Defect detection method and defect detection apparatus

Patent metadata

Field	Value
Publication number	US-10267618-B2
Application number	US-201715611254-A
Country	US
Kind code	B2
Filing date	Jun 1, 2017
Priority date	Jun 2, 2016
Publication date	Apr 23, 2019
Grant date	Apr 23, 2019

Abstract

A defect detection apparatus is provided that can inspect a measurement region of a target object at one time and without inconsistencies arising within the measurement region. A defect detection apparatus 10 includes: a generation unit (signal generator 11 and vibrator 12) for generating an elastic wave in a target object S; an illumination unit (pulsed laser light source 13 and illumination light lens 14) for performing stroboscopic illumination onto a measurement region of a surface of the target object S; and a displacement measurement unit (speckle shearing interferometer 15) for collectively measuring displacements in a normal direction at each point of the measurement region with respect to at least three mutually-different phases of the elastic wave by controlling a phase of the elastic wave and a timing of the stroboscopic illumination. Defects in the measurement region are detected based on the displacements in the normal direction at each point of the measurement region with respect to at least three phases that are obtained by the displacement measurement unit.

First claim

The invention claimed is:

1. A defect detection method, comprising:
a) a step of generating an elastic wave in a target object;
b) a step of performing stroboscopic illumination onto a measurement region of a surface of the target object;
c) a step of collectively measuring displacements in a normal direction at each point in the measurement region with respect to at least three mutually-different phases of the elastic wave by controlling a phase of the elastic wave and a timing of the stroboscopic illumination; and
d) a step of detecting a defect in the measurement region based on the displacements in the normal direction at each point in the measurement region with respect to the at least three phases.

2. The defect detection method according to claim 1 , wherein a number of phase states with respect to the at least three phases is equal to or greater than (2n+1), where the n is a natural number equal to or greater than 2, and an n th -order harmonic component of the elastic wave is detected based on the displacements in the normal direction at each point in the measurement region, and the defect in the measurement region is detected based on the n th -order harmonic component.

3. The defect detection method according to claim 1 , wherein the step of collectively measuring displacements in the normal direction at each point in the measurement region is performed using speckle shearing interferometry.

4. The defect detection method according to claim 3 , wherein a number of phase states with respect to the at least three phases is equal to or greater than (2n+1), where the n is a natural number equal to or greater than 2, and an n th -order harmonic component of the elastic wave is detected based on the displacements in the normal direction at each point in the measurement region, and the defect in the measurement region is detected based on the n th -order harmonic component.

5. A defect detection apparatus, comprising:
a) a generation unit configured to generate an elastic wave in a target object;
b) an illumination unit configured to perform stroboscopic illumination onto a measurement region of a surface of the target object; and
c) a displacement measurement unit configured to collectively measure displacements in a normal direction at each point in the measurement region with respect to at least three mutually-different phases of the elastic wave by controlling a phase of the elastic wave and a timing of the stroboscopic illumination.

6. The defect detection apparatus according to claim 5 , wherein the displacement measurement unit collectively measures the displacements in the normal direction at each point in the measurement region using speckle shearing interferometry.

7. The defect detection apparatus according to claim 6 , wherein a number of phase states with respect to the at least three phases is equal to or greater than (2n+1), where the n is a natural number equal to or greater than 2, and an n th -order harmonic component of the elastic wave is detected based on the displacements in the normal direction at each point in the measurement region, and a defect in the measurement region is detected based on the n th -order harmonic component.

8. The defect detection apparatus according to claim 5 , wherein a number of phase states with respect to the at least three phases is equal to or greater than (2n+1), where the n is a natural number equal to or greater than 2, and an n th -order harmonic component of the elastic wave is detected based on the displacements in the normal direction at each point in the measurement region, and a defect in the measurement region is detected based on the n th -order harmonic component.

9. A defect detection apparatus, comprising:
a) a generation unit comprising a signal generator and a vibrator, the generation unit configured to generate, with the signal generator and the vibrator, an elastic wave in a target object;
b) a light source configured to perform stroboscopic illumination onto a measurement region of a surface of the target object; and
c) an interferometer configured to collectively measure displacements in a normal direction at each point in the measurement region with respect to at least three mutually-different phases of the elastic wave by controlling a phase of the elastic wave and a timing of the stroboscopic illumination.

10. The defect detection apparatus according to claim 9 , wherein the interferometer collectively measures the displacements in the normal direction at each point in the measurement region using speckle shearing interferometry.

11. The defect detection apparatus according to claim 10 , wherein a number of phase states with respect to the at least three phases is equal to or greater than (2n+1), where the n is a natural number equal to or greater than 2, and an n th -order harmonic component of the elastic wave is detected based on the displacements in the normal direction at each point in the measurement region, and a defect in the measurement region is detected based on the n th -order harmonic component.

12. The defect detection apparatus according to claim 9 , wherein a number of phase states with respect to the at least three phases is equal to or greater than (2n+1), where the n is a natural number equal to or greater than 2, and an n th -order harmonic component of the elastic wave is detected based on the displacements in the normal direction at each point in the measurement region, and a defect in the measurement region is detected based on the n th -order harmonic component.

13. The defect detection apparatus according to claim 9 , wherein the generation unit is configured to generate, with the signal generator and the vibrator, the elastic wave in the target object while the vibrator is in a non-contact state with the target object.

Assignees

• Shimadzu Corp

Inventors

• Hatahori Takahide
• Takubo Kenji

Classifications

• G01N29/043

  in the interior, e.g. by shear waves · CPC title

• G01N2291/0234

  Metals, e.g. steel · CPC title

• G01M5/0091

  by using electromagnetic excitation or detection · CPC title

• G01B9/02096

  detecting a contour or curvature · CPC title

• G01N21/1702 Primary

  with opto-acoustic detection, e.g. for gases or analysing solids · CPC title