Method for manufacturing display device

Patent metadata

Field	Value
Publication number	US-10297797-B2
Application number	US-201815911311-A
Country	US
Kind code	B2
Filing date	Mar 5, 2018
Priority date	Mar 8, 2017
Publication date	May 21, 2019
Grant date	May 21, 2019

Abstract

A method for manufacturing a display device includes forming an insulating layer embedding a transistor arranged on a substrate, forming a first electrode electrically connected with the transistor above the insulating layer, forming a partition wall layer having an opening part covering a periphery edge part of the first electrode and exposing an inner side region of the first electrode, forming an organic layer including an organic electroluminescent material above the first electrode, forming a second electrode above the partition layer and the organic layer, and forming a sealing layer above the second electrode. Deposition of the second electrode includes a film deposition step of an electrode layer having a thinner film thickness than a target film thickness of the second electrode, and a waiting step after completion of the deposition step of the electrode layer.

First claim

What is claimed is:

1. A method for manufacturing a display device, the method comprising:
forming an insulating layer embedding a transistor arranged on a substrate;
forming a first electrode electrically connected with the transistor above the insulating layer;
forming a partition wall layer having an opening part covering a periphery edge part of the first electrode and exposing an inner side region of the first electrode;
forming an organic layer including an organic electroluminescent material above the first electrode;
forming a second electrode above the partition wall layer and the organic layer; and
forming a sealing layer above the second electrode,
wherein
the forming of the second electrode includes a film deposition step of a unit electrode layer, and a waiting step after completion of the film deposition step of the unit electrode layer, and
the film deposition step of the unit electrode layer and the waiting step are repeated until a total thickness of the second electrode layer reaches a target film thickness.

2. The method according to claim 1 , wherein a film thickness of the unit electrode layer to be formed in each the film deposition step is constant and the film deposition step and the waiting step are repeated until the desired film thickness is reached.

3. The method according to claim 1 , wherein a film thickness and composition of each the unit electrode layer to be formed in each the film deposition step are constant and the film deposition step and the waiting step are repeated until the desired film thickness is reached.

4. The method according to claim 1 , wherein the unit electrode layer to be formed in the film deposition step is formed by a transparent conductive film.

5. The method according to claim 4 , wherein the transparent conductive film is one type selected from indium tin oxide, indium zinc oxide, zinc oxide doped with aluminum or zinc oxide doped with gallium.

6. The method according to claim 1 , wherein the second electrode is fabricated by a sputtering method.

7. The method according to claim 6 , wherein pressure of the waiting step is low with respect to sputtering pressure in the film deposition step.

8. The method according to claim 7 , wherein the waiting step is carried out under a vacuum evacuation.

9. The method according to claim 1 , wherein the film deposition step for forming the second electrode is carried out successively for each of a plurality of the substrates in a sputtering apparatus.

10. The method according to claim 9 , wherein the film deposition step for forming the second electrode is carried out successively for each of a plurality of the substrates until an accumulated value of the film thickness of the unit electrode layer to be formed reaches a fixed standard.

11. The method according to claim 10 , wherein a cleaning treatment is carried out in the sputtering apparatus when the fixed standard is reached so as to remove a deposit of a sputtering target attached to the sputtering apparatus.

12. The method according to claim 11 , wherein the cleaning treatment is a removal treatment of the deposit attached to a non-erosion region of the sputtering target.

13. The method according to claim 12 , wherein the cleaning treatment is a treatment for widening a swing range of a magnet arranged on a rear surface of the sputtering target up to the non-erosion region.

Assignees

• Japan Display Inc

Inventors

• Kitano Naomu
• Ono Keisuke

Classifications

• H01L27/3244

  Electricity · mapped topic

• H01L2227/323

  Electricity · mapped topic

• H01L51/0021

  Electricity · mapped topic

• H01L51/56 Primary

  Electricity · mapped topic

• H01L2251/306

  Electricity · mapped topic