Compound Elliptical Reflector for Curing Optical Fibers
US-2015028020-A1 · Jan 29, 2015 · US
US10308550B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10308550-B2 |
| Application number | US-201815917000-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 9, 2018 |
| Priority date | Mar 10, 2017 |
| Publication date | Jun 4, 2019 |
| Grant date | Jun 4, 2019 |
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A device for applying radiation to a target is provided. The device includes a radiation emitter to emit electromagnetic radiation having a peak emission wavelength in the range from 10 nm-1 mm, and a first reflector that extends in a length direction with a concave cross section. The first reflector defines a cavity area having a perimeter, and includes an inward facing reflective border for at least 50% of the perimeter of the cavity area. Radiation is provided to the cavity area with an intensity distribution I and a maximum intensity I max . The cavity area includes a focal area defined by all points at which a normalized intensity I/I max is greater than 0.2. A width of the focal area is 0.0001-0.5 times a width of the cavity area.
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What is claimed: 1. A device for applying radiation to a target, the device comprising: a radiation emitter configured to emit electromagnetic radiation having a peak emission wavelength in the range from 10 nm to 1 mm from a radiation emitting surface of the radiation emitter; and a first reflector that extends in a length direction and has a concave cross section perpendicular to the length direction, the first reflector defining a cavity area having a perimeter, the first reflector having an inward facing reflective border for at least 50% of the perimeter of the cavity area, wherein the radiation emitting surface is oriented so as to provide radiation to the cavity area with an intensity distribution I and a maximum intensity I max , wherein the cavity area includes a focal area defined by all points at which a normalized intensity I/I max is greater than 0.2, wherein a width of the focal area is 0.0001 to 0.5 times a width of the cavity area, and wherein the width of the focal area and the width of the cavity area are determined along a line passing through a point of maximum intensity I max and which is parallel to a line joining two end points of the radiation emitting surface of the radiation emitter. 2. The device of claim 1 wherein an area of the focal area is 0.00000001 to 0.30 times that of the cavity area. 3. The device of claim 1 wherein an area of the focal area is in a range of 1-3000 mm 2 . 4. The device of claim 1 wherein a width of the focal area is in a range of 0.01-50 mm. 5. The device of claim 1 wherein for a circle centered at a point of I max and having a diameter equal to the width of the focal area, a minimum value of intensity on a circumference of the circle divided by a maximum value of intensity on the circumference of the circle is at least 0.2. 6. The device of claim 1 further comprising a further reflector which provides an inward facing reflective border to part of the perimeter of the cavity area. 7. The device of claim 6 wherein the further reflector defines an aperture, wherein the radiation emitter is located outside the cavity area and the radiation emitting surface is oriented toward the aperture. 8. The device of claim 1 further comprising a target chamber having a target chamber wall, wherein the target chamber wall is transparent to a peak emission wavelength of the radiation emitter, wherein at least 50% of the focal area is included in the target chamber. 9. The device of claim 8 wherein the focal area is completely included in the target chamber. 10. The device of claim 9 wherein at least one of (i) an inert gas, and (ii) a flow of an inert gas, is provided in the target chamber. 11. The device of claim 1 further comprising one or more air ducts in the perimeter of the cavity area. 12. The device of claim 1 wherein the normalized intensity I/I max in the cavity area has a maximum gradient of less than 1 per mm. 13. The device of claim 1 wherein the normalized intensity I/I max in the focal area has a maximum gradient of less than 0.5 per mm. 14. The device of claim 1 wherein a peak emission wavelength of the radiation emitter is in a range of 170-450 nm. 15. The device of claim 1 wherein a peak emission wavelength of the radiation emitter is in a range of 700 nm-1 mm. 16. The device of claim 1 wherein the radiation emitter includes an array of at least four radiation emitters. 17. The device of claim 1 wherein the radiation emitter includes refractive optics to alter the divergence of radiation emitted from the radiation emitting surface. 18. The device of claim 1 further comprising one or more reflectors perpendicular to the length direction of the first reflector. 19. The device of claim 1 further comprising a motion system for moving a target relative to the radiation emitter. 20. A method of applying radiation to a target, the method comprising the steps of: (a) introducing a target into the device of claim 1 ; and (b) applying radiation to the target using the radiation emitter.
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