Determining functional data of an X-ray detector

Patent metadata

Field	Value
Publication number	US-10274608-B2
Application number	US-201615002436-A
Country	US
Kind code	B2
Filing date	Jan 21, 2016
Priority date	Jan 29, 2015
Publication date	Apr 30, 2019
Grant date	Apr 30, 2019

Abstract

A method is described for determining the polarization state of a sensor of an X-ray detector. In the method, the X-ray detector is illuminated with a sequence of light pulses wherein the individual pulses of the light pulse sequence have a different intensity. It is further determined at what intensity of the light pulses, charge pulses generated by the sensor of the X-ray detector exceed a threshold voltage of a signal detection circuit. Also described is a method for obtaining and/or setting functional data of a sensor of an X-ray detector and/or of a sensor illumination unit. Furthermore, an X-ray detector is described.

First claim

What is claimed is:

1. A method for determining a polarization state of a sensor of an X-ray detector, comprising:
illuminating the X-ray detector with a sequence of light pulses, individual ones of the light pulses of the light pulse sequence including different intensities;
determining above which intensity of the light pulses, charge pulses generated by the sensor of the X-ray detector exceed a threshold voltage of a signal detection circuit; and
determining the polarization state from a correlation of the determined illumination intensity and the exceeded threshold voltage.

2. The method of claim 1 , wherein at least one of
the light pulse sequence includes IR light pulses, and
the light pulse sequence includes an intensity which rises or falls over time.

3. A method for at least one of obtaining and setting functional data of a sensor of at least one of an X-ray detector and an illumination unit, the method comprising:
applying the method of claim 2 .

4. The method of claim 1 , wherein the determination of the polarization state of the sensor of the X-ray detector is achieved by the determining.

5. A method comprising:
applying a method, for determining a polarization state of a sensor of an X-ray detector, to at least one of obtain and set functional data of at least one of a sensor of an X-ray detector and an illumination unit, the method for determining the polarization state of the sensor of the X-ray detector including
illuminating the X-ray detector with a sequence of light pulses, individual ones of the light pulses of the light pulse sequence including different intensities;
determining above which intensity of the light pulses, charge pulses generated by the sensor of the X-ray detector exceed a threshold voltage of a signal detection circuit; and
determining the polarization state from a correlation of determined illumination intensity and an exceeded threshold voltage, wherein determination of the polarization state of the sensor of the X-ray detector is achieved by the determining.

6. The method of claim 5 , further comprising:
determining a polarization state of the sensor of the X-ray detector before performing an X-ray scan;
carrying out an X-ray scan with the aid of the X-ray detector;
determining the polarization state of the sensor of the X-ray detector after the performance of the X-ray scan; and
determining a difference between the intensities of the light pulses associated with exceeding of a particular pre-set threshold voltage and measured on determination of the polarization state of the sensor before and after the performance of the X-ray scan.

7. The method as claimed in claim 6 , further comprising:
carrying out, based on a determined change in the polarization state, a correction of an X-ray image scan.

8. The method of claim 5 , further comprising:
carrying out the method, for determining the polarization state of the sensor of the X-ray detector, with an already calibrated X-ray detector for a plurality of pixels of the calibrated X-ray detector; and
determining an illumination intensity profile of the illumination unit, based on intensity values determined for different pixels as calibration data.

9. The method of claim 8 , further comprising:
applying the method for determining the polarization state of the sensor of the X-ray detector, on a plurality of pixels of the sensor of the X-ray detector;
correlating determined illumination intensity values with voltage threshold values, used in the method for determining the polarization state of the sensor of the X-ray detector, for each of the plurality of pixels of the sensor of the X-ray detector; and
determining, from the correlated illumination intensity values, corresponding X-ray energy values as calibration data.

10. The method of claim 9 , wherein the determined illumination intensity values are corrected with the aid of the illumination intensity profile determined and in the correlation, the corrected illumination intensity values are correlated with the voltage threshold values used in the method for determining the polarization state of the sensor of the X-ray detector, for each of the plurality of pixels of the sensor of the X-ray detector.

11. The method of claim 10 , wherein for the determining of the X-ray energy values corresponding to the correlated illumination intensity values, a uniform relation valid for all the pixels of the sensor of the X-ray detector between the illumination intensity and the X-ray energy is determined or for each pixel individually, a relationship between illumination intensity and X-ray energy is determined.

12. The method of claim 9 , wherein for the determining of the X-ray energy values corresponding to the correlated illumination intensity values, a uniform relation valid for all the pixels of the sensor of the X-ray detector between the illumination intensity and X-ray energy is determined or for each pixel individually, a relationship between illumination intensity and X-ray energy is determined.

13. The method of claim 5 , further comprising testing at least one of
whether pixels of a sensor are functioning,
whether connection between individual pixels and a signal detection unit associated with each pixel is functioning, and
whether individual signal detection units are functioning.

14. The method of claim 5 , further comprising testing at least one of
an operational readiness of a detector, and
whether energy threshold values of the detector are correctly stored in signal detection units of the detector.

15. The method of claim 5 , further comprising determining whether a corrected HV level has been applied to the sensor of the X-ray detector.

16. The method of claim 5 , further comprising at least one of
determining whether illumination units of the illumination unit are functioning and
determining whether a diffuser of the illumination unit has become cloudy.

17. The method of claim 5 , wherein a pulse length of the light pulses is selected such that, during creation of the individual pulses of the light pulse sequence, the pulse length and the light intensity of the pulses of the illumination unit are decoupled from one another with a different intensity.

18. The method of claim 5 , wherein at least one of
the light pulse sequence includes IR light pulses, and
the light pulse sequence includes an intensity which rises or falls over time.

19. The method of claim 18 , further comprising:
carrying out the method, for determining the polarization state of the sensor of the X-ray detector, with an already calibrated X-ray detector for a plurality of pixels of the calibrated X-ray detector; and
determining an illumination/intensity profile of the illumination unit, based on intensity values determined for different pixels as calibration data.

20. The method of claim 18 , further comprising:
applying the method, for determining the polarization state of the sensor of the X-ray detector, on a plurality of pixels of the sensor of the X-ray detector;
correlating determined illumination intensity values with voltage threshold values, used in the method for determining the polarization state of the sensor of the X-ray detector, for each of the plurality of pixels of the sensor of the X-ray detector; and
determining, from the correlated illumination intensity values, corresponding X-ray energy values as calibration data.

21. The method of claim 5 , further comprising:
applying the method, for determining the polariza

Assignees

• Siemens Ag

Inventors

• Schroeter Christian
• Sievers Peter

Classifications

• A61B6/585

  Calibration of detector units · CPC title

• G01T1/247

  Detector read-out circuitry (for processing gain or off-set correction H04N) · CPC title

• G01T1/00 Primary

  Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation (G01T3/00, G01T5/00 take precedence) · CPC title

• G01T1/24 Primary

  with semiconductor detectors · CPC title

• G01T7/005

  calibration techniques (stabilization of spectrometer G01T1/40) · CPC title