Sampling location displaying apparatus and sampling method

Patent metadata

Field	Value
Publication number	US-10330572-B2
Application number	US-201415119243-A
Country	US
Kind code	B2
Filing date	Jun 16, 2014
Priority date	Mar 31, 2014
Publication date	Jun 25, 2019
Grant date	Jun 25, 2019

Abstract

According to the sampling method of the aspect of the present invention, the coordinate (location information) of the sampling location on the sampling specimen is generated randomly by the controller, such as a personal computer, of the sampling location display. Based on the location information, the sampling location is displayed on the sampling specimen, which is a part of the recycled raw material, by laser light. Because of this, arbitrariness, in which the operator artificially selects the sampling location, during incremental sampling for setting the average quality of the sampling specimen, such as the average content of valuable metal, can be excluded reliably.

First claim

What is claimed is:

1. A sampling location displaying apparatus configured to display a sampling location on a sample comprising:
a laser irradiation part configured to send a laser light irradiation toward a sample spread on a sampling field and configured to display a sampling location mark in a predetermined shape on the sample; and
a controller configured to control the laser irradiation part, wherein
the sampling location mark is configured in such a way that each of a displayed shape, brightness, and color of the sampling location mark is modifiable arbitrarily;
the sampling location is enclosed by the sampling location mark having a color different from an overall color tone of the sample;
the controller is configured to generate random location information on the sample and configured to output the random location information to the laser irradiation part; and
the laser irradiation part is configured to display the sampling location mark on a random location on the sample based on the random location information.

2. A sampling method using the sampling location displaying apparatus according to claim 1 , the sampling method comprising the steps of:
raking a sample after spreading the sample in a sampling field;
sending the laser light irradiation toward the raked sample from the sampling location displaying apparatus; and
scooping up a part of the sample on a location where configured to display to enclose the sampling location with a color tone different from the overall color tone of the sample is displayed by using a sampling tool.

3. The sampling method according to claim 2 , wherein
the sampling location mark indicates the sampling location randomly selected on the sample.

4. The sampling method according to claim 2 , wherein the sample includes a recycled raw material having a longest side of 10 cm or more.

5. The sampling method according to claim 3 , wherein the sample includes a recycled raw material having a longest side of 10 cm or more.

6. A sampling location displaying apparatus configured to display a sampling location on a sample comprising:
a laser irradiation part configured to send a laser light irradiation toward a sample spread on a sampling field and configured to display a sampling location mark in a predetermined shape on the sample; and
a controller configured to control the laser irradiation part, wherein
the sampling location mark is configured in such a way that each of a displayed shape, brightness, and color of the sampling location mark is modifiable arbitrarily; and the sampling location is enclosed by the sampling location mark having a color different from an overall color tone of the sample,
the controller is configured to generate random location information on the sample and to output the random location information to the laser irradiation part,
the laser irradiation part is configured to display the sampling location mark on a random location on the sample based on the random location information, and
the sampling location mark indicates the sampling location randomly selected on the sample.

7. A sampling method using the sampling location displaying apparatus according to claim 6 , the sampling method comprising the steps of:
raking a sample after spreading the sample in a sampling field;
sending the laser light irradiation toward the raked sample from the sampling location displaying apparatus; and
scooping up a part of the sample on a location where configured to display to enclose the sampling location with a color tone different from the overall color tone of the sample is displayed by using a sampling tool.

8. The sampling method according to claim 7 , wherein the sample includes a recycled raw material having a longest side of 10 cm or more.

Assignees

• Mitsubishi Materials Corp

Inventors

• Nitta Akira
• ONISHI Michiaki
• Tomioka Kenichi
• Tsutsui Tomohiro
• Takagi Makoto

Classifications

• H04N9/3161

  using laser light sources (using laser beams scanning the display screen H04N9/3129) · CPC title

• G01N2001/282

  with mapping; Identification of areas; Spatial correlated pattern · CPC title

• G01N1/04 Primary

  in the solid state, e.g. by cutting · CPC title

• G06T1/0007

  Image acquisition · CPC title

• H04N7/183

  for receiving images from a single remote source · CPC title