In-situ identification and control of microstructures produced by phase transformation of a material

Patent metadata

Field	Value
Publication number	US-10254231-B2
Application number	US-201715590780-A
Country	US
Kind code	B2
Filing date	May 9, 2017
Priority date	Jun 14, 2010
Publication date	Apr 9, 2019
Grant date	Apr 9, 2019

Abstract

A microstructure detector and in-situ method for real-time determination of the microstructure of a material undergoing alloying or other phase transformation. The method carried out by the detector includes the steps of: (a) detecting light emitted from a plasma plume created during phase transformation of a material; (b) determining at least some of the spectral content of the detected light; and (c) determining an expected microstructure of the transformed material from the determined spectral content. Closed loop control of the phase transformation process can be carried out using feedback from the detector to achieve a desired microstructure.

First claim

The invention claimed is:

1. A method of controlling the phase transformation of a material, comprising the steps of:
(a) initiating a phase transformation of a material;
(b) detecting light emitted from a plasma plume created during the phase transformation;
(c) determining at least some of the spectral content of the detected light; and
(d) producing a desired microstructure as a crystal structure from the phase transformation by controlling one or more process parameters based on the determined spectral content.

2. The method of claim 1 , wherein step (a) further comprises carrying out laser cladding of a material onto a substrate.

3. The method of claim 1 , wherein step (a) further comprises carrying out laser alloying of a metal material from at least two different metals.

4. The method of claim 1 , wherein step (d) further comprises determining one or more spectral parameters from the determined spectral content, comparing the one or more spectral parameters to one or more desired parameter values, and adjusting the one or more process parameters based on the comparison.

5. The method of claim 4 , wherein the one or more spectral parameters include one or more of the following: electron temperature, electron density, and spectral line intensities.

6. The method of claim 1 , wherein step (c) further comprises determining electron density from the determined spectral content and wherein step (d) further comprises producing the desired microstructure from the phase transformation by controlling the one or more process parameters based at least in part on the electron density.

7. The method of claim 6 , wherein the electron density is determined based on line broadening of one or more spectral lines contained in the determined spectral content.

8. The method of claim 7 , wherein the electron density is determined based at least in part on Stark broadening of the one or more spectral lines.

9. The method of claim 1 , further comprising determining the microstructure based on the determined spectral content.

10. A method of controlling the phase transformation of a material, comprising the steps of:
(a) initiating a phase transformation of a material;
(b) detecting light emitted from a plasma plume created during the phase transformation;
(c) determining at least some of the spectral content of the detected light;
(d) determining one or more spectral parameters from the determined spectral content;
(e) comparing the one or more spectral parameters to one or more desired parameter values; and
(f) forming the material into a crystal structure by controlling one or more process parameters of the phase transformation based on the comparison.

11. The method of claim 10 , wherein the phase transformation of the material comprises alloying of at least two different metals.

12. The method of claim 10 , further comprising carrying out multiple iterations of steps (b) through (e) using a controller during the phase transformation, thereby providing closed-loop feedback to the controller during the phase transformation.

13. A method of controlling the phase transformation of a material, comprising the steps of:
(a) initiating alloying of at least two metals that together form a microstructure, wherein the alloying comprises creating a phase transformation of the materials by injecting energy into the materials;
(b) detecting light emitted from a plasma plume created during the alloying;
(c) determining at least some of the spectral content of the detected light;
(d) determining one or more spectral parameters from the determined spectral content, wherein the spectral parameters comprise any one or more of the following: electron temperature, electron density, and spectral line intensities;
(e) comparing the one or more spectral parameters to one or more desired parameter values; and
(f) forming the microstructure into a desired crystal structure using a phase transformation controller to control one or more process parameters of the phase transformation via closed-loop feedback that is provided using steps (b) through (e).

14. The method of claim 10 , wherein the one or more spectral parameters include one or more of the following: electron temperature, electron density, and spectral line intensities.

15. The method of claim 14 , wherein the electron density is determined based on line broadening of one or more spectral lines contained in the determined spectral content.

16. The method of claim 10 , further comprising determining the crystal structure based on the determined spectral content.

17. The method of claim 13 , wherein step (d) comprises determining the electron density.

18. The method of claim 17 , wherein the electron density is determined based on line broadening of one or more spectral lines contained in the determined spectral content.

19. The method of claim 13 , further comprising determining the crystal structure based on the determined spectral content.

Assignees

• Univ Michigan Regents

Inventors

• Mazumder Jyotirmoy
• Song Lijun
• Wang Cunshan

Classifications

• G01N21/718 Primary

  Laser microanalysis, i.e. with formation of sample plasma · CPC title