Assay apparatuses, methods and reagants

Patent metadata

Field	Value
Publication number	US-10281678-B2
Application number	US-201414147216-A
Country	US
Kind code	B2
Filing date	Jan 3, 2014
Priority date	Jan 4, 2013
Publication date	May 7, 2019
Grant date	May 7, 2019

Abstract

Apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation are described. They are particularly well suited for conducting automated analysis in a multi-well plate assay format.

First claim

We claim:

1. An instrument comprising:
a contact platform, wherein the contact platform comprises a plurality of interrogation zones and each interrogation zone comprises at least one pair of working and counter electrical contact probes to conduct a voltage potential to the interrogation zone,
a controller operatively connected to a voltage source, wherein the voltage source is connectable to said at least one pair of working and counter electrical contact probes, and
a multiplexer connected to the controller and to the voltage source for selectively connecting the voltage source to the working electrical contact probe of a single interrogation zone or connecting the voltage source to the working electrical contact probes of more than one interrogation zone
wherein the counter electrical contact probes of more than one interrogation zone are electrically connected to the contact platform and to an electrical ground.

2. The instrument of claim 1 , wherein the plurality of interrogation zones are arranged in a P×Q matrix.

3. The instrument of claim 1 , wherein the interrogation zones are interrogated one zone at a time.

4. The instrument of claim 1 , wherein more than one interrogation zone are interrogated at a time.

5. An instrument adapted to interrogate samples contained in a multi-well plate comprising:
a carriage frame configured to support the multi-well plate and the carriage frame is movable relative to a contact platform,
wherein the multi-well plate comprises a plurality of wells, wherein the wells are arranged in a M×N matrix, and
wherein the contact platform comprises a plurality of interrogation zones, wherein each interrogation zone comprises at least a pair of electrical contact probes to conduct a voltage potential to at least one well, and

a controller operatively connected to a motor to move the carriage frame relative to the contact platform and operatively connected to a voltage source, wherein the voltage source is connectable to the one or more pairs of electrical contact probes, and
a multiplexer connected to the controller and to the voltage source for selectively connecting the voltage source to the pair of electrical contact probes of a single interrogation zone or connecting the voltage source to at least one pair of electrical contact probes of more than one interrogation zone.

6. The instrument of claim 5 , wherein the interrogation zones are arranged in a P×Q matrix, and wherein the M×N matrix is larger than the P×Q matrix.

7. The instrument of claim 5 , wherein multi-well plate comprises bottom electrical contacts for each well on a bottom surface of the plate, wherein the bottom electrical contacts are adapted to contact the pairs of electrical contact probes on the contact platform.

8. The instrument of claim 7 , wherein the multi-well plate further comprises internal electrodes in said wells connected to the bottom electrical contacts to conduct the voltage potential to within the wells.

9. The instrument of claim 8 , wherein the at least a pair of electrical contact probes on the platform are connected to the bottom electrical contacts on the plate and to the internal electrodes in the wells to interrogate the wells.

10. The instrument of claim 5 , wherein the electrical contact probes on the platform comprises a plurality of working contact probes that are selectively connected by the controller to the voltage source to determine the number of wells to interrogate.

11. The instrument of claim 10 , wherein the working contact probes that are not connected are electrically isolated in the multiplexer.

12. The instrument of claim 10 , wherein the electrical contact probes on the platform further comprises a plurality of counter contact probes that are electrically connected to at least one electrical ground.

13. The instrument of claim 12 , wherein the bottom electrical contacts of the multi-well tray that are connected to the counter contact probe on the contact platform for at least one well are electrically isolated.

14. The instrument of claim 13 , wherein the electrical contact probes are independently spring-loaded contact members.

15. The instrument of claim 12 , wherein the plurality of counter contact probes on the platform is connected to a plurality of counter electrodes in the wells.

16. The instrument of claim 5 , wherein the wells are interrogated one well at a time.

17. The instrument of claim 5 , wherein more than one well are interrogated at a time.

18. A focusing mechanism for an optical sensor comprising at least a higher, middle and lower patterned surface spaced apart from the optical sensor;
wherein the middle patterned surface is aligned to a target surface to be focused by the optical sensor;
wherein a first distance between the higher and middle patterned surfaces and a second distance between the middle surface and lower patterned surface are substantially equal,
wherein the optical sensor and the patterned surfaces are moved relative to each other until a difference between a first and a second contrast value difference is less than a predetermined value; and
an illuminating source positioned to project light through the higher, middle and lowered patterned surfaces toward the optical sensor.

19. The focusing mechanism of claim 18 , wherein the target surface comprises a reference surface of a platform that selectively conducts electricity to samples that are interrogated by the optical sensor.

20. The focusing mechanism of claim 19 , wherein the middle patterned surface is aligned to the reference surface of the platform by a predetermined amount.

21. The focusing mechanism of claim 18 , wherein the target surface comprises a bottom surface of a tray carrying at least one sample to be interrogated by the optical sensor.

22. The focusing mechanism of claim 21 , wherein the middle patterned surface and the bottom surface of the tray are aligned to substantially a same planar level.

23. A method for focusing an optical sensor to a spaced apart platform comprising the steps of
a. providing at least a higher, middle and lower patterned surface, wherein the middle patterned surface and the platform are aligned to each other and wherein a first distance between the higher and middle patterned surfaces and a second distance between the middle surface and lower patterned surface are substantially equal;
b. obtaining a first contrast value difference between the higher and middle patterned surfaces with the optical sensor;
c. obtaining a second contrast value difference between the middle and lower patterned surfaces with the optical sensor;
d. comparing the first and second contrast value differences.

24. The method of claim 23 further comprising the step of (e) adjusting a distance between the optical sensor and the platform and repeating steps (b) to (d) until a difference between the first and second contrast value differences is determined to be less than a predetermined value.

25. The method of claim 24 , wherein the predetermined value is less than about ±4.0.

26. The method of claim 23 , wherein the middle patterned surface is aligned substantially to a same planar level as a bottom surface of a tray carrying at least one sample to be interrogated by the optical sensor.

27. The method of claim 26 , wherein the platform comprises a plurality of electrode contact probes that contact the bottom surface of th

Assignees

• Meso Scale Technologies Llc

Inventors

• Chamberlin Ian
• Clinton Charles M
• Glezer Eli N
• Jeffrey-Coker Bandele
• Kochar Manish
• Kovacs Sandor
• Le D T
• Leimkuehler Aaron
• Sigal George
• Tabakin Leo
• Willoughby Jon

Classifications

• G01N21/253

  for batch operation, i.e. multisample apparatus (analytical automats G01N35/00) · CPC title

• G01N35/028

  having reaction cells in the form of microtitration plates · CPC title

• G01N21/6452

  Individual samples arranged in a regular 2D-array, e.g. multiwell plates · CPC title

• G02B7/36 Primary

  using image sharpness techniques {, e.g. image processing techniques for generating autofocus signals (image data processing per se G06T; in cameras having a solid state image sensor H04N23/67)} · CPC title