Glass ceramic sintered compact and wiring board
US-10071932-B2 · Sep 11, 2018 · US
US10264672B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10264672-B2 |
| Application number | US-201815962076-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 25, 2018 |
| Priority date | Apr 28, 2017 |
| Publication date | Apr 16, 2019 |
| Grant date | Apr 16, 2019 |
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A glass substrate includes a plurality of through holes that penetrate from a first surface to a second surface of the glass substrate. Each through hole has an upper aperture with a first diameter on the first surface and a lower aperture with a second diameter on the second surface. For each of ten through holes selected from the plurality of through holes, a side wall length is obtained from the first and second diameters and the thickness of the glass substrate, and an R value is obtained by dividing the side wall length by the thickness of the glass substrate. The R values fall within a range of 1 to 1.1. A B value, obtained from dividing a difference between the greatest R value and the smallest R value by an average of the R values followed by multiplication with 100, is 5% or less.
Opening claim text (preview).
What is claimed is: 1. A glass substrate comprising: a first surface; a second surface; and a plurality of through holes that penetrate from the first surface to the second surface, wherein each of the through holes has an upper aperture with a diameter ϕ 1 on the first surface, and a lower aperture with a diameter ϕ 2 on the second surface, wherein selected through holes are ten through holes randomly selected from the plurality of through holes, wherein a straight type through hole is a selected through hole, in which a constricted part with a diameter being less than a smaller diameter from among the diameter ϕ 1 and the diameter ϕ 2 is absent, and an X-type through hole is a selected through hole, in which a constricted part with a diameter ϕ 3 being less than a smaller diameter from among the diameter ϕ 1 and the diameter ϕ 2 is present, wherein, for each of the selected through holes, in a cross section of the selected through hole cut along an axis of expansion of the selected through hole, an approximated length L of a side wall is [ Math 1 ] L = t 2 + ( ϕ 1 - ϕ 2 2 ) 2 formula ( 1 ) when the selected through hole is a straight type through hole, and [ Math 2 ] L = ( t 2 ) 2 + ( ϕ 1 - ϕ 3 2 ) 2 + ( t 2 ) 2 + ( ϕ 2 - ϕ 3 2 ) 2 formula ( 2 ) when the selected through hole is an X-type through hole, where t is a thickness of the glass substrate, wherein R values each expressed by a ratio of the approximate length of the side wall to the thickness of the glass substrate, L/t, fall within a range of 1 to 1.1, and wherein a B value obtained by [ Math 3 ] B = R max - R min R ave × 100
Inorganic insulating substrates, e.g. ceramic, glass · CPC title
Via connections; Lands around holes or via connections (H05K1/112 takes precedence) · CPC title
by liquid chemical etching · CPC title
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Hole or via having special cross-section, e.g. elliptical · CPC title
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