Imaging device and pixel signal reading method
US-2017214864-A1 · Jul 27, 2017 · US
US10291865B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10291865-B2 |
| Application number | US-201615342192-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 3, 2016 |
| Priority date | Nov 3, 2016 |
| Publication date | May 14, 2019 |
| Grant date | May 14, 2019 |
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A scanning sensor system disclosed. The scanning sensor system induces a sensing element array and multiple analog-to-digital converters (ADCs). The sensing element array includes a group of pixels organized in a row and column configuration. During each read cycle, each pixel in an odd column of a row x is selectively connected to a corresponding one of the ADCs that is associated with the odd column pixels, while each pixel in an even column of a row x+(N/2)+1 is selectively connected to a corresponding one of ADCs that is associated with the even column pixels, wherein x is an integer and N is the total number of rows in the sensing element array.
Opening claim text (preview).
What is claimed is: 1. A scanning sensor system comprising: a sensing element array having a plurality of pixels organized in a row and column configuration; a plurality of switches; and a plurality of analog-to-digital converters (ADCs), wherein during one read cycle, each pixel in an odd column of a row x is selectively connected to a corresponding one of said plurality of ADCs in said odd column via one of said switches, while each pixel in an even column of a row x+(N/2)+1 is selectively connected to a corresponding one of said plurality of ADCs in said even column via one of said switches, wherein x is an integer and N is an even integer indicating the total number of rows in said sensing element array. 2. The scanning sensor system of claim 1 , further comprising a plurality of sample-and-hold circuits coupled to said ADCs. 3. The scanning sensor system of claim 2 , further comprising a processor coupled to said ADCs. 4. The scanning sensor system of claim 3 , further comprising a display coupled to said processor. 5. A scanning sensor system comprising: a sensing element array having a plurality of pixels organized in a row and column configuration; a plurality of switches; and a plurality of analog-to-digital converters (ADCs), wherein during one read cycle, each pixel in a column 3x−2 of a row x is selectively connected to a corresponding one of said plurality of ADCs in said column 3x−2 via one of said switches, each pixel in a column 3x−1 of a row x+(N/3)+1 is selectively connected to a corresponding one of said plurality of ADCs in said column 3x−1 via one of said switches, and each pixel in a column 3x of a row x+(2N/3)+1 is selectively connected to a corresponding one of said plurality of ADCs in said column 3 x via one of said switches, wherein x is an integer and N is a divisible-by-3 integer indicating the total number of rows in said sensing element array. 6. The scanning sensor system of claim 5 , further comprising a plurality of sample-and-hold circuits coupled to said ADCs. 7. The scanning sensor system of claim 6 , further comprising a processor coupled to said ADCs. 8. The scanning sensor system of claim 7 , further comprising a display coupled to said processor. 9. A method for improving frame rate in a scanning sensor system, said method comprising: providing a sensing element array having a plurality of pixels organized in a row and column configuration; providing a plurality of analog-to-digital converters (ADCs); during one read cycle, selectively connecting each pixel in an odd column of a row x to a corresponding one of said plurality of ADCs in said odd column, and concurrently selectively connecting each pixel in an even column of a row x+(N/2)+1to a corresponding one of said plurality of ADCs in said even column, wherein x is an integer and N is an even integer indicating the total number of rows in said sensing element array.
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