Integrated compound DBR laser for HAMR applications
US-9431043-B2 · Aug 30, 2016 · US
US10283151B1 · US · B1
| Field | Value |
|---|---|
| Publication number | US-10283151-B1 |
| Application number | US-201815933721-A |
| Country | US |
| Kind code | B1 |
| Filing date | Mar 23, 2018 |
| Priority date | May 2, 2017 |
| Publication date | May 7, 2019 |
| Grant date | May 7, 2019 |
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An apparatus comprises a first electrical contact, a second electrical contact, and a semiconductor device disposed between the first and second electrical contacts. The semiconductor device comprises a laser diode and a temperature control unit. The laser diode comprises p-type semiconductor material and n-type semiconductor material. The temperature control unit comprises p-type semiconductor material, n-type semiconductor material, and a resistor coupled to the laser diode. One of the p-type semiconductor material and the n-type semiconductor material is shared by the laser diode and the temperature control unit.
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What is claimed is: 1. An apparatus, comprising: a first electrical contact; a second electrical contact; and a semiconductor device disposed between the first and second electrical contacts, the semiconductor device comprising: a laser diode comprising p-type semiconductor material and n-type semiconductor material; and a temperature control unit comprising p-type semiconductor material, n-type semiconductor material, and a resistor or a shunt coupled to the laser diode; wherein one of the p-type semiconductor material and the n-type semiconductor material is shared by the laser diode and the temperature control unit. 2. The apparatus of claim 1 , wherein the n-type semiconductor material is shared by the laser diode and the temperature control unit. 3. The apparatus of claim 1 , wherein the p-type semiconductor material is shared by the laser diode and the temperature control unit. 4. The apparatus of claim 1 , wherein: the laser diode is configured to activate and the temperature control unit is configured to deactivate in response to application of a first differential voltage to the first and second electrical contacts; and the laser diode is configured to deactivate and the temperature control unit is configured to activate in response to application of a second differential voltage opposite in polarity to the first differential voltage to the first and second electrical contacts. 5. The apparatus of claim 1 , wherein the resistor is configured to generate heat to warm the laser diode when the temperature control unit is activated and the laser diode is deactivated. 6. The apparatus of claim 1 , wherein the temperature control unit is configured to sense a temperature of the laser diode when the temperature control unit is activated and the laser diode is deactivated. 7. The apparatus of claim 1 , wherein: the laser diode comprises: first p-type semiconductor material in contact with the first electrical contact; shared n-type semiconductor material in contact with the second electrical contact; and an active region between the first p-type semiconductor material and the shared n-type semiconductor material; and the temperature control unit comprises: second p-type semiconductor material in contact with second n-type semiconductor material; the shared n-type semiconductor material in contact with the second electrical contact; an active region between the second p-type semiconductor material and the shared n-type semiconductor material; and an electrical shunt between the shared n-type semiconductor material and the second p-type semiconductor material. 8. The apparatus of claim 1 , wherein: the laser diode comprises: first n-type semiconductor material in contact with the first electrical contact; shared p-type semiconductor material in contact with the second electrical contact; and an active region between the first n-type semiconductor material and the shared p-type semiconductor material; and the temperature control unit comprises: second n-type semiconductor material in contact with second p-type semiconductor material; the shared p-type semiconductor material in contact with the second electrical contact; an active region between the second n-type semiconductor material and the shared p-type semiconductor material; and an electrical shunt between the shared p-type semiconductor material and the second n-type semiconductor material. 9. The apparatus of claim 1 , wherein: the laser diode comprises: first p-type semiconductor material in contact with the first electrical contact; first n-type semiconductor material; an active region between the first p-type semiconductor material and the first n-type semiconductor material; shared n-type semiconductor material in contact with the second electrical contact; an electrically insulating layer between the first n-type semiconductor material and the shared n-type semiconductor material; and a first electrical shunt between the first n-type semiconductor material and the shared n-type semiconductor material; and the temperature control unit comprises: second p-type semiconductor material; second n-type semiconductor material; an active region between the second p-type semiconductor material and the second n-type semiconductor material; shared n-type semiconductor material in contact with the second electrical contact; an electrically insulating layer between the second n-type semiconductor material and the shared n-type semiconductor material; and a second electrical shunt between the shared n-type semiconductor material and the second p-type semiconductor material; wherein an electrical insulator is disposed between the first n-type semiconductor material of the laser diode and the second n-type semiconductor material of the temperature control unit. 10. The apparatus of claim 1 , wherein: the laser diode comprises: first n-type semiconductor material in contact with the first electrical contact; first p-type semiconductor material; an active region between the first n-type semiconductor material and the first p-type semiconductor material; shared p-type semiconductor material in contact with the second electrical contact; an electrically insulating layer between the first p-type semiconductor material and the shared p-type semiconductor material; and a first electrical shunt between the first p-type semiconductor material and the shared p-type semiconductor material; and the temperature control unit comprises: second n-type semiconductor material; second p-type semiconductor material; an active region between the second n-type semiconductor material and the second p-type semiconductor material; shared p-type semiconductor material in contact with the second electrical contact; an electrically insulating layer between the second p-type semiconductor material and the shared p-type semiconductor material; and a second electrical shunt between the shared p-type semiconductor material and the second n-type semiconductor material; wherein an electrical insulator is disposed between the first p-type semiconductor material of the laser diode and the second p-type semiconductor material of the temperature control unit. 11. An apparatus, comprising: a slider configured for heat-assisted magnetic recording, the slider comprising a writer, a near-field transducer, and an optical waveguide configured to communicate light through the slider; and a semiconductor device integral or coupled to the slider, the semiconductor device disposed between a first electrical contact and a second electrical contact and comprising: a laser diode coupled to the waveguide and comprising p-type semiconductor material and n-type semiconductor material; and a temperature control unit comprising p-type semiconductor material, n-type semiconductor material, and a resistor or a shunt coupled to the laser diode; wherein one of the p-type and n-type semiconductor materials is shared by the laser diode and the temperature control unit. 12. The apparatus of claim 11 , wherein the n-type semiconductor material is shared by the laser diode and the temperature control unit. 13. The apparatus of claim 11 , wherein the p-type semiconductor material is shared by the laser diode and the temperature control unit. 14. The apparatus of claim 11 , wherein: the laser diode is configured to activate and the temperature control unit is configured to deactivate in response to application of a first differential voltage to the first and second electrical contacts; and the laser diode is configured to deactivate and the temperatur
characterised by the shape · CPC title
Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers (stabilisation of output H01S5/06) · CPC title
Thermally assisted recording using an auxiliary energy source for heating the recording layer locally to assist the magnetization reversal · CPC title
Heating, e.g. the laser is heated for stabilisation against temperature fluctuations of the environment (H01S5/0612 takes precedence, for monolithically integrated heaters see also H01S5/0261) · CPC title
the arm comprising an optical waveguide, e.g. for thermally-assisted recording · CPC title
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