Failure diagnosis method and system of temperature sensor of switch device

US10209145B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10209145-B2
Application numberUS-201615378475-A
CountryUS
Kind codeB2
Filing dateDec 14, 2016
Priority dateSep 1, 2016
Publication dateFeb 19, 2019
Grant dateFeb 19, 2019

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Abstract

Official abstract text for this publication.

A failure diagnosis method of a temperature sensor of a switch device is provided. The method includes setting a sampling period using a temperature detected by the temperature sensor of the switch device and a temperature of cooling water for cooling the switch device. A temperature sensing value detected by the temperature sensor is then compared with a temperature reference value stored in a memory in the sampling period to determine whether failure occurs in the temperature sensor.

First claim

Opening claim text (preview).

What is claimed is: 1. A failure diagnosis method of a temperature sensor of a switch device, comprising: setting, by a controller, a sampling period using a temperature detected by the temperature sensor of the switch device and a temperature of cooling water for cooling the switch device; and comparing, by the controller, a temperature sensing value detected by the temperature sensor and a temperature reference value stored in a memory of the controller in the sampling period and determining whether a failure occurs in the temperature sensor, wherein the controller is configured to determine the failure occurs in the temperature sensor when a difference between the temperature sensing value and the temperature reference value after a reference time elapses in the sampling period is equal to or greater than an error range. 2. The method according to claim 1 , wherein the setting of the sampling period includes: setting, by the controller, as the sampling period, a time period in which the temperature detected by the temperature sensor is increased while the temperature of the cooling water remains constant as time elapses. 3. The method according to claim 1 , wherein: the switch device is configured to adjust current required to drive a motor; and the setting of the sampling period includes setting, as the sampling period, a time period in which the temperature detected by the temperature sensor is increased while the temperature of the cooling water remains constant as time elapses during operation of the switch device to switch the motor to a driving state from a stop state. 4. The method according to claim 3 , wherein: the controller is configured to operate the switch device to output a greater amount of current than required current when the motor is switched to the driving state from the stop state; and the sampling period is started from a time point at which the switch device outputs the required current. 5. The method according to claim 1 , wherein the determination of whether the failure occurs includes: comparing, by the controller, the temperature sensing value and the temperature reference value at a preset reference time interval in the sampling period; and determining, by the controller, whether the failure occurs in the temperature sensor. 6. The method according to claim 5 , wherein the temperature reference value is determined based on an amount of heat absorbed into the switch device and an amount of heat transferred to the cooling water. 7. The method according to claim 5 , wherein the temperature reference value is determined according to the following equation: T 1 ( t )=( T 1 (0)− T 2 (0)− c*m*R th )*exp(− t /( c*m*R th ))+ T 2 (0)+ c*m*R th wherein T 1 (t): temperature reference value after time t elapses in sampling period, T 1 (0): initial temperature sensing value in sampling period, T 2 (0): initial temperature of cooling water in sampling period, c: specific heat of switch device, m: mass of switch device, and R th : synthesized thermal resistance. 8. The method according to claim 5 , wherein the controller is configured to determine the temperature sensor to be normal when the difference between the temperature sensing value and the temperature reference value after the reference time elapses in the sampling period is less than a preset error range and determine that failure occurs in the temperature sensor when the difference between the temperature sensing value and the temperature reference value after the reference time elapses is equal to or greater than the error range. 9. The method according to claim 8 , further comprising: storing, by the controller, in the memory, a time when failure occurs in the temperature sensor in the sampling period; and analyzing, by the controller, a cause of the failure of the temperature sensor as contact inferiority when the time stored in the memory is aperiodically distributed in the sampling period. 10. The method according to claim 8 , further comprising: storing, in the memory, the temperature sensing value when failure occurs in the temperature sensor in the sampling period; and analyzing, by the controller, a cause of the failure of the temperature sensor as short circuit when temperature sensing values stored in the memory are the same. 11. A failure diagnosis system of a temperature sensor of a switch device, comprising: the temperature sensor configured to detect a temperature of the switch device; a cooling flow channel and cooling water that cool the switch device; a memory configured to store a temperature reference value; and a controller configured to set a sampling period using the temperature detected by the temperature sensor and the temperature of the cooling water, compare the temperature reference value and the temperature sensing value detected by the temperature sensor in the sampling period to determine whether a failure occurs in the temperature sensor, wherein the controller is configured to determine the failure occurs in the temperature sensor when a difference between the temperature sensing value and the temperature reference value after a reference time elapses in the sampling period is equal to or greater than an error range. 12. The system according to claim 11 , wherein the controller is configured to set a time period in which the temperature detected by the temperature sensor is increased while the temperature of the cooling water remains constant, as the sampling period. 13. The system according to claim 11 , wherein the temperature reference value is determined according to the following equation: T 1 ( t )=( T 1 (0)− T 2 (0)− c*m*R th )*exp(− t /( c*m*R t h ))+ T 2 (0)+ c*m*R th wherein T 1 (t): temperature reference value after time t elapses in sampling period, T 1 (0): initial temperature sensing value in sampling period, T 2 (0): initial temperature of cooling water in sampling period, c: specific heat of switch device, m: mass of switch device, and R th : synthesized thermal resistance.

Assignees

Inventors

Classifications

  • Testing of connections, e.g. of plugs or non-disconnectable joints (testing for incorrect line connections G01R31/55) · CPC title

  • the fault being an overvoltage · CPC title

  • Application of thermometers in motors, e.g. of a vehicle · CPC title

  • Calibrated temperature sources, temperature standards therefor (arrangements with respect to the cold junction of thermo-electric elements G01K7/12) · CPC title

  • G01K15/007Primary

    Testing · CPC title

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What does patent US10209145B2 cover?
A failure diagnosis method of a temperature sensor of a switch device is provided. The method includes setting a sampling period using a temperature detected by the temperature sensor of the switch device and a temperature of cooling water for cooling the switch device. A temperature sensing value detected by the temperature sensor is then compared with a temperature reference value stored in a…
Who is the assignee on this patent?
Hyundai Motor Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01K15/007. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 19 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).