X-ray fluorescence spectrometer

Patent metadata

Field	Value
Publication number	US-10168290-B2
Application number	US-201314894023-A
Country	US
Kind code	B2
Filing date	Sep 20, 2013
Priority date	May 27, 2013
Publication date	Jan 1, 2019
Grant date	Jan 1, 2019

Abstract

The present invention has an object to provide an X-ray fluorescence spectrometer capable of preventing a decrease in analysis precision of light elements whose atomic number is less than 23 and making helium gas replacement for the inside of an analysis chamber more efficient. An X-ray fluorescence spectrometer of the present invention includes: an X-ray tube 12 for irradiating a sample S on a sample stage 14 with a primary X-ray, the sample stage 14 having an X-ray passing port 141; a detector 13 for detecting a fluorescent X-ray emitted from the sample S; an analysis chamber 16 having an introduction port 17 for the primary X-ray emitted from the X-ray tube 12 and a detection port 181 for the detector 13, the analysis chamber 16 containing an internal space including an optical path of the primary X-ray from the introduction port 17 to the X-ray passing port 141 and an optical path of the fluorescent X-ray from the X-ray passing port 141 to the detection port 181; first and second introduction pipes 201 and 202 for introducing helium gas supplied from a helium gas cylinder 22 into the analysis chamber 16 through the introduction port 17 and the detection port 181, respectively; and a flow rate control valve 24 for controlling a helium gas flow rate in each of the first and second introduction pipes 201 and 202.

First claim

The invention claimed is:

1. An X-ray fluorescence spectrometer comprising:
a) an X-ray source for irradiating a sample with a primary X-ray;
b) a detector for detecting a fluorescent X-ray that is emitted from the sample when the sample is irradiated with the primary X-ray;
c) an analysis chamber having an introduction port for the primary X-ray emitted from the X-ray source and a detection port for the detector, the analysis chamber completely confining a space including an optical path of the primary X-ray from the introduction port to the sample and an optical path of the fluorescent X-ray from the sample to the detection port;
d) first introduction means for introducing helium gas into the analysis chamber through the introduction port;
e) second introduction means for introducing helium gas into the analysis chamber through the detection port; and
f) flow rate control means for controlling a flow rate of the helium gas that is introduced into the analysis chamber by each of the first introduction means and the second introduction means.

2. The X-ray fluorescence spectrometer according to claim 1 , wherein the flow rate control means includes: first flow rate control means for controlling the flow rate of the helium gas that is introduced into the analysis chamber by the first introduction means; and second flow rate control means for controlling the flow rate of the helium gas that is introduced into the analysis chamber by the second introduction means.

3. The X-ray fluorescence spectrometer according to claim 1 , wherein
the first introduction means includes a first introduction pipe having an inlet-side end part connected to a helium gas supply source and an outlet-side end part connected to the introduction port,
the second introduction means includes a second introduction pipe having an inlet-side end part connected to the helium gas supply source and an outlet-side end part connected to the detection port, and
the X-ray fluorescence spectrometer further comprises atmospheric air introduction means for forcibly introducing an atmospheric air into the analysis chamber from at least one of the first introduction pipe and the second introduction pipe.

4. The X-ray fluorescence spectrometer according to claim 2 , wherein
the first introduction means includes a first introduction pipe having an inlet-side end part connected to a helium gas supply source and an outlet-side end part connected to the introduction port,
the second introduction means includes a second introduction pipe having an inlet-side end part connected to the helium gas supply source and an outlet-side end part connected to the detection port, and
the X-ray fluorescence spectrometer further comprises atmospheric air introduction means for forcibly introducing an atmospheric air into the analysis chamber from at least one of the first introduction pipe and the second introduction pipe.

Assignees

• Shimadzu Corp

Inventors

• Furukawa Hiroaki
• Kobayashi Kanji

Classifications

• G01N2223/076

  X-ray fluorescence · CPC title

• G01N23/223 Primary

  by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence · CPC title