Method for fabrication of crack-free ceramic dielectric films
US-2016376708-A1 · Dec 29, 2016 · US
US10297744B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10297744-B2 |
| Application number | US-201515032422-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 29, 2015 |
| Priority date | Aug 29, 2014 |
| Publication date | May 21, 2019 |
| Grant date | May 21, 2019 |
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A piezoelectric ceramic plate which is slightly deformed by firing, includes a plate-shaped substrate, and an electronic component. The piezoelectric ceramic plate has a pair of main surfaces, a pair of opposing first side surfaces, and a pair of opposing second side surfaces. The pair of first side surfaces are baked surfaces, and the distance between the pair of first side surfaces measured at the center in the longitudinal direction is denoted by Lc and the distance between the pair of first side surfaces measured at ends in the longitudinal direction is denoted by Le. The ratio of the difference ΔL between Le and Lc to Lc (ΔL/Lc) is 1.0% or less. The piezoelectric ceramic plate is suitably used as a piezoelectric ceramic plate having an area of each of the main surfaces of 360 mm 2 or more and a thickness of 150 μm or less.
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The invention claimed is: 1. A piezoelectric ceramic plate including a plurality of crystal grains containing a lead zirconate titanate type crystal, comprising a pair of quadrangular main surfaces, a pair of first side surfaces opposing each other, and a pair of second side surfaces opposing each other, wherein the plurality of crystal grains includes first crystal grains having rounded corners and second crystal grains having rounded corners, wherein the pair of first side surfaces includes both the first crystal grains and the second crystal grains, and where the distance between the pair of first side surfaces measured at the center in the longitudinal direction of the first side surfaces is denoted by Lc and the distance between the pair of first side surfaces measured at ends in the longitudinal direction of the first side surfaces is denoted by Le, the ratio of the difference ΔL between Le and Lc to Lc (ΔL/Lc) is 1.0% or less, wherein a content inside of the first crystal grain includes at least Zn and Bi, and the content of the Zn and Bi inside of the first crystal grain is less than a content of Zn and Bi in an area including a crystal grain boundary adjoining the first crystal grain, and wherein a content inside of the second crystal grain includes at least Zn and Bi, and the content of the Zn and Bi inside of the second crystal grain is equal to or greater than a content of Zn and Bi in an area including the crystal grain boundary adjoining the second crystal grain. 2. The piezoelectric ceramic plate according to claim 1 , wherein the area of each of the main surfaces is 360 mm 2 or more. 3. The piezoelectric ceramic plate according to claim 1 , wherein the area of each of the main surfaces is 1000 mm 2 or more. 4. The piezoelectric ceramic plate according to claim 1 , wherein the piezoelectric ceramic plate has a thickness of 150 μm or less. 5. A plate-shaped substrate comprising the piezoelectric ceramic plate according to claim 1 and an internal electrode within the piezoelectric ceramic plate. 6. An electronic component comprising a surface electrode disposed on a surface of the plate-shaped substrate according to claim 5 , and a via hole conductor connected to the internal electrode, extending in the thickness direction of the piezoelectric ceramic plate, and led to the surface of the plate-shaped substrate. 7. An electronic component comprising the plate-shaped substrate according to claim 5 , and an external electrode disposed on each of the second side surfaces of the piezoelectric ceramic plate and connected to the internal electrode, wherein the electronic component has a processed surface as each of the second side surfaces of the piezoelectric ceramic plate, and the external electrode is disposed on the processed surface.
Electricity · mapped topic
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Electricity · mapped topic
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