Transducer reliability testing

Patent metadata

Field	Value
Publication number	US-10203366-B2
Application number	US-201615199105-A
Country	US
Kind code	B2
Filing date	Jun 30, 2016
Priority date	Jun 30, 2016
Publication date	Feb 12, 2019
Grant date	Feb 12, 2019

Abstract

A transducer reliability testing and VCSEL failure prediction method are provided. The method includes applying a testing temperature and a constant current to a VCSEL for a testing time. The method monitors a forward voltage of the VCSEL and determines if a first change in forward voltage is above a first predetermined threshold over the testing time and if a second change in forward voltage is above a second predetermined threshold over a portion of the testing time. The method determines failure of the VCSEL if either of these predetermined thresholds are exceeded. The method determines passage of the VCSEL if the first change in the forward voltage and the second change in the forward voltage are both below the first predetermined threshold and the second predetermined threshold, respectively.

First claim

The invention claimed is:

1. A method for testing a vertical cavity surface emitting laser (VCSEL) for emitting light, comprising:
applying, via a driver, a testing temperature to a VCSEL for a testing time;
applying, via the driver, a constant current to the VCSEL for the testing time;
monitoring, via a controller, a forward voltage for the VCSEL;
determining, via the controller, if a first change in the forward voltage is above a first predetermined threshold over the testing time, failure of the VCSEL;
determining, via the controller, if a second change in the forward voltage is above a second predetermined threshold over a portion of the testing time, failure of the VCSEL; and
determining, via the controller, if the first change in the forward voltage over the testing time is below the first predetermined threshold and if the second change in the forward voltage over the portion of the testing time is below the second predetermined threshold, passage of the VCSEL.

2. The method according to claim 1 , wherein the testing temperature is about 150° C.

3. The method according to claim 2 , wherein the testing time is about 464 hours.

4. The method according to claim 3 , wherein the first predetermined threshold is 10 mV.

5. The method according to claim 3 , wherein the second predetermined threshold is 20 mV.

6. The method according to claim 3 , wherein the portion of the testing time is a final 336 hours of the testing time.

7. The method according to claim 3 , wherein the change in forward voltage is determined at 8 hours, 128 hours, and 464 hours of the testing time.

8. The method according to claim 1 , wherein the testing temperature is about 25° C.

9. The method according to claim 1 , further comprising subjecting the VCSEL to a burn-in period, wherein the burn-in period is a 4-hour time period prior to the testing time in which the VCSEL is subjected to a temperature of about 150° C.

10. The method according to claim 1 , wherein upon determining failure of the VCSEL, one or more operating parameters of the VCSEL are adjusted.

11. The method according to claim 1 , wherein the forward voltage for the VCSEL is measured at a driver of the VCSEL.

12. A non-transitory computer-readable medium having computer program instructions stored thereon, the computer program instructions being configured to:
monitor an operating temperature of a vertical cavity surface emitting laser (VCSEL);
monitor an operating current of the VCSEL;
monitor a forward voltage for the VCSEL;
determine, if a change in the forward voltage is above a predetermined threshold over a period of time, failure of the VCSEL;
determine, if the change in the forward voltage over the period of time is below the predetermined threshold, passage of the VCSEL; and
adjust, in an instance in which failure of the VCSEL is determined, an operating parameter of the VCSEL.

13. The computer-readable medium according to claim 12 , wherein the computer program instructions are embodied by firmware installed on a micro-controller or a driver.

14. The computer-readable medium according to claim 12 , wherein the operating temperature is about 25° C.

15. The computer-readable medium according to claim 14 , wherein the predetermined threshold is 20 mV.

16. The computer-readable medium according to claim 14 , wherein the predetermined threshold is 10 mV.

17. The computer-readable medium according to claim 12 , further comprising subjecting the VCSEL to a burn-in period, wherein the burn-in period is a 4-hour time period prior to installation in which the VCSEL is subjected to a temperature of about 150° C.

18. The computer-readable medium according to claim 12 , wherein the operating parameter that is adjusted comprises the operating temperature of the VCSEL.

19. The computer-readable medium according to claim 12 , wherein the operating parameter that is adjusted comprises the operating current of the VCSEL.

20. The computer-readable medium according to claim 12 , wherein the computer program instructions are further configured to generate an alarm condition in an instance in which failure of the VCSEL is determined.

Assignees

• Mellanox Technologies Ltd

Inventors

• Burlak Alex
• Bassat Lion
• Kalifa Itshak
• Margalit Kfir
• Ghandour Morees
• Webman Alon
• Mentovich Elad
• Rockman Sylvie
• Landman Evelyn

Classifications

• G01R31/2874

  related to temperature · CPC title

• G01R31/2635 Primary

  Testing light-emitting diodes, laser diodes or photodiodes · CPC title

• H01S5/183

  having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] · CPC title

• H01S5/0014

  Measuring characteristics or properties thereof (measuring techniques per se G01J, G01K, G01N, G01R) · CPC title

• H01S5/0021

  Degradation or life time measurements · CPC title