Computing emission rate from gas density images
US-2024420311-A1 · Dec 19, 2024 · US
US10181202B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10181202-B2 |
| Application number | US-201514719870-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 22, 2015 |
| Priority date | May 23, 2014 |
| Publication date | Jan 15, 2019 |
| Grant date | Jan 15, 2019 |
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A control apparatus includes a projection unit configured to project a first pattern onto an object; and a selection unit configured to select a single first pattern from a plurality of first patterns. After the projection unit projects each of the plurality of first patterns having different resolutions onto the object, the projection unit projects a second pattern onto the object, the second pattern having the same resolution as that of the selected single first pattern.
Opening claim text (preview).
What is claimed is: 1. A control apparatus comprising: a projector configured to project a plurality of first patterns and then a second pattern onto an object, the plurality of first patterns having different resolutions from each other; a memory configured to store computer-readable instructions; a camera configured to capture a plurality of images of the object on which the plurality of first patterns and the second pattern are respectively projected; and a processor configured to execute the computer-readable instructions so as to: calculate a statistic value corresponding to dispersion for a luminance distribution of the plurality of captured images of the object on which each of the plurality of first patterns is projected; select a single first pattern from the plurality of first patterns based on the statistic value of each of the plurality of first patterns, the single first pattern having a smallest dot size among the plurality of first patterns; determine a first resolution of the single first pattern; and cause the projector to project the second pattern onto the object, the second pattern having the first resolution, wherein the camera is configured to capture a second pattern image of the object on which the second pattern is projected, and the processor is configured to measure three dimensions of the object based on the captured second pattern image. 2. The control apparatus according to claim 1 , wherein the processor is configured to calculate the statistic value for each of the plurality of first patterns based on the plurality of captured images of the object onto which each of the plurality of first patterns is projected. 3. The control apparatus according to claim 2 , wherein the processor is configured to calculate the statistic value for an entire region indicative of the object in each of the plurality of captured images. 4. The control apparatus according to claim 2 , wherein the processor is configured to divide a region indicative of the object in each of the plurality of captured images into a plurality of regions, and the processor is configured to calculate the statistic value for each of the plurality of divided regions, and wherein the processor is configured to select the single first pattern while considering the statistic value for each of the plurality of divided regions as the statistic value for each of the plurality of first patterns. 5. The control apparatus according to claim 2 , wherein the processor is configured to divide a region indicative of the object in each of the plurality of captured images into a plurality of regions, and the processor is configured to calculate the statistic value for each of the plurality of divided regions, and wherein the processor is configured to select the single first pattern for each of the plurality of divided regions based on the statistic value for each of the plurality of divided regions. 6. The control apparatus according to claim 2 , wherein each of the plurality of first patterns is a grid pattern depicted by a first color and a second color different from the first color, and wherein the processor is configured to calculate the statistic value corresponding to dispersion for a luminance distribution of the first color and the second color. 7. The control apparatus according to claim 6 , wherein one of the first color and the second color is a white color, and the other is a black color. 8. The control apparatus according to claim 7 , wherein the second pattern is one of the plurality of first patterns, or one of patterns different from the plurality of first patterns. 9. A robot comprising: a projector configured to project a plurality of first patterns and a second pattern onto an object, the plurality of first patterns having different resolutions from each other; a memory configured to store computer-readable instructions; a camera configured to capture a plurality of images of the object on which the plurality of first patterns and the second pattern are respectively projected; and a processor configured to execute the computer-readable instructions so as to: calculate a statistic value corresponding to dispersion for a luminance distribution of the plurality of captured images of the object on which each of the plurality of first patterns is projected; select a single first pattern from the plurality of the first patterns based on the statistic value of each of the plurality of first patterns, the single first pattern having a smallest dot size among the plurality of first patterns; determine a first resolution of the single first pattern; and cause the projector to project the second pattern onto the object, the second pattern having the first resolution, wherein the camera is configured to capture a second pattern image of the object on which the second pattern is projected, and the processor is configured to measure three dimensions of the object based on the captured second pattern image. 10. A control method for causing a processor to execute computer-readable instructions stored in a memory, the method comprising executing the computer-readable instructions on the processor the steps of: projecting a plurality of first patterns having different resolutions and a second pattern onto an object; obtaining a plurality of images of the object on which the plurality of first patterns and the second pattern are respectively projected; calculating a statistic value corresponding to dispersion for a luminance distribution of the plurality of obtained images of the object on which each of the plurality of first patterns is projected; selecting a single first pattern from the plurality of first patterns based on the statistic value of each of the plurality of first patterns, the single first pattern having a smallest dot size among the plurality of first patterns; determining a first resolution of the single first pattern; projecting the second pattern onto the object, the second pattern having the same resolution as the selected single first pattern; and obtaining a second pattern image of the object on which the second pattern is projected, wherein the processor is configured to measure three dimensions of the object based on the obtained second pattern image.
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