Method for improving timing resolution using depth of interaction correction in PET detector

US10261201B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10261201-B2
Application numberUS-201615090156-A
CountryUS
Kind codeB2
Filing dateApr 4, 2016
Priority dateApr 4, 2016
Publication dateApr 16, 2019
Grant dateApr 16, 2019

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Abstract

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A method for determining depth-of-interaction correction in a PET system. The method includes modifying crystal and readout configuration to improve depth-dependent arrival profile of scintillation photons, creating a photon dispersion model within a scintillator crystal, measuring photon arrival profile of individual gamma ray event, deriving an estimated depth-of-interaction, and deriving a gamma ray event time based on a time stamp corrected with the estimated depth-of-interaction. The method further includes modeling dispersion at different depths of interaction within the scintillator crystal, providing a reflector layer to delay back-reflected photons, providing two respective readouts for the same gamma ray event from two respective pixels optically coupled by a backside reflector or modified crystal configuration, calculating a time difference of the photon arrival at the two pixels, and estimating the depth-of-interaction by applying a statistical weighting.

First claim

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The invention claimed is: 1. A method for determining depth-of-interaction correction in a positron emission tomography (PET) system, the method comprising: modifying a scintillator crystal and readout electronic configuration to maximize a time delay of propagation of scintillation photons within a scintillator crystal of the PET system and thereby to improve a depth-dependent arrival profile of scintillation photons in at least one of a single crystal and optically-coupled multiple crystals; creating a scintillation photon dispersion model of a gamma ray interaction event within the scintillator crystal of the PET system; measuring a photon arrival profile of the gamma ray event in the scintillator crystal; deriving an estimated depth-of-interaction; and deriving a time of the gamma ray event based on a time stamp corrected with the estimated depth-of-interaction, the time stamp based on characterizing scintillation photons spreading in the first 0.1-0.5 ns and provided by a timing validation circuit. 2. The method of claim 1 , the modifying step including adding a reflector layer at a top of the crystal, the reflector layer delaying back-reflected photons for the single crystal, or optically coupling the multiple crystals. 3. The method of claim 1 , including the photon dispersion model including modeling dispersion at different depths of interaction within the scintillator crystal, wherein the model is based on at least one of experimental measurements and simulation results of response functions. 4. The method of claim 3 , including obtaining the experimental measurements by scanning along a length of the scintillator crystal with one of a radioactive source and an ultra-fast light source. 5. The method of claim 3 , including creating detector response function by simulating at least one of scintillation photon detection behavior for photon generation and propagation, detector efficiency, and timing jitter of a photosensor. 6. The method of claim 1 , including determining the arrival profile of scintillation photons within 0.1-0.5 nanoseconds of an individual gamma ray event. 7. The method of claim 1 , including providing a readout from two pixels that are optically coupled by a back side reflector or a modified crystal configuration. 8. The method of claim 7 , including: calculating a time difference of the scintillation photon arrival at the two pixels; and estimating the depth-of-interaction by applying a statistical weighting based on the scintillation photon dispersion model. 9. The method of claim 1 , including providing two respective readouts for the same gamma ray event from two respective pixels that are optically coupled by a back side reflector or a modified crystal configuration. 10. The method of claim 1 , including improving at least one of a timing resolution and a spatial resolution of the PET system with the depth-of-interaction correction. 11. A non-transitory computer-readable medium having stored thereon instructions which when executed by a processor of a positron emission tomography (PET) system cause the processor to perform a method of determining depth-of-interaction correction in the PET system, the method comprising: modifying a scintillator crystal and readout electronic configuration to maximize a time delay of propagation of scintillation photons within a scintillator crystal of the PET system and thereby to improve a depth-dependent arrival profile of scintillation photons in at least one of a single crystal and optically-coupled multiple crystals; creating a scintillation photon dispersion model of a gamma ray interaction event within the scintillator crystal of the PET system; measuring a photon arrival profile of the gamma ray event in the scintillator crystal; deriving an estimated depth-of-interaction; and deriving a time of the gamma ray event based on a time stamp corrected with the estimated depth-of-interaction, the time stamp based on characterizing scintillation photons spreading in the first 0.1-0.5 ns and provided by a timing validation circuit. 12. The non-transitory computer-readable medium of claim 11 , including instructions to cause the processor to perform the photon dispersion model by including modeling dispersion at different depths of interaction within the scintillator crystal. 13. The non-transitory computer-readable medium of claim 11 , including instructions to cause the processor to base the photon dispersion model on at least one of experimental measurements and simulation results of response functions. 14. The non-transitory computer-readable medium of claim 13 , including instructions to cause the processor to obtain the experimental results by acquiring data from scanning along a length of the scintillator crystal with one of a radioactive source and an ultra-fast light source. 15. The non-transitory computer-readable medium of claim 11 , including instructions to cause the processor to determine the arrival dispersion of scintillation photons arriving within 0.1-0.5 nanoseconds of the individual gamma ray event. 16. The non-transitory computer-readable medium of claim 11 , including instructions to cause the processor to perform the measuring step with a readout from two pixels that are optically coupled by a back side reflector or modified crystal configuration. 17. The non-transitory computer-readable medium of claim 16 , including instructions to cause the processor to perform the measuring step with two respective readouts for the same gamma ray event from two respective pixels that are optically coupled by a back side reflector or modified crystal configuration. 18. The non-transitory computer-readable medium of claim 16 , including instructions to cause the processor to: calculate a time difference of the photon arrival at the two pixels; and estimate the depth-of-interaction by applying a statistical weighting based on the photon dispersion model. 19. The non-transitory computer-readable medium of claim 11 , including instructions to cause the processor to correct parallax error and improve spatial resolution in an image reconstruction of the PET system using the depth-of-interaction correction.

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Classifications

  • G01T1/2985Primary

    In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis); (using external radiation sources A61B6/02) · CPC title

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What does patent US10261201B2 cover?
A method for determining depth-of-interaction correction in a PET system. The method includes modifying crystal and readout configuration to improve depth-dependent arrival profile of scintillation photons, creating a photon dispersion model within a scintillator crystal, measuring photon arrival profile of individual gamma ray event, deriving an estimated depth-of-interaction, and deriving a g…
Who is the assignee on this patent?
Gen Electric
What technology area does this patent fall under?
Primary CPC classification G01T1/2985. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 16 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).