Substrate treatment method and substrate treatment apparatus
US-2024162032-A1 · May 16, 2024 · US
US10186435B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10186435-B2 |
| Application number | US-201715630387-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 22, 2017 |
| Priority date | May 15, 2012 |
| Publication date | Jan 22, 2019 |
| Grant date | Jan 22, 2019 |
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A substrate processing system includes a chemical liquid preparation unit preparing a chemical liquid to be supplied to a substrate and a processing unit which supplies the chemical liquid, prepared by the chemical liquid preparation unit, to the substrate. The chemical liquid preparation unit supplies an oxygen-containing gas, containing oxygen gas, to a TMAH-containing chemical liquid, containing TMAH (tetramethylammonium hydroxide), to make the oxygen-containing gas dissolve in the TMAH-containing chemical liquid.
Opening claim text (preview).
What is claimed is: 1. A substrate processing method comprising: a chemical liquid preparing step of stabilizing or increasing an etching rate of a TMAH-containing chemical liquid that contains TMAH (tetramethylammonium hydroxide) by causing an oxygen-containing gas that contains oxygen gas to dissolve in the TMAH-containing chemical liquid; a chemical liquid guiding step of guiding the TMAH-containing chemical liquid prepared in the chemical liquid preparing step by a chemical liquid piping; and a substrate etching step of etching a film formed on the substrate by causing a nozzle to discharge the TMAH-containing chemical liquid guided by the chemical liquid piping toward the substrate, wherein the substrate etching step is a step of etching a polysilicon film formed on the substrate by causing the nozzle to discharge the TMAH-containing chemical liquid guided by the chemical liquid piping toward the substrate. 2. The substrate processing method according to claim 1 ; wherein the chemical liquid preparing step includes an oxygen-containing gas guiding step of causing a gas piping to guide the oxygen-containing gas to a tank that stores the TMAH-containing chemical etching liquid. 3. A substrate processing method comprising: a chemical liquid preparing step of stabilizing or increasing an etching rate of a TMAH-containing chemical liquid that contains TMAH (tetramethylammonium hydroxide) by causing an oxygen-containing gas that contains oxygen gas to dissolve in the TMAH-containing chemical liquid; a chemical liquid guiding step of guiding the TMAH-containing chemical liquid prepared in the chemical liquid preparing step by a chemical liquid piping; and a substrate etching step of etching a film formed on the substrate by causing a nozzle to discharge the TMAH-containing chemical liquid guided by the chemical liquid piping toward the substrate, wherein the chemical liquid preparing step includes a measurement step of measuring a dissolved oxygen concentration in the TMAH-containing chemical liquid; a nitrogen dissolution step of supplying a nitrogen-containing gas containing nitrogen gas to the TMAH-containing chemical liquid to make the nitrogen-containing gas dissolve in the TMAH-containing chemical liquid when the dissolved oxygen concentration measured in the measurement step is higher than a predetermined concentration; and an oxygen dissolution step of supplying the oxygen-containing gas to the TMAH-containing chemical liquid to make the oxygen-containing gas dissolve in the TMAH-containing chemical liquid when the dissolved oxygen concentration measured in the measurement step is lower than the predetermined concentration.
Process monitoring, e.g. flow or thickness monitoring · CPC title
using mainly spraying means, e.g. nozzles · CPC title
Apparatus for fluid treatment (H10P72/0441, H10P72/0448 take precedence) · CPC title
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using mainly spraying means, e.g. nozzles · CPC title
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