Unique identification value for a sensor

Patent metadata

Field	Value
Publication number	US-10200643-B2
Application number	US-201615270232-A
Country	US
Kind code	B2
Filing date	Sep 20, 2016
Priority date	Sep 9, 2016
Publication date	Feb 5, 2019
Grant date	Feb 5, 2019

Abstract

An apparatus includes an interface and a processor. The interface may be configured to receive a plurality of sensed values from a plurality of sensing elements in a sensor. The processor may be connected to the interface and configured to (i) generate a list of a plurality of bad values among said sensed values and (ii) calculate a unique identification value of the sensor based on the bad values. Each of the bad values generally indicates an improper performance of a corresponding one of the sensing elements.

First claim

The invention claimed is:

1. An apparatus comprising:
an interface configured to receive a plurality of sensed values from a plurality of sensing elements in a sensor under a plurality of conditions; and
a processor connected to said interface and configured to (i) generate a plurality of patterns in response to said sensed values, wherein each of said patterns includes a plurality of positions of a plurality of bad values among said sensed values in a corresponding one of said conditions, (ii) generate a list of a plurality of consistently bad values among said bad values in said patterns, (iii) compare said positions associated with said consistently bad values in said list to a plurality of known positions stored in a memory and (iv) indicate that said sensor has been replaced where said positions associated with said consistently bad values in said list do not correlate to said known positions, wherein each of said bad values indicates an improper performance of a corresponding one of said sensing elements.

2. The apparatus according to claim 1 , wherein (i) said sensor comprises an electro-optical sensor and (ii) each of said sensing elements comprises a pixel.

3. The apparatus according to claim 1 , wherein said processor is further configured to calculate a unique identification value of said sensor based on said positions in said sensor of said sensing elements associated with said consistently bad values in said list.

4. The apparatus according to claim 3 , wherein said unique identification value is calculated by performing a hash operation on said positions associated with said consistently bad values in said list.

5. The apparatus according to claim 4 , wherein said processor is further configured to (i) generate an additional identification value by performing a different hash operation on said positions associated with said consistently bad values in said list and (ii) merge said additional identification value into said unique identification value.

6. The apparatus according to claim 1 , wherein (i) said processor is further configured to calculate a plurality of distribution values based on said sensed values, (ii) said distribution values characterize an amplitude distribution of said sensed values and (iii) said patterns are generated based on said distribution values.

7. The apparatus according to claim 6 , wherein (i) said distribution values comprise a standard deviation value of said sensed values and an average value of said sensed valued and (ii) said bad values are greater than a multiple of said standard deviation away from said average value.

8. The apparatus according to claim 1 , wherein said processor is further configured to identify said consistently bad values as said bad values that appear in most or all of said patterns.

9. The apparatus according to claim 1 , wherein said interface, said processor and said sensor are part of a digital camera.

10. A method for determining that a sensor has been replaced, comprising the steps of:
receiving a plurality of sensed values from a plurality of sensing elements in said sensor under a plurality of conditions;
generating a plurality of patterns based on said sensed values using a processor, wherein (i) each of said patterns includes a plurality of positions of a plurality of bad values among said sensed values in a corresponding one of said conditions and (ii) each of said bad values indicates an improper performance of a corresponding one of said sensing elements;
generating a list of a plurality of consistently bad values among said bad values in said patterns;
comparing said positions associated with said consistently bad values in said list to a plurality of known positions stored in a memory; and
indicating that said sensor has been replaced where said positions associated with said consistently bad values in said list do not correlate to said known positions.

11. The method according to claim 10 , wherein (i) said sensor comprises an electro-optical sensor and (ii) each of said sensing elements comprises a pixel.

12. The method according to claim 10 , further comprising the step of:
calculating a unique identification value of said sensor based on said positions in said sensor of said sensing elements associated with said consistently bad values in said list.

13. The method according to claim 12 , wherein said unique identification value is calculated by performing a hash operation on said positions associated with said consistently bad values in said list.

14. The method according to claim 13 , further comprising the steps of:
generating an additional identification value by performing a different hash operation on said positions associated with said consistently bad values in said list; and
merging said additional identification value into said unique identification value.

15. The method according to claim 10 , further comprising the step of:
calculating a plurality of distribution values based on said sensed values, wherein (i) said distribution values characterize an amplitude distribution of said sensed values and (ii) said patterns are generated based on said distribution values.

16. The method according to claim 15 , wherein (i) said distribution values comprise a standard deviation value of said sensed values and an average value of said sensed values and (ii) said bad values are greater than a multiple of said standard deviation away from said average value.

17. The method according to claim 10 , further comprising the step of:
identifying said consistently bad values as said bad values that appear in most or all of said patterns.

18. The method according to claim 10 , wherein the steps are performed in a digital camera.

Assignees

• Ambarella Inc

Inventors

• Sun Luyi
• He Zhi

Classifications

• H04N25/68

  applied to defects · CPC title

• G06V10/993 Primary

  Evaluation of the quality of the acquired pattern · CPC title

• H04N25/683

  by defect estimation performed on the scene signal, e.g. real time or on the fly detection · CPC title

• H04N23/12

  with one sensor only · CPC title

• H04N25/76

  Addressed sensors, e.g. MOS or CMOS sensors · CPC title