Information processing apparatus, information processing method, and storage medium

US10311559B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10311559-B2
Application numberUS-201515528072-A
CountryUS
Kind codeB2
Filing dateDec 3, 2015
Priority dateDec 12, 2014
Publication dateJun 4, 2019
Grant dateJun 4, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

To present a determination result with respect to input data and also a reason of the determination result to a user, an extraction unit configured to extract a plurality of feature amounts from an image including an inspection target object, a determination unit configured to determine an anomaly degree of the inspection target object on the basis of the extracted feature amounts, and an image generation unit configured to generate a defect display image representing a defect included in the inspection target object on the basis of contribution degrees of the respective feature amounts with respect to the determined anomaly degree are provided.

First claim

Opening claim text (preview).

The invention claimed is: 1. An information processing apparatus comprising: one or more processors; and a memory coupled to the one or more processors, the memory having stored thereon instructions which, when executed by the one or more processors, cause the information processing apparatus to perform operations including: extracting a plurality of types of feature amounts from an image including an inspection target object, determining an anomaly degree of the inspection target object based on the extracted plurality of types of feature amounts, generating a plurality of feature amount maps each for representing a distribution of feature amounts of respective one of the extracted plurality of types of feature amounts, integrating the generated plurality of feature amount maps to obtain an integrated map based on contribution degrees of the respective plurality of feature amounts with respect to the determined anomaly degree, and displaying, on a display, the integrated map as a defect image representing a defect included in the inspection target object. 2. The information processing apparatus according to claim 1 , wherein executing the instructions further causes the information processing apparatus to perform operations including generating plural pieces of score information, each representing a score of each of the plurality of feature amounts from the image, wherein the anomaly degree is determined based on the plural pieces of score information. 3. The information processing apparatus according to claim 2 , wherein the score information is two-dimensional array information having a number of dimensions that is the same as a number of dimensions of the image. 4. An information processing apparatus comprising: one or more processors; and a memory coupled to the one or more processors, the memory having stored thereon instructions which, when executed by the one or more processors, cause the information processing apparatus to perform operations including: extracting a plurality of feature amounts from a plurality of images including an inspection target object, determining an anomaly degree of the inspection target object based on the extracted plurality of feature amounts, generating an image in which a defect included in the inspection target object is emphasized, by synthesizing the plurality of images to one another based on contribution degrees of the respective plurality of feature amounts with respect to the determined anomaly degree, and displaying, on a display, the generated image in which the defect included in the inspection target object is emphasized. 5. The information processing apparatus according to claim 4 , wherein the plurality of images are images including the inspection target object which are respectively irradiated with different pattern illuminations. 6. The information processing apparatus according to claim 1 , wherein executing the instructions further causes the information processing apparatus to perform operations including determining whether the inspection target object is normal or abnormal based on the anomaly degree. 7. The information processing apparatus according to claim 1 , wherein executing the instructions further causes the information processing apparatus to perform operations including generating a plurality of hierarchical images having different resolutions by performing a predetermined conversion on the image, and wherein extracting includes extracting the plurality of feature amounts from the plurality of hierarchical images. 8. The information processing apparatus according to claim 7 , wherein the plurality of feature amounts include at least one of the following: a maximum value, an average value, a variance, a kurtosis, a skewness, a contrast, and a maximum gradient of pixel values in the plurality of hierarchical images. 9. The information processing apparatus according to claim 7 , wherein the predetermined conversion includes Wavelet conversion. 10. A method for an information processing apparatus the method comprising: extracting a plurality of types of feature amounts from an image including an inspection target object; determining an anomaly degree of the inspection target object based on the extracted plurality of types of feature amounts; generating a plurality of feature amount maps each for representing a distribution of feature amounts of respective one of the extracted plurality of types of feature amounts; integrating the generated plurality of feature amount maps to obtain an integrated map based on contribution degrees of the respective plurality of feature amounts with respect to the determined anomaly degree; and displaying, on a display, the integrated map as a defect image representing a defect included in the inspection target object. 11. A method for an information processing apparatus the method comprising: extracting a plurality of feature amounts from a plurality of images including an inspection target object; determining an anomaly degree of the inspection target object based on the extracted plurality of feature amounts; generating an image in which a defect included in the inspection target object is emphasized, by synthesizing the plurality of images to one another based on contribution degrees of the respective plurality of feature amounts with respect to the determined anomaly degree; and displaying, on a display, the generated image in which the defect included in the inspection target object is emphasized. 12. A non-transitory computer readable storage medium storing a program causing a computer to execute the method according to claim 10 . 13. A non-transitory computer readable storage medium storing a program causing a computer to execute the method according to claim 11 .

Assignees

Inventors

Classifications

  • using classification, e.g. of video objects · CPC title

  • Single-class perspective, e.g. one-against-all classification; Novelty detection; Outlier detection · CPC title

  • G06T7/0002Primary

    Inspection of images, e.g. flaw detection · CPC title

  • Specially adapted optical and illumination features · CPC title

  • for evaluating statistical data {, e.g. average values, frequency distributions, probability functions, regression analysis (forecasting specially adapted for a specific administrative, business or logistic context G06Q10/04)} · CPC title

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What does patent US10311559B2 cover?
To present a determination result with respect to input data and also a reason of the determination result to a user, an extraction unit configured to extract a plurality of feature amounts from an image including an inspection target object, a determination unit configured to determine an anomaly degree of the inspection target object on the basis of the extracted feature amounts, and an image…
Who is the assignee on this patent?
Canon Kk
What technology area does this patent fall under?
Primary CPC classification G06T7/0002. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 04 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 7 related publications on this page (citations in our corpus or others sharing the same primary CPC).