Impulse sampler architecture and active clock cancellation architecture

Patent metadata

Field	Value
Publication number	US-10204697-B2
Application number	US-201715442638-A
Country	US
Kind code	B2
Filing date	Feb 25, 2017
Priority date	Feb 25, 2016
Publication date	Feb 12, 2019
Grant date	Feb 12, 2019

Abstract

A novel nonlinear impulse sampler is presented that provides a clock sharpening circuit, sampling stage, and post-sampling block. The clock sharpening circuit sharpens the incoming clock while acting as a buffer, and the sharpened clock is fed to the input of the sampling stage. The impulse sampling stage has two main transistors, where one transistor generates the impulse and the other transistor samples the input signal. Post-sampling block processes the sampled signal and acts as a sample and hold circuit. The architecture uses an ultrafast transmission-line based inductive peaking technique to turn on a high-speed sampling bipolar transistor for a few picoseconds. It is shown that the sampler can detect impulses as short as 100 psec or less.

First claim

What is claimed is:

1. A method for sampling an input signal, the method comprising:
providing a clock signal to a coupling circuit;
receiving an input signal with a sampling transistor, where the sampling transistor provides
a first base receiving the input signal, and
a first emitter coupled to receive the clock signal from the coupling circuit; and

receiving the clock signal at an impulse transistor of the coupling circuit, wherein the impulse transistor provides
a second base receiving the clock signal,
a second collector connected to a voltage, and
a second emitter of the impulse transistor coupled to ground.

2. The method of claim 1 , wherein an inductor or a transmission line is used to couple the second emitter of the impulse transistor to ground.

3. The method of claim 1 , wherein after the clock signal enters a high state, a second emitter voltage of the first emitter approaches a steady state of 0V, and
when the clock signal subsequently falls to a low state, the second emitter voltage provides a negative impulse.

4. The method of claim 3 , wherein the negative impulse from the second emitter causes the sampling transistor to turn on dining the negative impulse and output a sampled signal.

5. The method of claim 4 , wherein the sampled signal is provided to a voltage follower or buffer to decouple the sampled signal from a following stage.

6. The method of claim 4 further comprising:
receiving the sampled signal at a post-sampling block;
inverting the sampled signal to create an inverted signal; and
generating an output signal with a sample and hold circuit, wherein the output signal rising to a high hold state when the inverted signal rises, and the output signal is held at the high hold state for a period of time sufficient to digitize.

7. The method of claim 6 , wherein the post-sampling block provides a buffer acting as a voltage shifter.

8. The method of claim 6 further comprising the step of buffering the sampled signal received by the post-sampling block prior to the inverting step.

9. The method of claim 3 , wherein the negative impulse has a duration of 100 picoseconds or less.

10. The method of claim 1 , wherein the input signal provided to the sampling transistor is biased to cause the sampling transistor to be off when a first emitter voltage of the first emitter is 0V.

11. The method of claim 1 , wherein a fall time of the clock signal is 8 psec or shorter.

12. An impulse sampler comprising:
a coupling circuit receiving a clock signal; and
a sampling transistor receiving an input signal, wherein the sampling transistor comprises
a first base of the sampling transistor receiving the input signal, and
a first emitter of the sampling transistor coupled to receive the clock signal from the coupling circuit; and

an impulse transistor of the coupling circuit, wherein the impulse transistor comprises
a second base of the impulse transistor receiving the clock signal,
a second collector of the impulse transistor connected to a voltage, and
a second emitter of the impulse transistor coupled to ground.

13. The impulse sampler of claim 12 , further comprising an inductor or a transmission line coupling the second emitter of the impulse transistor to ground.

14. The impulse sampler of claim 12 , wherein a second emitter voltage of the second emitter approaches a steady state of 0V after the clock signal enters a high state, and
when the clock signal subsequently falls to a low state, the second emitter voltage provides a negative impulse.

15. The impulse sampler of claim 14 , wherein the negative impulse from the second emitter causes the sampling transistor to turn on during the negative impulse and output a sampled signal.

16. The impulse sampler of claim 15 further comprising:
a post-sampling block receiving the sampled signal;
an amplifier for inverting the sampled signal to create an inverted signal, and
a sample and hold circuit receiving the inverted signal and generating an output signal, wherein the output signal rises to a high hold state when the inverted signal rises, and the output signal is held at the high hold state for a period of time sufficient to digitize.

17. The impulse sampler of claim 16 , wherein the post-sampling block provides a buffer acting as a voltage shifter.

18. The impulse sampler of claim 16 further comprising a buffer for receiving the sampled signal prior to the amplifier.

19. The impulse sampler of claim 14 , wherein the sampled signal is provided to a voltage follower to buffer or decouple the impulse sampler from a following stage.

20. The method of claim 14 , wherein the negative impulse has a duration of 100 picoseconds or less.

21. The impulse sampler of claim 12 , wherein the input signal provided to the sampling transistor is biased to cause the sampling transistor to be off when a first emitter voltage of the first emitter is 0V.

22. The method of claim 12 , wherein a fall time of the clock signal is 8 psec or shorter.

Assignees

• Aggrawal Himanshu
• Babakhani Aydin
• Univ Rice William M

Inventors

• Aggrawal Himanshu
• Babakhani Aydin

Classifications

• G01R25/00

  Arrangements for measuring phase angle between a voltage and a current or between voltages or currents · CPC title

• G11C27/026 Primary

  associated with an amplifier (G11C27/028 takes precedence) · CPC title

• G01R19/2509

  Details concerning sampling, digitizing or waveform capturing · CPC title