Light-emitting diode with transparent conductive electrodes for improvement in light extraction efficiency

Patent metadata

Field	Value
Publication number	US-10263157-B2
Application number	US-201715629106-A
Country	US
Kind code	B2
Filing date	Jun 21, 2017
Priority date	Jul 19, 2016
Publication date	Apr 16, 2019
Grant date	Apr 16, 2019

Abstract

A light-emitting diode device may include a conductive substrate, a metal reflection layer provided on the conductive substrate, a transparent insulating layer provided on the metal reflection layer, an n ohmic contact plug provided in a lower portion of each of through holes formed in the transparent insulating layer, an n-type gallium arsenide (GaAs) plug provided in an upper portion of the through hole, an n cladding layer provided on the transparent insulating layer, an active layer provided on the n cladding layer, a p cladding layer provided on the active layer, a p-type GaP window layer provided on the p cladding layer, a p ohmic contact pattern provided on the p-type GaP window layer, a transparent conductive metal oxide pattern provided on the p ohmic contact layer, and a p electrode pad provided on the transparent conductive metal oxide.

First claim

What is claimed is:

1. A method of fabricating a light-emitting diode device, comprising:
sequentially stacking a first n-GaAs layer, an n-GaInP layer, a second n-GaAs layer, an n cladding layer, an active layer, a p cladding layer, and a p-type GaP layer on a GaAs substrate;
sequentially stacking a p ohmic contact pattern and a transparent conductive metal oxide pattern on the p-type GaP layer;
forming a p electrode pad on the transparent conductive metal oxide pattern;
bonding a temporary substrate on the p electrode pad and removing the GaAs substrate, the first n-GaAs layer, and the n-GaInP layer;
patterning the second n-GaAs layer to form n-type gallium arsenide (GaAs) plugs;
forming a transparent insulating layer on the n cladding layer and the n-type GaAs plugs and patterning the transparent insulating layer to form through holes in the transparent insulating layer;
forming n ohmic contact plugs in the through holes, vertically aligned with the n-type GaAs plugs such that the n-type GaAs plugs and the n ohmic contact plugs are embedded in the transparent insulating layer;
forming a metal reflection layer on the transparent insulating layer and the n ohmic contact plugs and attaching a conductive substrate onto the metal reflection layer; and
removing the temporary substrate.

2. The method of claim 1 , further comprising thermally treating a substrate having the p ohmic contact pattern and the transparent conductive metal oxide pattern thereon at a temperature of 300° C.-400° C.

3. The method of claim 1 , wherein a thickness of the p ohmic contact pattern is less than or equal to 20 nm,
the p ohmic contact pattern comprises at least one of Au, AuBe, Ni, NiZn, NiBe, Pd, PdZn, or PdBe, and
the transparent conductive metal oxide pattern comprises at least one of indium tin oxide (ITO), ZnO, aluminum-doped zinc oxide (Al—ZnO; AZO), gallium-doped zinc oxide (GZO), or In—Ga ZnO (IGZO).

4. The method of claim 1 , wherein the p ohmic contact pattern is a 10 nm-thick Au layer, and
the transparent conductive metal oxide pattern is a 40 nm-thick ITO layer.

5. The method of claim 1 , wherein the p ohmic contact pattern is a 10 nm-thick AuBe layer, and
the transparent conductive metal oxide pattern is a 40 nm-thick IGZO layer.

6. The method of claim 1 , wherein the n cladding layer comprises an n-type AlGaInP layer and an n-type AlInP layer in sequence, and
the p cladding layer comprises a p-type AlInP layer and a p-type AlGaInP layer in sequence.

7. The method of claim 1 , wherein the active layer is configured to emit light, and the metal reflection layer is configured to reflect the light emitted from the active layer.

8. The method of claim 7 , wherein the metal reflection layer includes silver (Ag) or a silver alloy.

9. The method of claim 1 , wherein the transparent insulating layer includes a silicon oxide or magnesium fluoride.

10. The method of claim 1 , wherein patterning the transparent insulating layer comprises forming a photomask pattern on the transparent insulating layer and exposing the n-type GaAs plugs by etching the transparent insulating layer using the photomask pattern as an etch mask, and forming the n ohmic contact plugs comprises depositing a material for the n ohmic contact plugs on the exposed n-type GaAs plug, and removing the photomask.

11. The method of claim 10 , wherein the n ohmic contact plugs and the n-type GaAs plugs together form an ohmic contact in the transparent insulating layer.

12. The method of claim 10 , wherein the n ohmic contact plugs includes Au or AuGe.

13. The method of claim 10 , wherein the transparent insulating layer comprises a silicon-oxide or magnesium-fluoride layer.

14. The method of claim 10 , wherein the material for the n ohmic contact plugs includes Au or AuGe.

15. The method of claim 1 , wherein the conductive substrate comprises a conductive silicon substrate or a metal substrate.

16. The method of claim 1 , further comprising, prior to attaching the conductive substrate onto the metal reflection layer, providing a wafer bonding layer on the conductive substrate, and bonding the conductive substrate to the metal reflection layer.

17. The method of claim 16 , wherein the wafer bonding layer includes at least one Sn-containing alloy bonded to the conductive substrate by a thermal treatment process at temperature of about 200° C.

18. The method of claim 1 , wherein the active layer is an undoped or intrinsic semiconductor layer.

19. The method of claim 18 , wherein the active layer includes AlGaInP and is configured to emit red or infrared light.

20. The method of claim 1 , wherein the p cladding layer includes a p-type AlInP layer and a p-type AlGaInP layer in sequence.

Assignees

• Seong Tae Yeon
• Kim Dae Hyun
• Choi Byoungjun
• Univ Korea Res & Bus Found

Inventors

• Seong Tae Yeon
• Kim Dae-Hyun
• Choi Byoungjun

Classifications

• H01L33/14

  Electricity · mapped topic

• H01L33/20

  Electricity · mapped topic

• H01L33/22

  Electricity · mapped topic

• H01L33/30

  Electricity · mapped topic

• H01L33/44

  Electricity · mapped topic