Measurement method and optical receptacle

Patent metadata

Field	Value
Publication number	US-10184785-B2
Application number	US-201515539337-A
Country	US
Kind code	B2
Filing date	Dec 17, 2015
Priority date	Dec 25, 2014
Publication date	Jan 22, 2019
Grant date	Jan 22, 2019

Abstract

Provided is an optical receptacle ( 140 ) having an installation plane ( 141 ), an optical plane, and a reference plane ( 147 ). An inclination angle of the reference plane ( 147 ) with respect to the installation plane ( 141 ) is smaller than an inclination angle of the optical plane with respect to the installation plane ( 141 ). Then, a first inclination angle θ 1 that is the inclination angle of the reference plane ( 147 ) with respect to the installation plane ( 141 ) and a second inclination angle θ 2 that is an inclination angle of the optical plane with respect to the reference plane ( 147 ) are measured. Then, the first inclination angle θ 1 is added to the second inclination angle θ 2 to calculate a third inclination angle θ 3 that is the inclination angle of the optical plane with respect to the installation plane ( 141 ).

First claim

The invention claimed is:

1. A method for measuring an inclination angle of an optical flat surface relative to an installation flat surface in an optical receptacle in a noncontact manner using a laser probe, the method comprising:
providing an optical receptacle which includes an installation flat surface, an optical flat surface and a reference flat surface having an inclination angle relative to the installation flat surface, the inclination angle being smaller than an inclination angle of the optical flat surface relative to the installation flat surface;
measuring a first inclination angle that is the inclination angle of the reference flat surface relative to the installation flat surface;
measuring a second inclination angle that is an inclination angle of the optical flat surface relative to the reference flat surface; and
calculating a third inclination angle that is the inclination angle of the optical flat surface relative to the installation flat surface, by adding the first inclination angle and the second inclination angle.

2. The method according to claim 1 , further comprising relatively rotating the optical receptacle and an optical axis of laser light emitted from the laser probe, the rotating being performed between the measuring of the first inclination angle and the measuring of the second inclination angle.

3. The method according to claim 1 , wherein the third inclination angle is larger than 40°.

4. The method according to claim 3 , wherein the third inclination angle is larger than 48°.

5. The method according to claim 1 , wherein the first inclination angle and the second inclination angle are both 40° or smaller.

Assignees

• Enplas Corp

Inventors

• Morioka Shimpei
• Saito Yuki
• Niimi Tadanobu

Classifications

• G01B11/0608 Primary

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• G02B6/4292

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• G01B11/26

  for measuring angles or tapers; for testing the alignment of axes · CPC title

• G02B6/4246

  Bidirectionally operating package structures · CPC title

• G02B6/4286

  Optical modules with optical power monitoring · CPC title