Method and device for defect-size evaluation

Patent metadata

Field	Value
Publication number	US-10168301-B2
Application number	US-201414898165-A
Country	US
Kind code	B2
Filing date	May 7, 2014
Priority date	Jun 20, 2013
Publication date	Jan 1, 2019
Grant date	Jan 1, 2019

Abstract

A method and a device for defect-size evaluation of defects in a test object in ultrasonic testing is provided. In particular, the method and device also allows systematic determination of defect sizes based on the SAFT method. This is done by simulating defects in a test object on the basis of a defined test scenario, and comparing these simulations with actually recorded measured values.

First claim

The invention claimed is:

1. A method for defect-size evaluation of a defect in a test object, comprising the steps:
recording a measurement-data set of a defect in the test object using actual ultrasound echo signals, wherein the measurement-data set includes a defect size of the defect, and wherein the defect size of the defect is smaller than a wavelength of the actual ultrasound echo signals;
performing a Synthetic Aperture Focusing Technique, SAFT, analysis of the recorded measurement-data set;
generating a plurality of possible defects in the test object, wherein each of the possible defects has a defect size;
calculating ultrasound echo signals for the defect sizes of the plurality of possible defects in the test object by simulating echo signals for a test scenario;
performing a SAFT analysis for the calculated ultrasound echo signals for each of the defect sizes of the plurality of possible defects;
evaluating the defect size of the defect by comparing the SAFT analysis of the recorded measurement-data with the SAFT analyses of the calculated ultrasound echo signals, wherein the step of comparing the SAFT analysis of the recorded measurement-data with the SAFT analyses of the calculated ultrasound echo signals comprises arranging an amplitude summation of each SAFT analysis of the calculated ultrasound echo signals in an evaluation matrix and comparing an amplitude summation of the SAFT analysis of the recorded measurement-data with the evaluation matrix.

2. The method as claimed in claim 1 , also comprising a step for determining a defect position in the test object from the SAFT analysis of the recorded measurement-data set, wherein the step for calculating ultrasound echo signals calculates the ultrasound echo signals for a defect at the ascertained defect position in the test object.

3. The method as claimed in claim 1 , wherein the step for calculating ultrasound echo signals calculates the ultrasound echo signals for defects at a plurality of positions inside the test object, and performs a SAFT analysis of the calculated ultrasound echo signals for each calculated defect position.

4. The method as claimed in claim 1 , wherein the step for calculating ultrasound echo signals calculates the ultrasound echo signals for a test object having a plurality of defects inside the test object.

5. The method as claimed in claim 1 , wherein the step for calculating ultrasound echo signals calculates the ultrasound echo signals for a plurality of test objects each having at least one defect.

6. The method as claimed in claim 1 , wherein the SAFT analyses of the calculated ultrasound echo signals are performed for a plurality of test objects each having at least one defect.

7. The method as claimed in claim 1 , wherein the step for the evaluation comprises a position interpolation and/or a defect-size interpolation of the SAFT analyses of the calculated ultrasound echo signals.

8. The method as claimed in claim 1 , further comprising a step for calculating ultrasound echo signals for a plurality of defect sizes in the test object using provided parameters of the test scenario.

9. The method as claimed in claim 8 , wherein the provided parameters of the test scenario comprise information about test-head parameters, a test grid, material and/or geometry of the test object.

10. The method as claimed in claim 1 , further comprising a step for providing information about a defect inside the test object, wherein the step for evaluating a defect size evaluates the defect size using the information provided.

11. The method as claimed in claim 10 , wherein the external additional information provided comprises information about an orientation of the defect in the test object.

12. The method as claimed in claim 1 , wherein a plurality of measurement-data sets are recorded, and the SAFT analysis is performed using the plurality of recorded measurement-data sets.

13. The method as claimed in claim 12 , wherein to record the plurality of measurement-data sets an actual ultrasound signal is beamed into the test object at different measurement points at an incident beam angle that is varied for each measurement-data set in order to determine the plurality of measurement-data sets.

14. The method as claimed in claim 1 , wherein the evaluated defect size is less than 3 mm.

15. The method as claimed in claim 1 , wherein the step of calculating ultrasound echo signals for a plurality of defect sizes is graduated linearly in steps of0.5 mm or 0.2 mm.

16. The method as claimed in claim 1 , wherein a position of the defect in the test object is ascertained in advance.

17. A device for defect-size evaluation of a defect inside a test object, comprising:
a test head for beaming an actual ultrasound echo signal into the test object at different measurement points in order to determine at least one measurement-data set, and
an analyzer, which is designed to perform a Synthetic Aperture Focusing Technique, SAFT, analysis of the recorded measurement-data set, to calculate ultrasound echo signals for a plurality of defect sizes in the test object by simulating echo signals for a test scenario, to perform a SAFT analysis for the calculated ultrasound echo signals for each of the plurality of defect sizes, and to evaluate a defect size in the SAFT analysis of the recorded measurement-data set by comparing with the SAFT analyses of the calculated ultrasound echo signals, wherein the analyzer also comprises a memory device, which is designed to store amplitude summations from the SAFT analysis for the calculated ultrasound echo signals, and wherein the analyzer is designed to read out from the memory unit the stored amplitude summations for the calculated ultrasound echo signals and to adapt the read-out amplitude summations for the defect-size evaluation in the SAFT analysis of the recorded measurement-data set.

18. The device of claim 17 , wherein the defect sizes evaluated are smaller than a wavelength of the actual ultrasound echo signals.

19. The device as claimed in claim 18 , wherein the measurement data set detects defect sizes less than 3 mm.

20. The device as claimed in claim 17 , wherein calculated ultrasound echo signals for a plurality of defect sizes is graduated linearly in steps of 0.5 mm or 0.2 mm.

Assignees

• Siemens Ag

Inventors

• Böhm Rainer
• Fendt Karl
• Heinrich Werner
• Mooshofer Hubert

Classifications

• G01N29/043

  in the interior, e.g. by shear waves · CPC title

• G01N29/069 Primary

  Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique · CPC title

• G01S15/8997

  using synthetic aperture techniques · CPC title

• G01N29/04

  Analysing solids (using acoustic emission techniques G01N29/14) · CPC title