Electronic measurement device and method for operating an electronic measurement device

Patent metadata

Field	Value
Publication number	US-10191098-B2
Application number	US-201514797476-A
Country	US
Kind code	B2
Filing date	Jul 13, 2015
Priority date	Jul 13, 2015
Publication date	Jan 29, 2019
Grant date	Jan 29, 2019

Abstract

The invention relates to an electronic measurement device and a method for operating the electronic measurement device. The electronic measurement device comprises a signal generating unit which is configured to generate a signal that is applied to an input node of a device under test. The electronic measurement device comprises a controlling unit which is configured to control the signal generating unit in that the generated signal is at least adjustable in its signal frequency. Furthermore, the electronic measurement device comprises at least a receiving unit, wherein the receiving unit retrieves a signal from an output node of the device under test in time domain.

First claim

What is claimed is:

1. An electronic measurement device, comprising:
a signal generation unit, which is configured to generate a signal that is applied to an input node of a device under test;
a controlling unit which is configured to control the signal generation unit in that the generated signal is at least adjustable in its signal frequency;
a sweeping unit, which obtains a predefined start frequency value, a predefined stop frequency value, and a predefined step-width value to adjust a signal frequency of the generated signal that is applied to the input node of the device under test; and
at least a receiving unit, wherein the receiving unit retrieves a signal from an output node of the device under test in time domain and has a broadband input bandwidth,
wherein a high impedance probe is applied to an input node of the receiving unit,
wherein the electronic measurement device is configured to perform a normalization procedure prior to a comparing step in order to avoid the influence of one or more internal errors of the electronic measuring device, and
wherein the normalization procedure comprises the following steps:
shorting of an appropriate signal probe that is connected to the receiving unit for retrieving the signal from the output node of the device under test;
stepwise adjusting a signal value of the generated signal;
measuring the retrieved signal with the shorted probe; and
storing a measured value for each adjusted signal value.

2. The electronic measurement device according to claim 1 , wherein the controlling unit adjusts the signal frequency in a stepwise manner, wherein a step width value is adjustable.

3. The electronic measurement device according to claim 1 , wherein the generated signal is a single-frequency-signal.

4. The electronic measurement device according to claim 1 , wherein the signal generation unit is an arbitrary waveform generator.

5. The electronic measurement device according to claim 1 , wherein the electronic measurement device comprises at least a second receiving unit, wherein the second receiving unit retrieves the generated signal from the input node of the device under test.

6. The electronic measurement device according to claim 1 , wherein the controlling unit analyzes the device under test behavior by comparing the generated signal and the retrieved signal.

7. The electronic measurement device according to claim 1 , wherein a high-impedance probe is applied to an input node of the receiving unit, wherein the impedance of the high-impedance probe is higher than the impedance of the output node of the device under test.

8. The electronic measurement device according to claim 1 , wherein the controlling unit comprises a correction unit that is configured to compensate an impedance mismatch between the receiving unit and the output node of the device under test.

9. The electronic measurement device according to claim 1 , wherein the controlling unit comprises a correction unit that is configured to compensate an impedance mismatch between the signal generating unit and the input node of the device under test.

10. The electronic measurement device according to claim 1 , wherein the controlling unit is configured to calculate a gain value and/or a phase value by comparing the generated signal and the retrieved signal for each generated adjustable signal value.

11. The electronic measurement device according to claim 1 , wherein the measurement device comprises a display unit to display the generated signal and/or the retrieved signal and/or any signal derived from the controlling unit.

12. The electronic measurement device according to claim 11 , wherein the display unit is configured to display at least a signal in a frequency domain.

13. The electronic measurement device according to claim 1 , wherein the device under test is an amplifier device or a passive element.

14. The electronic measurement device according to claim 1 , wherein the measurement device is a digital oscilloscope.

15. A method for operating an electronic measurement device, the method comprises the following steps:
applying a generated signal to an input node of a device under test, wherein the generated signal is generated by a signal generation unit of the measurement device and wherein the generated signal is at least adjustable in its signal frequency by a controlling unit of the electronic measurement device;
retrieving an output signal from an output node of the device under test at a receiving unit of the electronic measurement device, which has a broadband input bandwidth;
applying a high impedance probe to an input node of a receiving unit of the electronic measurement device;
comparing the retrieved signal with the generated signal by the controlling unit to obtain parameters of the device under test;
obtaining a predefined start frequency value, a predefined stop frequency value, and a predefined step-width value by a sweeping unit to adjust a signal frequency of the generated signal that is applied to the input node of the device under test;
normalizing prior to a comparing step in order to avoid the influence of one or more internal errors of the electronic measuring device; and
displaying results of the comparing step at a display unit of the electronic measurement device, and
wherein the normalizing comprises the following steps:
shorting of an appropriate signal probe that is connected to the receiving unit for retrieving the signal from an output node of the device under test;
stepwise adjusting a signal value of the generated signal;
measuring the retrieved signal with the shorted probe; and
storing a measured value for each adjusted signal value.

16. The method according to claim 15 , wherein the electronic measurement device comprises a second receiving unit for retrieving the generated signal from the input node of the device under test.

17. The method according to claim 15 , wherein prior to the comparing step, a measurement definition procedure is applied, wherein the measurement definition procedure comprises the following steps:
defining a measuring mode;
setting up the signal generation unit; and
setting the adjustable values for the generated signal.

18. The method according to claim 17 , wherein the measurement definition procedure further comprises the steps of:
defining a mismatch correction value of the device under test; and
defining a measurement bandwidth and an averaging value.

19. The method according to claim 15 , wherein the comparing step includes the following sub-steps:
incorporating mismatch parameters of the device under test into the comparing step;
calculating a gain value from the generated signal and the retrieved signal for each adjusted signal value; and/or
calculating a phase value between the generated signal and the retrieved signal for each adjusted signal value.

20. The method according to claim 15 , wherein the electronic measuring device is an oscilloscope.

Assignees

• Rohde & Schwarz

Inventors

• Beer Matthias

Classifications

• G01R31/2841

  Signal generators · CPC title

• G01R31/2837

  Characterising or performance testing, e.g. of frequency response (transient response G01R27/28) · CPC title

• G01R27/28 Primary

  Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response (in line transmission systems H04B3/46) · CPC title

• G01R13/0218 Primary

  Circuits therefor · CPC title