Active stabilization of ion trap radiofrequency potentials

US10262849B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10262849-B2
Application numberUS-201815997107-A
CountryUS
Kind codeB2
Filing dateJun 4, 2018
Priority dateDec 23, 2015
Publication dateApr 16, 2019
Grant dateApr 16, 2019

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  1. Title

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  5. First independent claim

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Abstract

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Disclosed are improved methods and structures for actively stabilizing the oscillation frequency of a trapped ion by noninvasively sampling and rectifying the high voltage RF potential at circuit locations between a step-up transformer and a vacuum feedthrough leading to the ion trap electrodes. We use this sampled/rectified signal in a feedback loop to regulate the RF input amplitude to the circuit. By employing techniques and structures according to the present disclosure we are advantageously able to stabilize a 1 MHz trapped ion oscillation frequency to <10 Hz after 200 s of integration, representing a 34 dB reduction in the level of trap frequency noise and drift, over a locking bandwidth of up to 30 kHz.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for actively stabilizing ion trap radiofrequency (RF) potentials comprising: noninvasively sampling a high voltage potential at a position in a circuit between a step-up transformer and a vacuum feedthrough for electrodes of the ion trap; rectifying the sampled high voltage potential signal; and applying the rectified signal to a feedback loop of the circuit such that an amplitude of an RF input to the circuit is desirably regulated, and the ion trap RF potentials are actively stabilized; wherein the rectification is performed through the effect of a temperature compensating rectifier including two matched diodes configured for passive temperature compensation in conjunction with a low-pass filter configured such that a ripple amplitude of at least 10 dB below diode input signal amplitude is produced. 2. The method according to claim 1 further comprising: applying the rectified signal to a frequency mixer that controls an RF oscillator amplitude. 3. The method according to claim 2 further comprising: generating an error signal by comparing the rectified signal to a stable set-point voltage reference. 4. The method according to claim 3 further comprising: amplifying the error signal and then applying the error signal to the frequency mixer. 5. The method according to claim 4 further comprising stabilizing a ratio of voltage to frequency (V 0 /Ω) through the effect of a digital counter and divider circuit. 6. The method according to claim 5 wherein the ion trap is a component of a system selected from the group consisting of: quantum information processor, ion trap mass spectrometer, and multipole mass spectrometer. 7. The method according to claim 6 wherein the ion trap exhibits a geometry selected from the group consisting of: quadrupole trap, linear trap, surface ion trap, hexapole trap, and higher-order trap. 8. The method according to claim 7 wherein the sampling and providing are effected under the control of a digital computer.

Assignees

Inventors

Classifications

  • H01J49/022Primary

    Circuit arrangements, e.g. for generating deviation currents or voltages (regulating electric or magnetic variables in general, e.g. current, magnetic field G05F); Components associated with high voltage supply (high voltage supply per se H02M) · CPC title

  • Two-dimensional RF ion traps (ion guides without mass selection H01J49/062) · CPC title

  • Methods for using particle spectrometers · CPC title

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What does patent US10262849B2 cover?
Disclosed are improved methods and structures for actively stabilizing the oscillation frequency of a trapped ion by noninvasively sampling and rectifying the high voltage RF potential at circuit locations between a step-up transformer and a vacuum feedthrough leading to the ion trap electrodes. We use this sampled/rectified signal in a feedback loop to regulate the RF input amplitude to the ci…
Who is the assignee on this patent?
Univ Maryland
What technology area does this patent fall under?
Primary CPC classification H01J49/022. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Apr 16 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).