Depth measurement using a phase grating

US10317205B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10317205-B2
Application numberUS-201615548745-A
CountryUS
Kind codeB2
Filing dateJan 25, 2016
Priority dateFeb 24, 2015
Publication dateJun 11, 2019
Grant dateJun 11, 2019

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  1. Title

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  2. Abstract

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Abstract

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Binocular depth-perception systems use binary, phase-antisymmetric gratings to cast point-source responses onto an array of photosensitive pixels. The gratings and arrays can be manufactured to tight tolerances using well characterized and readily available integrated-circuit fabrication techniques, and can thus be made small, cost-effective, and efficient. The gratings produce point-source responses that are large relative to the pitch of the pixels, and that exhibit wide ranges of spatial frequencies and orientations. Such point-source responses make it easy to distinguish the point-source responses from fixed-pattern noise the results from spatial frequencies of structures that form the array.

First claim

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What is claimed is: 1. A method of measuring a depth to an object in a scene, the method comprising: receiving light in a wavelength band of interest from the scene at a phase grating, the phase grating inducing near-field spatial modulations producing a diffraction pattern; capturing an image of the diffraction pattern induced by the phase grating; computing a disparity between the image of the diffraction pattern induced by the near-field spatial modulations and a reference; and estimating the depth to the object based on the disparity between the image of the diffraction pattern induced by the near-field spatial modulations and the reference. 2. The method of claim 1 , wherein the phase grating is a first phase grating, the method further comprising: receiving the light from the scene at a second phase grating, the second phase grating inducing second near-field spatial modulations producing a second diffraction pattern; capturing a second image of the second diffraction pattern; and using the second image as the reference. 3. The method of claim 2 , wherein estimating the depth comprises computing a distance between the image and the second image. 4. The method of claim 1 , further comprising shining a laser source of the light on the object. 5. The method of claim 4 , further comprising filtering out second light outside the wavelength band of interest. 6. The method of claim 5 , wherein the filtering uses at least one of a color filter and a cross-polarized filter. 7. The method of claim 1 , wherein capturing the image comprises sampling the diffraction pattern with an array of pixels of a pixel pitch. 8. The method of claim 7 , wherein computing the disparity comprises measuring a lateral shift of the diffraction pattern on the pixels. 9. A method of measuring a depth to an object in a scene, the method comprising: receiving light in a wavelength band of interest from the scene at a phase grating, the phase grating inducing near-field spatial modulations producing a diffraction pattern; capturing an image of the diffraction pattern; computing a disparity between the image and a reference; and estimating the depth to the object based on the disparity; wherein capturing the image comprises sampling the diffraction pattern with an array of pixels of a pixel pitch; and wherein the diffraction pattern produces a point-source response with a maximum dimension of at least six times the pixel pitch on the array of pixels and features with smaller dimensions less than a third the maximum dimension. 10. The method of claim 9 , wherein the image includes band-limited noise at spatial frequencies that correspond to known attributes of the array of pixels, the method further comprising filtering out the band-limited noise at those frequencies. 11. The method of claim 10 , wherein computing the disparity comprises computing a Fourier cross-correlation of the captured image.

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Classifications

  • operating by diffraction only · CPC title

  • G01C3/14Primary

    with binocular observation at a single point, e.g. stereoscopic type (G01C3/20 takes precedence) · CPC title

  • Processing, recording or transmission of stereoscopic or multi-view image signals · CPC title

  • from stereo images · CPC title

  • wherein the generated image signals comprise depth maps or disparity maps · CPC title

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What does patent US10317205B2 cover?
Binocular depth-perception systems use binary, phase-antisymmetric gratings to cast point-source responses onto an array of photosensitive pixels. The gratings and arrays can be manufactured to tight tolerances using well characterized and readily available integrated-circuit fabrication techniques, and can thus be made small, cost-effective, and efficient. The gratings produce point-source res…
Who is the assignee on this patent?
Rambus Inc
What technology area does this patent fall under?
Primary CPC classification G01C3/14. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 11 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).