is possible to obtain the mass spectrum with higher resolution.

First claim

Opening claim text (preview).

The invention claimed is: 1. A mass spectrometer system, comprising: a mass spectrometry unit that performs mass selection and separation of an ion species by applying a direct current voltage U and a radio-frequency voltage (V cos Ωt) to a multipole electrode to generate a multipole electric field, injecting an ionized sample thereinto, and adjusting and controlling the direct current voltage and the radio-frequency voltage applied to the multipole electrode so that the ion species having a specific mass-to-charge ratio m/z is allowed to pass through the multipole electrode; an ion detecting unit that detects the ion species; a data processing unit that processes an output of the ion detecting unit; and a control unit that controls the mass spectrometry unit, wherein V is an amplitude V of the radio-frequency voltage, Ω is an angular frequency of the radio-frequency voltage, and t is time; wherein based on a value of the mass-to-charge ratio m/z of the ion species that is allowed to pass through the multipole electrode, the control unit controls the direct current voltage and the radio-frequency voltage applied by the mass spectrometry unit to the multipole electrode so as to set an ion frequency of the ion species in proportion to the value of the mass-to-charge ratio m/z of the ion species allowed to pass through the multipole electrode; wherein the ion frequency is a number of oscillations when the ion species passes through the multipole electrode; and wherein the control unit controls values of the direct current voltage U, the amplitude V of the radio-frequency voltage, and the angular frequency Ω of the radio-frequency voltage, which are applied to the multipole electrode, to be increased at the same time, when the value of the mass-to-charge ratio m/z of a mass selection-separation target ion to be scanned is increased and to be decreased at the same time, when the value of the mass-to-charge ratio m/z of a mass selection-separation target ion to be scanned is decreased. 2. The mass spectrometer system according to claim 1 , wherein the control unit controls the values of the direct current voltage U and the amplitude V of the radio-frequency voltage, which are applied to the multipole electrode, to be proportional to the mass-to-charge ratio (m/z) raised to the power of x (x>1) in order to scan the value of the mass-to-charge ratio m/z of the mass selection-separation target ion. 3. The mass spectrometer system according to claim 1 , wherein the control unit controls the value of the angular frequency Ω of the radio-frequency voltage, which is applied to the multipole electrode, to be proportional to the mass-to-charge ratio (m/z) raised to the power of x (x≥½) in order to scan the value of the mass-to-charge ratio m/z of the mass selection-separation target ion. 4. The mass spectrometer system according to claim 1 , wherein the control unit controls, in order to scan the value of the mass-to-charge ratio m/z of a mass selection-separation target ion, injection energy E when the ionized sample is injected into the multipole electrode so that the injection energy E is decreased as the value of the mass-to-charge ratio m/z of the mass selection-separation target ion becomes larger, and the injection energy E is increased as the value of the mass-to-charge ratio m/z of the mass selection-separation target ion becomes smaller. 5. The mass spectrometer system according to claim 4 , wherein the control unit controls, in order to scan the value of the mass-to-charge ratio m/z of the mass selection-separation target ion, the injection energy E when the ionized sample is injected into the multipole electrode to be inversely proportional to the value of the mass-to-charge ratio m/z. 6. The mass spectrometer system according to claim 1 , further comprising: ion reflecting units that are provided at end portions of the mass spectrometry unit, wherein the control unit controls, in order to scan the value of the mass-to-charge ratio m/z of a mass selection-separation target ion, an ion having a high m/z value that is equal to or greater than a specific mass-to-charge ratio so that a voltage for reflecting the ion species is applied to the ion reflecting unit, which is provided at the end portion opposite to the end portion where the ion species is injected into the multipole electrode of the mass spectrometry unit, and the ion species is reflected without being emitted from the multipole electrode to pass through the multipole electrode again. 7. The mass spectrometer system according to claim 6 , wherein the control unit performs control so that the voltage for reflecting the ion species again to the ion reflecting unit provided at the end portion where the ion species is injected into the multipole electrode of the mass spectrometry unit is applied, and the ion species is emitted to the ion detecting unit after the ion species passes through the multipole electrode by 3n/2 reciprocation (integer of n≥1). 8. The mass spectrometer system according to claim 1 , wherein the control unit controls the value of the mass-to-charge ratio m/z of a mass selection-separation target ion to be scanned. 9. The mass spectrometer system according to claim 1 , wherein the mass spectrometry unit is configured of a tandem mass spectrometry unit in which a plurality of the multipole electrodes are arranged in a longitudinal direction, and wherein the control unit performs control so that at least one of the plurality of multipole electrodes scans the value of the mass-to-charge ratio m/z of a mass selection-separation target ion. 10. A mass spectrometry method using a mass spectrometry unit, the method comprising: controlling the mass spectrometry unit so that mass selection and separation of an ion species is performed by applying a direct current voltage and a radiofrequency voltage to a multipole electrode of the mass spectrometry unit to generate a multipole electric field, injecting an ionized sample thereinto, and adjusting and controlling the direct current voltage and the radio-frequency voltage applied to the multipole electrode so that the ion species having a specific mass-to-charge ratio m/z is allowed to pass through the multipole electrode, and when the ion species is detected, based on a value of the mass-to-charge ratio m/z of the ion species that is allowed to pass through the multipole electrode, controlling the direct current voltage and the radio-frequency voltage applied to the multipole electrode so as to set an ion frequency of the ion species in proportion to the value of the mass-to-charge ratio m/z of the ion species allowed to pass through the multipole electrode; wherein the ion frequency is a number of oscillations when the ion species passes through the multipole electrode: and wherein values of the direct current voltage, an amplitude of the radio-frequency voltage, and an angular frequency of the radio-frequency voltage, which are applied to the multipole electrode, are controlled by the controller to be increased at the same time, when the value of the mass-to-charge ratio m/z of a mass selection-separation target ion to be scanned is increased and to be decreased at the same time, when the value of the mass-to-charge ratio m/z of a mass selection-separation target ion to be scanned is decreased. 11. The mass spectrometry method according to claim 10 , wherein, in order to scan the value of the mass-to-charge ratio m/z of the mass selection-separation target ion, the values of the direct current voltage and the amplitude of the radio-frequency voltage, which are applied to the multipole electrode, or the value of the angular frequency of the radio-frequency vo

Assignees

Inventors

Classifications

  • H01J49/429Primary

    Scanning an electric parameter, e.g. voltage amplitude or frequency · CPC title

  • Multipole linear ion traps, e.g. quadrupoles, hexapoles · CPC title

  • Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

  • Quadrupole mass filters (H01J49/4225 takes precedence) · CPC title

  • H01J49/426Primary

    Methods for controlling ions · CPC title

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What does patent US10332736B2 cover?
An object of the invention is to provide a mass spectrometer system capable of obtaining a mass spectrum with high resolution as the mass number of an ion becomes higher. In the mass spectrometer system of the invention, a control unit 8 controls a mass spectrometry unit 4 so that a direct current voltage U, an amplitude V of a radio-frequency voltage, and a frequency F of the radio-frequen…
Who is the assignee on this patent?
Hitachi High Tech Corp
What technology area does this patent fall under?
Primary CPC classification H01J49/429. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jun 25 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).