Pressure sensor and manufacturing method thereof

US10323996B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10323996-B2
Application numberUS-201715669972-A
CountryUS
Kind codeB2
Filing dateAug 7, 2017
Priority dateJan 23, 2017
Publication dateJun 18, 2019
Grant dateJun 18, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A pressure sensor and a manufacturing method thereof are provided. The pressure sensor includes a thin-film transistor (TFT) array and a pressure-sensitive layer covering the TFT array. The pressure-sensitive layer includes a plurality of insulating layers and one of one-directional materials arranged on the same plane and two-directional materials. The insulating layers and the one- or two-directional materials are alternately stacked so as to effectively enhance pressure resolution.

First claim

Opening claim text (preview).

What is claimed is: 1. A pressure sensor, comprising: a thin-film transistor array; and a pressure-sensitive layer covering the thin-film transistor array, wherein the pres sure-sensitive layer comprises a plurality of one-directional materials arranged on the same plane and a plurality of insulating layers, and wherein the one-directional materials and the insulating layers are alternately stacked. 2. The pressure sensor of claim 1 , wherein the pressure-sensitive layer is inductive resistive. 3. The pressure sensor of claim 1 , wherein a diameter of the one-directional material is 5 nm to 100 nm. 4. The pressure sensor of claim 1 , wherein an aspect ratio of the one-directional material is greater than 100. 5. The pressure sensor of claim 1 , wherein the one-directional material comprises a metal nanowire, a carbon nanotube, or a metal oxide semiconductor. 6. The pressure sensor of claim 5 , wherein a metal of the metal nanowire comprises gold, silver, or copper. 7. The pressure sensor of claim 5 , wherein a metal oxide of the metal oxide semiconductor comprises zinc oxide, titanium oxide, tungsten oxide, molybdenum oxide, vanadium oxide, copper oxide, nickel oxide, cobalt oxide, iron oxide, or tin oxide. 8. A pressure sensor, comprising: a thin-film transistor array; and a pressure-sensitive layer covering the thin-film transistor array, wherein the pressure-sensitive layer comprises a plurality of two-directional materials and a plurality of insulating layers, and wherein the two-directional materials and the insulating layers are alternately stacked. 9. The pressure sensor of claim 8 , wherein the two-directional material comprises graphene oxide or molybdenum disulfide. 10. The pressure sensor of claim 8 , wherein the pressure-sensitive layer is inductive resistive. 11. A manufacturing method of a pressure sensor, comprising: forming a thin-film transistor array; and forming a pressure-sensitive layer on the thin-film transistor array by 3D printing, wherein the pressure-sensitive layer comprises a plurality of insulating layers and a plurality of one-directional materials arranged on the same plane that are alternately stacked, or the pressure-sensitive layer comprises the plurality of insulating layers and a plurality of two-directional materials that are alternately stacked. 12. The manufacturing method of the pressure sensor of claim 11 , wherein a diameter of the one-directional material is 5 nm to 100 nm. 13. The manufacturing method of the pressure sensor of claim 11 , wherein an aspect ratio of the one-directional material is greater than 100. 14. The manufacturing method of the pressure sensor of claim 11 , wherein the one-directional material comprises a metal nanowire, a carbon nanotube, or a metal oxide semiconductor, and the two-directional material comprises graphene oxide or molybdenum disulfide. 15. The manufacturing method of the pressure sensor of claim 14 , wherein a metal of the metal nanowire comprises gold, silver, or copper, and a metal oxide of the metal oxide semiconductor comprises zinc oxide, titanium oxide, tungsten oxide, molybdenum oxide, vanadium oxide, copper oxide, nickel oxide, cobalt oxide, iron oxide, or tin oxide.

Assignees

Inventors

Classifications

  • Electricity · mapped topic

  • Electricity · mapped topic

  • G01L9/10Primary

    by making use of variations in inductance {, i.e. electric circuits therefor} · CPC title

  • Electricity · mapped topic

  • Oxygen; Ozone; Oxides or hydroxides in general · CPC title

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What does patent US10323996B2 cover?
A pressure sensor and a manufacturing method thereof are provided. The pressure sensor includes a thin-film transistor (TFT) array and a pressure-sensitive layer covering the TFT array. The pressure-sensitive layer includes a plurality of insulating layers and one of one-directional materials arranged on the same plane and two-directional materials. The insulating layers and the one- or two-dir…
Who is the assignee on this patent?
Winbond Electronics Corp
What technology area does this patent fall under?
Primary CPC classification G01L9/10. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 18 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).