Microfluidic devices and systems, and methods for operating microfluidic devices and systems
US-2024408596-A1 · Dec 12, 2024 · US
US10281304B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10281304-B2 |
| Application number | US-201314440264-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 6, 2013 |
| Priority date | Nov 6, 2012 |
| Publication date | May 7, 2019 |
| Grant date | May 7, 2019 |
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Method for estimating a gas flow in an enclosure maintained in a low pressure regimen relative to the gas, including: measuring, as a function of time, a gas flow J measurement in the enclosure, and estimating values of the parameters A and B iteratively implemented by decreasing an estimation error based on a difference between J estim (t) and J measurement , and wherein, when J measurement corresponds to a pressure rise of the gas in the enclosure, J estim (t) is calculated according to the equation: J estim ( t ) = 2 A ∑ n = 1 n ma x ( B π ( t - OffX ) ) 1 2 exp ( - 2 ( n + 1 ) 2 4 B ( t - OffX ) ) + OffY and when J measurement corresponds to a pressure decrease of the gas in the enclosure, J estim (t) is calculated according to the equation: J estm ( t ) = P init - 2 A ∑ n = 1 n ma x ( B π ( t - OffX ) ) 1 2 exp ( - ( 2 n + 1 ) 2 4 B ( t - OffX ) ) + OffY FIG. 1 .
Opening claim text (preview).
The invention claimed is: 1. A method for estimating a permeation of a gas barrier layer, comprising: providing a permeameter including first and second chambers separated from each other by the gas barrier layer, wherein the first chamber is filled with at least one gas and the second chamber is maintained in a low pressure regimen relative to said at least one gas; providing a mass spectrometer in the second chamber of the permeameter; measuring, by the mass spectrometer, an evolution of a partial pressure of the at least one gas in the second chamber as a function of time; calculating, by processing circuitry, a gas flow J measurement in the second chamber based on the measured partial pressure of the at least one gas in the second chamber; estimating, by the processing circuitry, values of parameters A and B iteratively implemented by decreasing an estimation error based on a difference between an estimation of the gas flow J estim (t) and the measured gas flow J measurement , wherein when the measured gas flow J measurement corresponds to a pressure rise of the at least one gas in the second chamber, the estimation of the gas flow J estim (t) is calculated according to the equation: J estim ( t ) = 2 A ∑ n = 1 n max ( B π ( t - OffX ) ) 1 2 exp ( - ( 2 n + 1 ) 2 4 B ( t - OffX ) ) + OffY when the measured gas flow J measurement corresponds to a pressure decrease of the at least one gas in the second chamber, the estimation of the gas flow J estim (t) is calculated according to the equation: J estim ( t ) = P init - 2 A ∑ n = 1 n max ( B π ( t - OffX ) ) 1 2 exp ( - ( 2 n + 1 ) 2 4 B (
and measuring fluid flow rate, i.e. permeation rate or pressure change · CPC title
Correcting or compensating means · CPC title
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