Systems and methods for improving resolution in lensless imaging

US10274652B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10274652-B2
Application numberUS-201715423892-A
CountryUS
Kind codeB2
Filing dateFeb 3, 2017
Priority dateFeb 5, 2016
Publication dateApr 30, 2019
Grant dateApr 30, 2019

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

An imaging device uses a grating to produce an interference pattern for capture by a photodetector array. Digital photographs and other image information can then be extracted from the pattern. An integrated processor locally supports this extraction by upsampling the captured interference pattern and deconvolving the upsampled pattern with an image-calculation parameter set that represents the grating at a resolution greater than that provided by the photodetector array. Deconvolving the upsampled pattern with a high-resolution parameter increases the resolution of extracted image information.

First claim

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What is claimed is: 1. An imaging system comprising: a phase grating exhibiting a point-spread function and receiving incident light, the phase grating casting an interference pattern responsive to the incident light, the phase grating including boundaries of odd symmetry separating stepped features on opposite sides of each boundary; a photodetector array to sense and capture the interference pattern at a first resolution, the stepped features on the opposite sides of each boundary offset from the photodetector array; an image-calculation parameter set at a second resolution greater than the first resolution; and at least one processor to upsample the captured interference pattern from the first resolution to the second resolution, and to compute an image from the image-calculation parameter set and the upsampled interference pattern; the boundaries of odd symmetry to induce a phase difference of half of a wavelength the incident light, plus an integer multiple of the wavelength, to produce curtains of destructive interference at the photodetector array. 2. The imaging system of claim 1 , further comprising non-volatile memory to store the image-calculation parameter set. 3. The imaging system of claim 1 , wherein the processor and photodetector array are integrated. 4. The imaging system of claim 1 , wherein the wavelength is in the infrared region of the electromagnetic spectrum. 5. The imaging system of claim 1 , wherein the processor, in computing the image, employs Fourier deconvolution of the upsampled interference pattern. 6. The imaging system of claim 1 , wherein the image-calculation parameter set comprises a point-spread function. 7. The imaging system of claim 1 , wherein the image-calculation parameter set comprises a Fourier transform of the point-spread function. 8. The imaging system of claim 1 , further comprising an integrated aperture. 9. A method of imaging a scene, the method comprising: passing infrared light from the scene through an optical element having a point-spread function, the optical element casting a pattern responsive to the infrared light; sampling the pattern at an image-capture resolution; upsampling the sampled pattern to an image-processing resolution greater than the image-capture resolution to produce an upsampled pattern; and computing an image of the scene from the upsampled pattern and an image-calculation parameter set of the optical element; wherein the image-calculation parameter set of the point-spread function is of the image-processing resolution. 10. The method of claim 9 , wherein the computing the image includes Fourier deconvolution of the upsampled pattern. 11. The method of claim 9 , further comprising resampling the image of the scene. 12. An imaging system comprising: a phase grating exhibiting a point-spread function and receiving incident light, the phase grating comprising boundaries of odd symmetry casting a response responsive to the incident light; an image-calculation parameter set at a first resolution; a photodetector array to sample the response at a second resolution less than the first resolution; and at least one processor to upsample the sampled response and compute an image from the image-calculation parameter set and the upsampled response; the phase grating to induce a phase difference of half of a wavelength the incident light, plus an integer multiple of the wavelength, to produce curtains of destructive interference at the photodetector array. 13. The imaging system of claim 12 , wherein the upsampled response is of the first resolution. 14. The imaging system of claim 12 , wherein the image-calculation parameter set comprises a point-spread function of the phase grating. 15. A method of imaging a scene, the method comprising: passing infrared light from the scene through an optical element having a point-spread function, the optical element casting a pattern responsive to the infrared light; sampling the pattern at an image-capture resolution; upsampling the sampled pattern to an image-processing resolution greater than the image-capture resolution to produce an upsampled pattern; and computing an image of the scene from the upsampled pattern and an image-calculation parameter set of the optical element; wherein the optical element comprises a phase grating, the phase grating including boundaries of odd symmetry separating stepped features on opposite sides of each boundary, the phase grating to induce a phase difference of half of a wavelength of the infrared light, plus an integer multiple of the wavelength, to produce curtains of destructive interference.

Assignees

Inventors

Classifications

  • Gratings for image generation (G02B5/1847 takes precedence) · CPC title

  • Circuitry of solid-state image sensors [SSIS]; Control thereof · CPC title

  • G02B5/1871Primary

    Transmissive phase gratings · CPC title

  • Electricity · mapped topic

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Frequently asked questions

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What does patent US10274652B2 cover?
An imaging device uses a grating to produce an interference pattern for capture by a photodetector array. Digital photographs and other image information can then be extracted from the pattern. An integrated processor locally supports this extraction by upsampling the captured interference pattern and deconvolving the upsampled pattern with an image-calculation parameter set that represents the…
Who is the assignee on this patent?
Rambus Inc
What technology area does this patent fall under?
Primary CPC classification G02B5/1871. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 30 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).