Slickline deployed casing inspection tools
US-2017114628-A1 · Apr 27, 2017 · US
US10317331B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10317331-B2 |
| Application number | US-201615567815-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 6, 2016 |
| Priority date | Nov 6, 2016 |
| Publication date | Jun 11, 2019 |
| Grant date | Jun 11, 2019 |
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Systems and methods for detection of pipe characteristics, such as defect detection of downhole tubulars and overall thickness estimation of downhole tubulars (e.g., pipes such as casing and/or production tubing). A defect detection method may comprise disposing a defect detection tool in a wellbore, wherein the defect detection tool comprises at least one transmitter and at least one receiver; obtaining nominal parameters of pipe properties; determining nominal responses corresponding to the nominal parameters; determining a defect profile for a plurality of pipes disposed in a wellbore; determining defected responses for the defection detection tool from at least the nominal parameters and the defect profile; calculating a gradient from at least the defected responses, the nominal responses, the nominal parameters and the defect profile; making downhole measurements of the plurality of pipes using the defect detection tool; and calculating final solution parameters of the plurality of pipes using at least the downhole measurements, the nominal responses, the gradient and the nominal parameters.
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What is claimed is: 1. A defect detection method comprising: disposing a defect detection tool in a wellbore, wherein the defect detection tool comprises at least one transmitter and at least one receiver; obtaining nominal parameters of pipe properties; determining nominal responses corresponding to the nominal parameters; determining a defect profile for a plurality of pipes disposed in a wellbore; determining defected responses for the defection detection tool from at least the nominal parameters and the defect profile; calculating a gradient from at least the defected responses, the nominal responses, the nominal parameters and the defect profile; making downhole measurements of the plurality of pipes using the defect detection tool; and calculating final solution parameters of the plurality of pipes using at least the downhole measurements, the nominal responses, the gradient and the nominal parameters. 2. The method of claim 1 , further comprising using the final solution parameters to make an operational decision on drilling, logging, production or completion. 3. The defect detection method of claim 1 , wherein the determining nominal responses corresponding to the nominal parameters comprises use of a well plan. 4. The defect detection method of claim 1 , wherein the determining a defect profile comprises determining a defect, wherein the defect is 1 times a skin depth. 5. The defect detection method of claim 1 , wherein the determining a defect profile comprises determining a defect, wherein the defect is 1/1000 times a skin depth. 6. The defect detection method of claim 1 , wherein the determining defected responses from at least the nominal parameters and the defect profile comprises calculating defected parameters by adding the defect profile to the nominal parameters and using forward modeling on the defected parameters to calculate the defected responses. 7. The defect detection method of claim 1 , wherein the calculating a gradient from at least the defected responses, the nominal responses, the nominal parameters and the defect profile comprises using P i D (j)= P N (j) if j≠i P i D (j)= P N (j)+Δ i if j=i and L _ i = M _ i D - M _ N Δ i ; where P N is the vector of nominal parameters, P i D is the vector of defected parameters where i th element is defected, Δ i is the perturbation amount on the ith parameter, M i D is the simulated response of the tool corresponding to P i D (defected response), M P M is the nomianl response, and i,j=1, . . . , Lp where Lp is the number of parameters (i. e length of P N ). 8. The defect detection method of claim 1 , wherein the making downhole measurements comprises at least two spacings between at least one transmitter and at least one receiver, wherein the spacings are between about 0.5 feet and about 10 feet. 9. The defect detection method of claim 1 , wherein the calculating final solution parameters using at least the downhole measurements, the nominal responses, the gradient and the nominal parameters comprises determining an initial solution parameters and solution responses from at least nominal measurements, solution parameters, nominal parameters and the gradient, and calculating final solution parameters using the downhole measurements and the solution responses. 10. The defect detection method of claim 8 , wherein the calculating final solution parameters using the downhole measurements and the responses comprises using P _ up ( i ) = P _ ( i ) + d _ ( i ) × ( I _ - M _ ) L _ i ; i=1, . . . , L p , where P is the solution parameter vector at an intermediate step during inversion, P up is the updated solution parameter vector, Lp is the number of variables, Ī is the measurement vector, M is the response vector corresponding to P , L i is the gradient vector for the i th parameter, d is the increment vector. 11. The defect detection method of claim 1 , wherein the calculating final solution parameters using at least the downhole measurements, nominal responses, gradient and nominal parameters comprises forming a matrix equation where matrix elements comprise the nominal responses, the gradient and the nominal parameters, and calculating final solution parameters by solving the matrix equation. 12. The defect detection method of claim 1 , wherein the calculating final solution parameters by solving the matrix equation comprises [ L 1 . . . L Lp ]×( P F − P N )= Ī− M N ⇒ P F =(([ L 1 . . . L Lp ] T ×[ L 1 . . . L Lp ]) −1 ×[ L 1 . . . L Lp ] T )×( Ī− M N )+ P N where P N is the vector of nominal parameters, P F is the final solution parameter vector, L i , is the gradient vector assuming a defect in parameter I where i=1, . . . , Lp, Lp is the number of parameters, Ī is the measurement vector, M N is the response vector corresponding to P N . 13. The defect detection method of claim 12 , wherein the nominal parameters are upd
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