Testing device, testing method, and program for power system protection control system

Patent metadata

Field	Value
Publication number	US-10317452-B2
Application number	US-201415307212-A
Country	US
Kind code	B2
Filing date	Jun 13, 2014
Priority date	Jun 13, 2014
Publication date	Jun 11, 2019
Grant date	Jun 11, 2019

Abstract

A testing device tests an intelligent electronic device of a power system. A PC generates failure data by performing: simulation calculation for a CT and a PT with respect to current waveform data of a current transformer and voltage waveform data of a potential transformer based on a characteristic of an instrument transformer; and simulation calculation for an MU with respect to the current waveform data of the current transformer and the voltage waveform data of the potential transformer based on a characteristic of the MU. The testing device acquires device information data indicating a circuit breaker of the power system, in synchronization with the failure data. The testing device transmits the failure data and the device information data to the intelligent electronic device via a process bus in accordance with a setting of outputting data to the process bus and a setting of sampling.

First claim

The invention claimed is:

1. A testing device for testing an intelligent electronic device of a power system, the testing device comprising:
a first acquisition unit configured to acquire failure data resulting from simulation calculation for a CT (Current Transformer) and a PT (Potential Transformer) and simulation calculation for an MU (Merging Unit), the simulation calculation for the CT and the PT being performed with respect to current waveform data and voltage waveform data in the power system based on first characteristic information indicating a characteristic of an instrument transformer, the simulation calculation for the MU being performed with respect to the current waveform data and voltage waveform data in the power system based on second characteristic information indicating a characteristic of the MU;
a second acquisition unit configured to acquire device information data in synchronization with the failure data, the device information data indicating a circuit breaker of the power system;
a storage unit configured to store first setting information and second setting information, the first setting information indicating a setting about current and voltage for outputting data to a process bus, the second setting information indicating a setting of sampling; and
an output unit configured to transmit the acquired failure data and device information data to the intelligent electronic device via the process bus in accordance with the first setting information and the second setting information for operation of the circuit breaker of the power system.

2. The testing device according to claim 1 , wherein
the testing device is connected to an information processing device, and
the acquisition of the failure data by the first acquisition unit includes acquiring the failure data resulting from the simulation calculations by the testing device by (i) performing the simulation calculation for the CT and the PT and the simulation calculation for the MU by the information processing device and (ii) transmitting the failure data to the testing device by the information processing device.

3. The testing device according to claim 1 , wherein
the testing device is connected to an information processing device,
the storage unit is configured to store the second characteristic information indicating the characteristic of the MU, and
the acquisition of the failure data by the first acquisition unit includes acquiring the failure data by (i) performing the simulation calculation for the CT and the PT by the information processing device, (ii) acquiring, from the information processing device by the testing device, data resulting from the simulation calculation for the CT and the PT, and (iii) performing the simulation calculation for the MU with respect to the acquired data based on the second characteristic information.

4. The testing device according to claim 3 , wherein
the testing device is configured to receive the second characteristic information from the information processing device, and store the received second characteristic information into the storage unit.

5. The testing device according to claim 1 , wherein
the testing device is connected to an information processing device,
the testing device is configured to receive the second setting information from the information processing device, and store the received second setting information into the storage unit,
the testing device is configured to receive a synchronization signal from outside, and
the output unit is configured to transmit the failure data and the device information data to the intelligent electronic device in accordance with the second setting information and a timing that is based on the synchronization signal.

6. The testing device according to claim 1 , wherein
the testing device is connected to an information processing device,
the testing device is configured to receive the first setting information from the information processing device, and store the received first setting information into the storage unit, and
the output unit is configured to transmit the failure data and the device information data to the intelligent electronic device in accordance with the first setting information.

7. The testing device according to claim 1 , comprising:
a third acquisition unit configured to acquire a determination value for determining whether or not protection calculation of the intelligent electronic device is normal;
a reception unit configured to receive, from the intelligent electronic device, a result of the protection calculation for the failure data; and
a determination unit configured to determine whether or not the intelligent electronic device is normal, by comparing (i) the received result of the protection calculation for the failure data with (ii) the acquired determination value.

8. The testing device according to claim 7 , wherein
the testing device is connected to a station bus, and
the reception unit is configured to receive the result of the protection calculation for the failure data from the intelligent electronic device via the station bus.

9. The testing device according to claim 7 , wherein
the testing device is connected to the intelligent electronic device via a wire, and
the reception unit includes an isolation circuit, and is configured to acquire the determination value from the intelligent electronic device via the isolation circuit.

10. The testing device according to claim 2 , comprising:
a third acquisition unit configured to acquire a determination value for determining whether or not protection calculation of the intelligent electronic device is normal;
a reception unit configured to receive, from the intelligent electronic device, a result of the protection calculation for the failure data;
a determination unit configured to determine whether or not the intelligent electronic device is normal, by comparing (i) the received result of the protection calculation for the failure data with (ii) the acquired determination value; and
a determination result output unit configured to output a result of the determination made by the determination unit to the information processing device.

11. A testing method for a testing device to test an intelligent electronic device of a power system, the testing device including a storage unit configured to store first setting information and second setting information, the first setting information indicating a setting about current and voltage for outputting data to a process bus, the second setting information indicating a setting of sampling,
the testing method comprising the steps of:
acquiring, by the testing device, failure data resulting from simulation calculation for a CT (Current Transformer) and a PT (Potential Transformer) and simulation calculation for an MU (Merging Unit), the simulation calculation for the CT and the PT being performed with respect to current waveform data and voltage waveform data in the power system based on first characteristic information indicating a characteristic of an instrument transformer, the simulation calculation for the MU being performed with respect to the current waveform data and voltage waveform data in the power system based on second characteristic information indicating a characteristic of the MU;
acquiring, by the testing device, device information data in synchronization with the failure data, the device information data indicating a circuit breaker of the power system; and
transmitting, by the testing device, the acquired failure data and device information data to the intelligent electronic device via the process bus in accordance with the first setting information

Assignees

• Mitsubishi Electric Corp

Inventors

• Oda Shigetoo

Classifications

• G01R35/00 Primary

  Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title

• G01R19/2513

  Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging · CPC title

• H02H7/04

  for transformers · CPC title

• H02H3/05

  with means for increasing reliability, e.g. redundancy arrangements {(for logic circuits H03K19/003)} · CPC title

• G01R31/62 Primary

  Testing of transformers · CPC title