Chemical liquid preparation method of preparing a chemical liquid for substrate processing, chemical liquid preparation unit preparing a chemical liquid for substrate processing, and substrate processing system

US10186435B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10186435-B2
Application numberUS-201715630387-A
CountryUS
Kind codeB2
Filing dateJun 22, 2017
Priority dateMay 15, 2012
Publication dateJan 22, 2019
Grant dateJan 22, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

Official abstract text for this publication.

A substrate processing system includes a chemical liquid preparation unit preparing a chemical liquid to be supplied to a substrate and a processing unit which supplies the chemical liquid, prepared by the chemical liquid preparation unit, to the substrate. The chemical liquid preparation unit supplies an oxygen-containing gas, containing oxygen gas, to a TMAH-containing chemical liquid, containing TMAH (tetramethylammonium hydroxide), to make the oxygen-containing gas dissolve in the TMAH-containing chemical liquid.

First claim

Opening claim text (preview).

What is claimed is: 1. A substrate processing method comprising: a chemical liquid preparing step of stabilizing or increasing an etching rate of a TMAH-containing chemical liquid that contains TMAH (tetramethylammonium hydroxide) by causing an oxygen-containing gas that contains oxygen gas to dissolve in the TMAH-containing chemical liquid; a chemical liquid guiding step of guiding the TMAH-containing chemical liquid prepared in the chemical liquid preparing step by a chemical liquid piping; and a substrate etching step of etching a film formed on the substrate by causing a nozzle to discharge the TMAH-containing chemical liquid guided by the chemical liquid piping toward the substrate, wherein the substrate etching step is a step of etching a polysilicon film formed on the substrate by causing the nozzle to discharge the TMAH-containing chemical liquid guided by the chemical liquid piping toward the substrate. 2. The substrate processing method according to claim 1 ; wherein the chemical liquid preparing step includes an oxygen-containing gas guiding step of causing a gas piping to guide the oxygen-containing gas to a tank that stores the TMAH-containing chemical etching liquid. 3. A substrate processing method comprising: a chemical liquid preparing step of stabilizing or increasing an etching rate of a TMAH-containing chemical liquid that contains TMAH (tetramethylammonium hydroxide) by causing an oxygen-containing gas that contains oxygen gas to dissolve in the TMAH-containing chemical liquid; a chemical liquid guiding step of guiding the TMAH-containing chemical liquid prepared in the chemical liquid preparing step by a chemical liquid piping; and a substrate etching step of etching a film formed on the substrate by causing a nozzle to discharge the TMAH-containing chemical liquid guided by the chemical liquid piping toward the substrate, wherein the chemical liquid preparing step includes a measurement step of measuring a dissolved oxygen concentration in the TMAH-containing chemical liquid; a nitrogen dissolution step of supplying a nitrogen-containing gas containing nitrogen gas to the TMAH-containing chemical liquid to make the nitrogen-containing gas dissolve in the TMAH-containing chemical liquid when the dissolved oxygen concentration measured in the measurement step is higher than a predetermined concentration; and an oxygen dissolution step of supplying the oxygen-containing gas to the TMAH-containing chemical liquid to make the oxygen-containing gas dissolve in the TMAH-containing chemical liquid when the dissolved oxygen concentration measured in the measurement step is lower than the predetermined concentration.

Assignees

Inventors

Classifications

  • Process monitoring, e.g. flow or thickness monitoring · CPC title

  • using mainly spraying means, e.g. nozzles · CPC title

  • Apparatus for fluid treatment (H10P72/0441, H10P72/0448 take precedence) · CPC title

  • Anisotropic liquid etching · CPC title

  • using mainly spraying means, e.g. nozzles · CPC title

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What does patent US10186435B2 cover?
A substrate processing system includes a chemical liquid preparation unit preparing a chemical liquid to be supplied to a substrate and a processing unit which supplies the chemical liquid, prepared by the chemical liquid preparation unit, to the substrate. The chemical liquid preparation unit supplies an oxygen-containing gas, containing oxygen gas, to a TMAH-containing chemical liquid, contai…
Who is the assignee on this patent?
Screen Holdings Co Ltd
What technology area does this patent fall under?
Primary CPC classification H10P72/0424. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jan 22 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).