X-ray fluoroscopic imaging system

Patent metadata

Field	Value
Publication number	US-10274636-B2
Application number	US-201414582076-A
Country	US
Kind code	B2
Filing date	Dec 23, 2014
Priority date	Dec 30, 2013
Publication date	Apr 30, 2019
Grant date	Apr 30, 2019

Abstract

The present invention may perform fluoroscopic imaging simultaneously on the subjects in at least two channels using only one electron accelerator, at least two sets of X-ray beams and at least two sets of detector systems, through the design of the electron accelerator, the shielding and collimating device, the at least two detector arrays and various mechanical composite structures. The X-ray fluoroscopic imaging system according to the present invention may be designed in specific forms of a stationary type, an assembled type, a track mobile type or vehicular mobile type, etc., and has advantages such as simple structure, low cost, strong function, good image quality and the like.

First claim

What is claimed is:

1. An X-ray fluoroscopic imaging system for fluoroscopic imaging subjects in at least two inspection channels, comprising:
an electron accelerator,
a shielding and collimating device,
at least two detector arrays,
wherein, the electron accelerator includes an electron emitting unit, an electron accelerating unit and a target;
wherein, the shielding and collimating device includes a shielding structure and at least two collimators respectively corresponding to the at least two detector arrays;
wherein, each of the at least two detector arrays, the collimator corresponding to this detector array and a target point targeted by the electric beam are located in one plane;
wherein, each of the at least two collimators is a slit with a uniform thickness, so as to extract a planar fan-shaped X-ray beam with a uniform intensity distribution;
wherein, each of the detector arrays is in an arc shape which takes the target point as the arc center;
wherein, the X-ray beam has a downward field angle of 15° (−15°) and a upward field angle of 75° (+75°) with respect to the horizontal plane (0°).

2. The X-ray fluoroscopic imaging system according to claim 1 ,
wherein the at least two inspection channels comprise a first inspection channel and a second inspection channel, the at least two detector arrays comprise first and second detector arrays respectively corresponding to the first and second inspection channels, the at least two collimators comprise first and second collimators respectively corresponding to the first and second detector arrays;
wherein the first and second collimators are disposed on both sides of the axis of the electron beam respectively, and the first inspection channel and the second inspection channel are disposed on both sides of the electron accelerator respectively;
wherein, the first collimator, the first detector array and the target point targeted by the electric beam are located in a first plane, and the second collimator, the second detector array and the target point targeted by the electric beam are located in a second plane.

3. The X-ray fluoroscopic imaging system according to claim 2 , wherein the first plane and the second plane respectively form a first angle and a second angle with respect to the axis of the electron beam, and a first X-ray beam and a second X-ray beam with uniform intensity distributions are respectively extracted in the first plane and the second plane.

4. The X-ray fluoroscopic imaging system according to claim 3 , wherein the first angle and the second angle are equal in magnitude, and the first X-ray beam and the second X-ray beam are symmetrical.

5. The X-ray fluoroscopic imaging system according to claim 2 , wherein an angle between the axis of the electron accelerator and the first inspection channel and an angle between the axis of the electron accelerator and the second inspection channel are both less than 60°.

6. The X-ray fluoroscopic imaging system according to claim 5 , wherein the axis of the electron accelerator is parallel to the first inspection channel and the second inspection channel.

7. The X-ray fluoroscopic imaging system according to claim 2 , wherein an angle formed between the first plane and the first channel and an angle formed between the second plane and the second channel are both greater than 45°.

8. The X-ray fluoroscopic imaging system according to claim 7 , wherein the angle formed between the first plane and the first channel and the angle formed between the second plane and the second channel are both 90°.

9. The X-ray fluoroscopic imaging system according to claim 2 , further comprising at least one transferring device, which is mounted in the first inspection channel and/or the second inspection channel, and used to drag an subject to pass through the region radiated by the X-ray at a set speed.

10. The X-ray fluoroscopic imaging system according to claim 2 , further comprising:
a device chamber, which is fixed on the ground between the first inspection channel and the second inspection channel, and in which the electron accelerator and the shielding and collimating device are mounted;
at least one transferring device, which is mounted in the first inspection channel and/or the second inspection channel, and used to drag the subject to pass through the region radiated by the X-ray at a set speed;
a first detector arm support, which is located outside the first inspection channel and in which a first detector array is mounted, such that the first detector array is located in the first plane in which the first collimator is located;
a second detector arm support, which is located outside the second inspection channel and in which a second detector array is mounted, such that the second detector array is located in the second plane in which the second collimator is located; and
a control chamber, in which the power supply and control subsystem and the signal analysis and image processing subsystem are mounted;
wherein, a whole cross section of the X-ray fluoroscopic imaging system shows a Ω-shaped structure.

11. The X-ray fluoroscopic imaging system according to claim 2 , mountable on a chassis; the X-ray fluoroscopic imaging system further comprises at least an X-ray source cabin, a device cabin, an operating cabin, a first arm support system and a second arm support system; wherein:
the electron accelerator and the shielding and collimating device are mounted in the X-ray source cabin, a first X-ray beam is extracted towards one side of the chassis by the first collimator, and a second X-ray beam is extracted towards the other side of the chassis by the second collimator;
the first arm support system includes the first detector array; in its operating state, the first arm support system is unfolded on one side of the chassis and forms a ‘gate-type’ structure with the chassis, and the first detector array is located in the first plane in which the first collimator is located; and in its non-operating state, the first arm support system is folded and stored on the top of the chassis;
the second arm support system includes the second detector array; in its operating state, the second arm support system is unfolded on the other side of the chassis and forms a ‘gate-type’ structure with the chassis, and the second detector array is located in the second plane in which the second collimator is located; and in its non-operating state, the second arm support system is folded and stored on the top of the chassis;
the power supply and control subsystem, and the signal analysis and image processing subsystem are mounted in the device cabin; and
in the operating cabin, a device for system operation and office is mounted.

12. The X-ray fluoroscopic imaging system according to claim 2 , mountable on a chassis; the X-ray fluoroscopic imaging system further comprises at least an X-ray source cabin, a device cabin, an operating cabin, a first arm support system, a second arm support system, a third arm support system and a fourth arm support system; wherein:
the electron accelerator and the shielding and collimating device are mounted in the X-ray source cabin, and the shielding and collimating device further comprises third and fourth collimators, the first and third collimators are arranged in different angles with respect to the target and are configured to guide out a first X-ray beam and a third X-ray beam having different energy and different angles towards one side of the chassis respectively, and the second and fourth collimators are arranged in different angles with respect to the target and are configured to guide out a second X-ray beam and a fourth X-ray beam havin

Assignees

• Nuctech Co Ltd
• Univ Tsinghua

Inventors

• Tang Huaping
• Chen Zhiqiang
• Tang Chuanxiang
• Chen Huaibi
• Li Yuanjing
• Zhao Ziran
• Liu Yaohong
• Sun Shangmin
• Yan Xinshui
• Qin Zhanfeng

Classifications

• G01V5/0016 Primary

  Physics · mapped topic

• G01V5/0066

  Physics · mapped topic

• G01V5/0033

  Physics · mapped topic

• G01V5/005

  Physics · mapped topic

• G01V5/223 Primary

  Mixed interrogation beams, e.g. using more than one type of radiation beam · CPC title