Chemical element analysis device and method for contaminants in liquid

Patent metadata

Field	Value
Publication number	US-10175173-B2
Application number	US-201515531069-A
Country	US
Kind code	B2
Filing date	Nov 30, 2015
Priority date	Nov 28, 2014
Publication date	Jan 8, 2019
Grant date	Jan 8, 2019

Abstract

The present invention relates to a chemical element analysis device and method for contaminants in a liquid. The chemical element analysis device for contaminants in a liquid according to the present invention comprises: a sample storage unit 10 for storing a sampled liquid sample 1 ; a laser unit 20 for emitting a laser beam 21: 21 a, 21 b , and 21 c and irradiating the laser beam 21 to the sample 1: 1 a, 1 b , and 1 c sprayed from the sample storage unit 10 ; and a spectrometer 30 for collecting plasma light 31: 31 a, 31 b , and 31 c generated by irradiating the laser beam 21 to the sample 1 , and measuring a spectrum of the plasma light 31.

First claim

The invention claimed is:

1. An apparatus for performing analysis of contaminants in a liquid, the apparatus comprising:
a sample storage unit for storing a sampled sample;
a first supply unit for receiving the sample from the sample storage unit;
a second supply unit for receiving the sample from the sample storage unit, under a predetermined condition;
a droplet spraying unit disposed in the sample storage unit and for atomizing the sample into droplets and supplying the sample into the first supply unit;
a transport plate disposed below the second supply unit and for heating and drying the sample;
a laser unit for irradiating a laser beam to the sample; and
a spectrometer for measuring a spectrum of plasma light generated by the laser beam irradiated to the sample,
wherein a laser beam is irradiated to the atomized sample supplied from the first supply unit such that the contaminants in the sample are analyzed, and
wherein, under the predetermined condition, the sample is supplied from the second supply unit and then disposed on the transport plate to be heated and dried, and then the heated and dried sample is irradiated with a laser beam such that the contaminants in the sample are analyzed.

2. The apparatus according to claim 1 , wherein wherein the predetermined condition is a case where the concentration of the contaminants in the sample is detected to be lower than the detection limit, or a case where the degree of detection of the contaminants in the sample exceeds the reference range.

3. The apparatus according to claim 1 , further comprising: a main gas jetting unit for injecting an inert gas into the sample storage unit.

4. The apparatus according to claim 1 , further comprising: a first gas jetting unit for jetting an inert gas to the sample in first supply unit.

5. The apparatus according to claim 1 , wherein the first supply unit further comprises a pump for transporting a sample.

6. The apparatus according to claim 1 , further comprising: a membrane filter for filtering the sample before a sample is stored in the sample storage unit, wherein the membrane filter has a shape of a film and a filter hole for filtering the sample is formed on the surface of the membrane filter, thereby separating a particulate matter and an ionic material in the sample.

7. The apparatus according to claim 1 , wherein a hydrophilic treatment is performed on at least one surface of the transport plate.

8. The apparatus according to claim 1 , wherein the transport plate is in the shape of a rotatable plate, and the sample supplied from the second supply unit is adsorbed and disposed on an upper surface of the transport plate, and
wherein the position of the sample is moved such that the sample is irradiated with a laser beam as the transport plate rotates.

9. The apparatus according to claim 1 , wherein the transport plate is in the shape of a plate having a predetermined length, and the sample supplied from the second supply unit is adsorbed and disposed on an upper surface of the transport plate, and
wherein the position of the sample is moved such that the sample is irradiated with a laser beam as the transport plate moves along the longitudinal direction.

10. The apparatus according to claim 1 ,
wherein a plurality of recessed placement holes is formed on the upper surface of the transport plate so that the sample is disposed.

11. The apparatus according to claim 1 , further comprising a heating unit disposed inside or below the transport plate, wherein the heating unit dries the sample disposed on the transport plate by applying heat to the sample.

12. The apparatus according to claim 1 , further comprising a second gas jetting unit for jetting an inert gas to the sample disposed on the transport plate.

13. A method for performing analysis of contaminants in a liquid using the apparatus according to claim 1 ,
wherein a laser beam is irradiated to the atomized sample supplied from the first supply unit such that the contaminants in the sample are analyzed, and
wherein, under the predetermined condition, the sample is supplied from the second supply unit and then disposed on the transport plate to be heated and dried, and then the heated and dried sample is irradiated with a laser beam such that the contaminants in the sample are analyzed.

14. The method according to claim 13 , wherein the predetermined condition is a case where the concentration of the contaminants in the sample is detected to be lower than the detection limit, or a case where the degree of detection of the contaminants in the sample exceeds the reference range.

15. The method according to claim 13 , wherein an inert gas is jetted to the sample stored in the sample storage unit.

16. The method according to claim 13 , wherein an inert gas is jetted to the sample in the sample storage unit.

17. The method according to claim 13 , wherein a particulate matter and an ionic material in the sample is separated using a membrane filter before the sample is stored in the sample storage unit, and
wherein the membrane filter has a shape of a film and a filter hole for filtering the sample is formed on a surface of the membrane filter.

18. The method according to claim 13 ,
wherein the position of the sample is moved such that the sample is irradiated with a laser beam as the transport plate moves.

19. The method according to claim 13 , wherein a hydrophilic treatment is performed on at least one surface of the transport plate.

20. The method according to claim 13 , wherein a plurality of recessed placement holes is formed on the upper surface of the transport plate so that the sample is disposed.

21. The method according to claim 13 , wherein the sample disposed on the transport plate is heated and dried by heating the transport plate with a heating unit disposed inside or below the transport plate.

22. The method according to claim 13 , wherein an inert gas is jetted to the sample disposed on the transport plate.

Assignees

• Gwangju Inst Science & Tech

Inventors

• Park Ki Hong
• Kim Gi Baek
• Kim Kyoung Woong

Classifications

• G01N2001/4088

  filtration · CPC title

• G01N2001/4027

  evaporation leaving a concentrated sample · CPC title

• G01N1/44

  Sample treatment involving radiation, e.g. heat · CPC title

• G01N21/718 Primary

  Laser microanalysis, i.e. with formation of sample plasma · CPC title

• G01N2001/4083

  sedimentation · CPC title