Method for imaging 1-D nanomaterials

Patent metadata

Field	Value
Publication number	US-10267682-B2
Application number	US-201514838387-A
Country	US
Kind code	B2
Filing date	Aug 28, 2015
Priority date	Aug 29, 2014
Publication date	Apr 23, 2019
Grant date	Apr 23, 2019

Abstract

A method for imaging one dimension nanomaterials is provided. Firstly, one dimension nanomaterials sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the one dimensional nanomaterials sample is immersed in the liquid. Thirdly, the one dimensional nanomaterials sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Fourthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the one dimensional nanomaterials sample. Fifthly, spectra of the one dimensional nanomaterials sample are measured to obtain chirality of the one dimensional nanomaterials sample.

First claim

What is claimed is:

1. A method for imaging one dimensional nanomaterials comprising steps of:
S 10 , providing one dimensional nanomaterials sample, an optical microscope with a liquid immersion objective, a liquid and a prism, wherein the prism comprises a side surface and a top surface, an angle between the side surface and the top surface is less than 90 degrees, and the one dimensional nanomaterials sample is located on the top surface;
S 20 , immersing the one dimensional nanomaterials sample in the liquid;
S 30 , illuminating the one dimensional nanomaterials sample by an incident beam through the side surface to generate resonance Rayleigh scattering when the carbon nanotube sample is illuminated by the incident beam; wherein the incident beam is a white light with a continuous spectrum;
S 40 , immersing the liquid immersion objective into the liquid to get a resonance Rayleigh scattering (RRS) image of the one dimensional nanomaterials sample; and
S 50 , measuring resonance Rayleigh scattering spectra of the one dimensional nanomaterials sample to obtain a chirality of the one dimensional nanomaterials sample.

2. The method as claimed in claim 1 , wherein in step S 10 , the one dimensional nanomaterials sample comprises carbon nanotubes horizontally aligned on a substrate, and the carbon nanotubes are parallel to each other.

3. The method as claimed in claim 2 , wherein the substrate is a Si substrate coated with a SiO 2 layer, the substrate has a thickness of 500 nanometers, and the SiO 2 layer has a thickness of 100 nanometers.

4. The method as claimed in claim 3 , wherein the liquid is oil, and the liquid immersion objective is oil liquid immersion objective.

5. The method as claimed in claim 4 , wherein in step S 20 , the oil is disposed on the carbon nanotube sample, and the carbon nanotubes are covered by the oil.

6. The method as claimed in claim 5 , wherein in step S 30 , and the incident beam is orthogonal to the side surface and illuminates to the carbon nanotubes through the side surface and the top surface.

7. The method as claimed in claim 1 , wherein the incident beam is filtered and focused before reaching the carbon nanotubes.

8. The method as claimed in claim 1 , wherein in step S 40 , a camera is connected to the optical microscope to record the RRS image of the one dimensional nanomaterials sample.

9. The method as claimed in claim 1 , wherein in step S 50 , spectral information of the one dimensional nanomaterials sample is obtained by a spectrometer.

10. The method as claimed in claim 9 , wherein the spectral information is Rayleigh scattering spectra, Raman scattering spectra, or fluorescence spectral information.

11. The method as claimed in claim 9 , wherein in step S 50 , the Rayleigh scattering spectra and the Raman scattering spectra of the one dimensional nanomaterials sample are measured to obtain chiral indices of the one dimensional nanomaterials sample.

12. The method as claimed in claim 11 , wherein the Raman scattering spectra of the one dimensional nanomaterials sample is obtained on the basis of the Rayleigh scattering spectra of the one dimensional nanomaterials sample comprises steps of:
S 51 , measuring resonance Rayleigh scattering spectra of the one dimensional nanomaterials sample;
S 52 , selecting excitation wavelength needed to produce Raman scattering by Rayleigh scattering spectra of the one dimensional nanomaterials sample; and
S 53 , obtaining the Raman scattering of the one dimensional nanomaterials sample.

13. The method as claimed in claim 12 , wherein the Raman spectra of the one dimensional nanomaterials sample is excited by a light source.

14. The method as claimed in claim 1 , wherein the carbon nanotube sample is a single-walled carbon nanotube.

15. The method as claimed in claim 1 , wherein the angle between the side surface and the top surface is in a range from 45 degrees to 90 degrees.

16. The method as claimed in claim 1 , wherein the angle between the side surface and the top surface is 75 degrees.

Assignees

• Univ Tsinghua
• Hon Hai Prec Ind Co Ltd

Inventors

• Wu wen-yun
• Yue Jing-Ying
• Lin xiao-yang
• Zhao Qing-Yu
• Jiang Kai-Li
• Fan Shou-Shan

Classifications

• G01N2021/4702

  Global scatter; Total scatter, excluding reflections · CPC title

• B82B3/009

  Characterizing nanostructures, i.e. measuring and identifying electrical or mechanical constants · CPC title

• G02B21/33

  Immersion oils {, or microscope systems or objectives for use with immersion fluids} · CPC title

• G01N21/65

  Raman scattering · CPC title

• G01N21/6458

  Fluorescence microscopy (fluorescence microscopes per se G02B21/0076 and G02B21/16) · CPC title