High temperature heating system

Patent metadata

Field	Value
Publication number	US-10241017-B2
Application number	US-201214361094-A
Country	US
Kind code	B2
Filing date	Nov 28, 2012
Priority date	Nov 28, 2011
Publication date	Mar 26, 2019
Grant date	Mar 26, 2019

Abstract

A sample gripping and heating assembly includes an assembly housing and first and second heating grips coupled with the assembly housing. The first and second heating grips each include a gripping surface, and the gripping surfaces of the first and second heating grips are opposed to each other. Each of the first and second heating grips further includes a heating element adjacent to the gripping surface. Optionally, the sample gripping and heating assembly is included in a heating system including a probe heater having a probe heating element for heating of a probe. The heating system is included with a testing assembly having a stage coupled with the sample gripping and heating assembly, and a transducer assembly coupled with the probe heater.

First claim

The claimed invention is:

1. A testing assembly for use in material testing, the testing assembly comprising:
a heating system configured to heat a sample material and a probe, the heating system including:
a gripping and heating assembly having first and second heating grips, each of the first and second heating grips including:
a gripping surface, and
a heating element in the respective heating grip, the heating element adjacent to the gripping surface, the heating element configured to heat the sample material retained between the gripping surfaces;

a probe heater having a probe heating element, the probe heater coupled with a probe configured for testing of the sample material retained between the gripping surfaces, the probe heater configured to heat the probe;
a stage coupled with the gripping and heating assembly; and
a transducer assembly coupled with the probe, the transducer assembly and the probe coupled with the stage.

2. The testing assembly of claim 1 , further comprising a stage adaptor having a gripping assembly socket, and wherein the gripping and heating assembly is received within the gripping assembly socket, and the stage adaptor is coupled with the stage.

3. The testing assembly of claim 2 , wherein the stage includes a multiple degree of freedom stage having at least one of rotation or tilt stages, and the stage adaptor is coupled with one of the rotation or tilt stages.

4. The testing assembly of claim 1 , wherein the gripping and heating assembly includes a grip actuator coupled between the first and second heating grips, and the grip actuator is configured to move one or more of the gripping surfaces relative to the other gripping surface.

5. The testing assembly of claim 1 , wherein the gripping and heating assembly includes a temperature sensing element adjacent to the gripping surface of each of the first and second heating grips.

6. The testing assembly of claim 1 , wherein the gripping surfaces of the first and second heating grips are configured to reach temperatures of more than 400 degrees Celsius.

7. A method of thereto-mechanical testing of a sample material with a testing assembly comprising:
retaining a sample material between gripping surfaces of first and second heating grips of a gripping and heating assembly including gripping the sample material between the gripping surfaces of the first and second heating grips;
heating the sample material with heating elements at the gripping surfaces of each of the first and second heating grips, the heating elements coupled with the first and second heating grips, respectively, wherein heating the sample material with the heating elements includes conductively heating the sample material from the heating elements through the gripping surfaces; and
testing the heated sample material with a probe.

8. The method of claim 7 , wherein gripping the sample material includes deflecting first and second opposed arms of an assembly housing, and the first heating grip is coupled with the first opposed arm and the second heating grip is coupled with the second opposed arm.

9. The method of claim 7 , wherein heating the sample material includes controlling temperatures of the heating elements of each of the first and second heating grips, wherein the temperatures of the heating elements are substantially the same.

10. The method of claim 7 , wherein heating the sample material includes throttling heat transfer from one of the first or second heating grip to the other of the second or first heating grip.

11. The method of claim 7 comprising:
heating the probe; and
controlling heating of the sample material and the probe to substantially the same temperature before testing the heated sample material.

12. The method of claim 7 , wherein testing includes one or more of indentation testing, compression testing, tensile testing or scratch testing of the heated sample material with the probe.

13. The method of claim 12 , wherein the probe includes a gripping probe, and tensile testing of the sample material includes gripping the sample material with the gripping probe.

14. The method of claim 7 , wherein testing includes mechanical testing of the sample material with the probe.

15. The method of claim 7 , wherein testing the heated sample material includes electrically testing the sample material with two or more electrical contacts in electrical communication with the sample material.

Assignees

• Bruker Nano Inc

Inventors

• Keranen Lucas Paul
• Asif Syed Amanulla Syed
• Major Ryan
• Oh Yunje

Classifications

• G01N3/08

  by applying steady tensile or compressive forces (G01N3/28 takes precedence) · CPC title

• G01N3/54 Primary

  Performing tests at high or low temperatures · CPC title

• H05B1/023

  Industrial applications · CPC title

• G01N2203/0078

  using indentation · CPC title

• G01N2203/0482

  comprising sensing means · CPC title