Apparatuses, systems and methods for testing electrical functions

Patent metadata

Field	Value
Publication number	US-10324111-B2
Application number	US-201715648668-A
Country	US
Kind code	B2
Filing date	Jul 13, 2017
Priority date	Jul 22, 2016
Publication date	Jun 18, 2019
Grant date	Jun 18, 2019

Abstract

The embodiments of the present disclosure provide an apparatus, system and method for testing electrical functions. The apparatus for testing electrical functions comprises: at least one clamping tool configured to be capable of being clamped in the vicinity of at least one bonding area of an electronic device; at least one row of probes configured to be electrically connected to multiple pins in the at least one bonding area respectively when the at least one clamping tool is clamped; and at least one multiplex switch. Each multiplex switch has a first terminal comprising multiple ports, and a second terminal comprising at least one port and capable of being connected to a measurement instrument, and the at least one multiplex switch is configured to turn on or turn off an electrical connection between the multiple ports of the first terminal and at least one port of the second terminal.

First claim

We claim:

1. An apparatus for testing electrical functions, comprising:
at least one clamping tool configured to be capable of being clamped in the vicinity of at least one bonding area of an electronic device;
at least one row of probes configured to be electrically connected to multiple pins in the at least one bonding area respectively when the at least one clamping tool is clamped in the vicinity of the at least one bonding area of the electronic device; and
at least one multiplex switch, wherein each multiplex switch has a first terminal comprising multiple ports and connected to at least one group of probes in a row of probes via a group of wires respectively, and a second terminal comprising at least one port and capable of being connected to a measurement instrument via wires, and the at least one multiplex switch is configured to turn on or turn off an electrical connection between each of the multiple ports of the first terminal and at least one port of the second terminal, so that two ports of the measurement instrument are connected to two of the multiple pins respectively via the first terminal and the second terminal of the at least one multiplex switch to form a test loop.

2. The apparatus for testing electrical functions according to claim 1 , wherein the at least one clamping tool comprises a clamping tool, the at least one row of probes comprises a row of probes, the at least one multiplex switch comprises a first multiplex switch and a second multiplex switch, multiple ports of a first terminal of the first multiplex switch are connected to a first group of probes in the row of probes via a first group of wires respectively, and multiple ports of a first terminal of the second multiplex switch are connected to a second group of probes in the row of probes via a second group of wires respectively.

3. The apparatus for testing electrical functions according to claim 1 , wherein the at least one clamping tool comprises a first clamping tool and a second clamping tool, the at least one row of probes comprises a first row of probes and a second row of probes, and is configured to cause the first row of probes to be electrically connected to multiple pins in a first bonding area of the electronic device respectively when the first clamping tool is clamped in the vicinity of the first bonding area, and cause the second row of probes to be electrically connected to multiple pins in a second bonding area of the electronic device respectively when the second clamping tool is clamped in the vicinity of the second bonding area, the at least one multiplex switch comprises a first multiplex switch and a second multiplex switch, multiple ports of a first terminal of the first multiplex switch are connected to probes in the first row of probes via a first group of wires respectively, and multiple ports of a first terminal of the second multiplex switch are connected to probes in the second row of probes via a second group of wires respectively.

4. The apparatus for testing electrical functions according to claim 1 , wherein the at least one clamping tool comprises a clamping tool, the at least one row of probes comprises a row of probes, the at least one multiplex switch comprises a multiplex switch, multiple ports of a first terminal of the multiplex switch are connected to probes in the row of probes via a group of wires respectively, a second terminal of the multiplex switch comprises two ports capable of being connected to two ports of the measurement instrument via wires respectively, and the multiplex switch is configured to be capable of turning on or turning off an electrical connection between each of the multiple ports of the first terminal and one of the two ports of the second terminal.

5. The apparatus for testing electrical functions according to claim 1 , wherein each multiplex switch is configured to be capable of controlling turn-on time and/or an on-off order of an electrical connection between each of the multiple ports of the first terminal and at least one port of the second terminal.

6. The apparatus for testing electrical functions according to claim 1 , wherein probes in the at least one row of probes have an adjustable spacing.

7. A system for testing electrical functions, comprising:
the apparatus for testing electrical functions according to claim 1 , and
the measurement instrument,
wherein two ports of the second terminal of the at least one multiplex switch of the apparatus for testing electrical functions are connected to two ports of the measurement instrument via wires respectively to form the test loop.

8. A method for testing electrical functions by using the apparatus for testing electrical functions according to claim 1 , comprising:
clamping the apparatus in the vicinity of at least one bonding area of an electronic device to be tested through the at least one clamping tool, so that the at least one row of probes is electrically connected to multiple pins in the at least one bonding area respectively;
connecting two ports of the second terminal of the at least one multiplex switch to two ports of a measurement instrument via wires to form the test loop;
operating the at least one multiplex switch according to test requirements, so that specific two probes in the at least one row of probes which are connected to the multiple ports of the first terminal of the at least one multiplex switch are electrically connected to two ports of the second terminal of the at least one multiplex switch respectively; and
measuring electrical functions between two pins which are connected to the specific two probes respectively using the measurement instrument.

9. The method for testing electrical functions according to claim 8 , wherein the step of operating the at least one multiplex switch according to test requirements comprises:
operating the at least one multiplex switch, so that a first group of probes in the at least one row of probes which are connected to the multiple ports of the first terminal of the at least one multiplex switch sequentially turn on an electrical connection with one port of the second terminal of the at least one multiplex switch for a specified time.

10. The method for testing electrical functions according to claim 9 , wherein the step of operating the at least one multiplex switch according to test requirements further comprises:
in synchronous with the step of the first group of probes sequentially turning on the electrical connection, turning on, by a second group of probes in the at least one row of probes, an electrical connection with the other port of the second terminal of the at least one multiplex switch for a specified time, wherein the second group of probes are connected to the multiple ports of the first terminal of the at least one multiplex switch sequentially.

11. A system for testing electrical functions, comprising:
the apparatus for testing electrical functions according to claim 2 , and
the measurement instrument, wherein two ports of the second terminal of the at least one multiplex switch of the apparatus for testing electrical functions are connected to two ports of the measurement instrument via wires respectively to form the test loop.

12. A system for testing electrical functions, comprising:
the apparatus for testing electrical functions according to claim 3 , and
the measurement instrument, wherein two ports of the second terminal of the at least one multiplex switch of the apparatus for testing electrical functions are connected to two ports of the measurement instrument via wires respectively to form the test loop.

13. A system for testing electrical functions, compri

Assignees

• Boe Technology Group Co Ltd
• Hefei Xinsheng Optoelectronics Technology Co Ltd

Inventors

• Fan Wenjin
• Zhang Lei
• Guo Zongjie
• Wang Qingpu
• Zeng Qin

Classifications

• G01R31/2889

  Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence) · CPC title

• G01R1/0425

  Test clips, e.g. for IC's · CPC title

• G01R1/0416 Primary

  Connectors, terminals (G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364) · CPC title

• G01R1/07314 Primary

  the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support (on an elastic support, e.g. a film, G01R1/0735) · CPC title

• G01R1/07307 Primary

  with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card · CPC title