Configuration independent gas delivery system
US-10128087-B2 · Nov 13, 2018 · US
US10215317B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10215317-B2 |
| Application number | US-201615087889-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 31, 2016 |
| Priority date | Jan 15, 2016 |
| Publication date | Feb 26, 2019 |
| Grant date | Feb 26, 2019 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Methods and apparatuses for additively manufactured tubular passages, additively manufactured manifolds, and additively manufactured heaters are provided.
Opening claim text (preview).
What is claimed is: 1. An apparatus for use with a semiconductor processing chamber, the apparatus comprising: a manifold constructed by additive manufacturing and including: a mixing chamber, and portions of a plurality of flow paths, each flow path including: a first fluid flow component interface including a first fluid flow component interface inlet and a first fluid flow component interface outlet, a first tubular passage fluidically connecting the first mixing chamber with the first fluid flow component interface outlet of that flow path, and a second tubular passage fluidically connected to the first fluid flow component interface inlet of that flow path, wherein: the first fluid flow component interface, the first tubular passage, and the second tubular passage of each flow path are a unitary body, one or more of the first tubular passage and the second tubular passage for at least one of the flow paths follows a respective pathway and has an exterior surface that includes a first runway, the pathway is a three-dimensional path, and for each runway: that first runway includes a surface defined by a respective first profile that is swept along the respective pathway, the respective first profile is in a plane perpendicular to the respective pathway, and the respective first profile is substantially linear. 2. The apparatus of claim 1 , wherein the first profile is slightly curved so as to make the first runway concave. 3. The apparatus of claim 1 , wherein the first profile includes features that define opposing sidewalls along the length of the runway to form a trough. 4. The apparatus of claim 1 , wherein: the exterior surface of the at least one tubular passage includes a second runway, the second runway includes a surface defined by a second profile that is swept along the pathway, the second profile is in a plane perpendicular to the pathway, and the second profile is substantially linear. 5. The apparatus of claim 4 , wherein the second profile is at an oblique angle to the first profile when viewed normal to the plane perpendicular to the pathway. 6. The apparatus of claim 4 , wherein the second profile is substantially parallel to the first profile when viewed normal to the plane perpendicular to the pathway. 7. The apparatus of claim 4 , wherein the second profile is perpendicular to the first profile when viewed normal to the plane perpendicular to the pathway. 8. The apparatus of claim 1 , wherein the at least one tubular passage further includes a first dielectric layer that is adjacent to the first runway and extends along the first runway for substantially the entire length of the first runway. 9. The apparatus of claim 8 , wherein the at least one tubular passage further includes a resistive heating element layer that is adjacent to the first dielectric layer and extends along the first dielectric layer for substantially the entire length of the first dielectric layer. 10. The apparatus of claim 9 , wherein: the at least one tubular passage further includes a second dielectric layer that is adjacent to the resistive heating element layer and extends along the first runway for substantially the entire length of the first runway, and the resistive heating element layer is interposed between the first dielectric layer and the second dielectric layer. 11. The apparatus of claim 9 , wherein: the resistive heating element layer includes a first heating zone that is configured to heat the tubular passage to a first temperature, and the resistive heating element layer includes a second heating zone that is configured to heat the tubular passage to a second temperature that is different than the first temperature. 12. The apparatus of claim 1 , wherein: the at least one flow path further comprises a heating element, and the heating element is positioned on the first runway of one or more of the first tubular passage and the second tubular passage, and the heating element extends along the respective pathway of one or more of the first tubular passage and the second tubular passage. 13. The apparatus of claim 12 , wherein: the heating element is positioned on the first runway of both the first tubular passage and the second tubular passage, and the heating element extends along the respective pathway of both the first tubular passage and the second tubular passage. 14. The apparatus of claim 12 , wherein: each flow path of the plurality of flow paths follows a respective pathway, and has an exterior surface that includes a first runway, each flow path of the plurality of flow paths includes a heating element, for each flow path, the heating element is positioned on the first runway of one or more of the first tubular passage and the second tubular passage of that flow path, and for each flow path, the heating element extends along the respective pathway of one or more of the first tubular passage and the second tubular passage of that flow path. 15. The apparatus of claim 14 , wherein: for each flow path, the heating element is positioned on the first runway of both the first tubular passage and the second tubular passage of that flow path, and for each flow path, the heating element extends along the respective pathway of both the first tubular passage and the second tubular passage of that flow path. 16. An apparatus for use with a semiconductor processing chamber, the apparatus comprising: a manifold constructed by additive manufacturing and including: a mixing chamber, a resistive heating element layer, and portions of a plurality of flow paths, each flow path including: a first fluid flow component interface including a first fluid flow component interface inlet and a first fluid flow component interface outlet, a first tubular passage fluidically connecting the first mixing chamber with the first fluid flow component interface outlet of that flow path, and a second tubular passage fluidically connected to the first fluid flow component interface inlet of that flow path, wherein: the first fluid flow component interface, the first tubular passage, and the second tubular passage of each flow path are a unitary body, one or more of the first tubular passage and the second tubular passage for at least one of the flow paths follows a respective pathway, and for the at least one flow path that follows a respective pathway, the resistive heating element layer is positioned on one or more of the first tubular passage and the second tubular passage, and extends along the respective pathway of one or more of the first tubular passage and the second tubular passage. 17. The apparatus of claim 16 , wherein for the at least one flow path that follows the respective pathway: the one or more of the first tubular passage and the second tubular passage on which the resistive heating element is positioned further includes a first dielectric layer, the first dielectric layer is positioned on and extends along the one or more of the first tubular passage and the second tubular passage on which the resistive heating element layer is positioned, and the first dielectric layer is interposed between the resistive heating element layer and the one or more of the first tubular passage and the second tubular passage on which the resistive heating element layer is positioned. 18. The apparatus of claim 17 , wherein for the at least one flow path that follows the respective pathway: the one or more of the first tubular passage and the second tubular passage on which the resistive heating
characterised by the construction of the processing chambers, e.g. modular processing chambers · CPC title
Apparatus for fluid treatment (H10P72/0441, H10P72/0448 take precedence) · CPC title
With flow control · CPC title
Gas control, e.g. control of the gas flow · CPC title
Gas supply means · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.