Identification and removal of chemical noise for improved MS and MS/MS analysis

Patent metadata

Field	Value
Publication number	US-10163619-B2
Application number	US-201515305490-A
Country	US
Kind code	B2
Filing date	Apr 21, 2015
Priority date	Apr 23, 2014
Publication date	Dec 25, 2018
Grant date	Dec 25, 2018

Abstract

A method of mass spectrometry is disclosed comprising mass analyzing ions and obtaining mass spectral data and determining parent or precursor ions of interest. The method further comprises determining first adduct or chemical artifact ions which have mass to charge ratios which have a substantially linear relationship with the mass to charge ratio of the parent or precursor ions of interest and removing or attenuating the first adduct or chemical artifact ions from the mass spectral data.

First claim

The invention claimed is:

1. A method of mass spectrometry comprising:
mass analysing ions and obtaining mass spectral data;
determining multiply charged parent or precursor ions of interest;
determining first adduct or chemical artefact ions which have mass to charge ratios which have a substantially linear relationship with the mass to charge ratio of said multiply charged parent or precursor ions of interest based on the substantially linear relationship between the mass to charge ratios of the adduct or chemical artefact ions and the mass to charge ratio of the multiply charged parent or precursor ions of interest; and
removing or attenuating said first adduct or chemical artefact ions from said mass spectral data.

2. A method as claimed in claim 1 , further comprising progressively scanning a mass to charge ratio transmission window of a mass filter.

3. A method as claimed in claim 2 , wherein said mass filter comprises a quadrupole rod set mass filter.

4. A method as claimed in claim 2 , further comprising causing said mass filter to preferentially onwardly transmit said multiply charged parent or precursor ions of interest and to attenuate or filter other parent or precursor ions.

5. A method as claimed in claim 4 , further comprising subjecting said multiply charged parent or precursor ions of interest to fragmentation or reaction so as to generate fragment or product ions.

6. A method as claimed in claim 1 , wherein said first adduct or chemical artefact ions have a non-random mass to charge ratio distribution.

7. A method as claimed in claim 1 , wherein said first adduct or chemical artefact ions comprise: (i) singly charged adduct ions; (ii) doubly charged adduct ions; (iii) triply charged adduct ions; (iv) quadruply charged adduct ions; or (v) adduct ions having five or more charges.

8. A method as claimed in claim 1 , wherein said first adduct or chemical artefact ions comprise adduct ions having lost or gained a neutral species or molecule.

9. A method as claimed in claim 1 , further comprising:
determining second or further adduct or chemical artefact ions which have mass to charge ratios which have a substantially linear relationship with the mass to charge ratio of said multiply charged parent or precursor ions of interest; and
removing or attenuating said second or further adduct or chemical artefact ions from said mass spectral data.

10. A method as claimed in claim 9 , wherein said second or further adduct or chemical artefact ions have a non-random mass to charge ratio distribution.

11. A method as claimed in claim 9 , wherein said second or further adduct or chemical artefact ions comprise: (i) singly charged adduct ions; (ii) doubly charged adduct ions; (iii) triply charged adduct ions; (iv) quadruply charged adduct ions; or (v) adduct ions having five or more charges.

12. A method as claimed in claim 9 , wherein said second or further adduct or chemical artefact ions comprise adduct ions having lost or gained a neutral species or molecule.

13. A method as claimed in claim 1 , wherein the substantially linear relationship between the mass to charge ratios of said first adduct or chemical artefact ions and the mass to charge ratio of said multiply charged parent or precursor ions of interest comprises a gradient that is related to the charge of said multiply charged parent or precursor ions of interest and the charges of said first adduct or chemical artefact ions.

14. A method as claimed in claim 1 , wherein the substantially linear relationship between the mass to charge ratios of said first adduct or chemical artefact ions and the mass to charge ratio of said multiply charged parent or precursor ions of interest comprises an offset that is related to the mass of parent or precursor ions not of interest.

15. A mass spectrometer comprising a control system which is arranged and adapted:
(i) to mass analyse ions and obtain mass spectral data;
(ii) to determine multiply charged parent or precursor ions of interest;
(iii) to determine first adduct or chemical artefact ions which have mass to charge ratios which have a substantially linear relationship with the mass to charge ratio of said multiply charged parent or precursor ions of interest based on the substantially linear relationship between the mass to charge ratios of the adduct or chemical artefact ions and the mass to charge ratio of the multiply charged parent or precursor ions of interest; and
(iv) to remove or attenuate said first adduct or chemical artefact ions from said mass spectral data.

16. A method of mass spectrometry comprising:
generating fragment ions by fragmenting parent or precursor ions;
mass analysing said fragment ions and obtaining mass spectral data;
determining parent or precursor ions of interest;
determining first adduct or chemical artefact ions which have fragment mass to charge ratios which have a substantially linear relationship with a mass to charge ratio of said parent or precursor ions of interest based on the substantially linear relationship between the fragment mass to charge ratios of the adduct or chemical artefact ions and the mass to charge ratio of the parent or precursor ions of interest; and
removing or attenuating said first adduct or chemical artefact ions from said mass spectral data; and
wherein said parent or precursor ions of interest comprise multiply charged parent or precursor ions of interest.

17. A mass spectrometer comprising a control system which is arranged and adapted:
(i) to generate fragment ions by fragmenting parent or precursor ions;
(ii) to mass analyse said fragment ions and obtain mass spectral data;
(iii) to determine parent or precursor ions of interest;
(iv) to determine first adduct or chemical artefact ions which have fragment mass to charge ratios which have a substantially linear relationship with the mass to charge ratio of said parent or precursor ions of interest based on the substantially linear relationship between the fragment mass to charge ratios of the adduct or chemical artefact ions and the mass to charge ratio of the parent or precursor ions of interest; and
(v) to remove or attenuate said first adduct or chemical artefact ions from said mass spectral data; and
wherein said parent or precursor ions of interest comprise multiply charged parent or precursor ions of interest.

Assignees

• Micromass Ltd

Inventors

• Brown Jeffery Mark

Classifications

• H01J49/0027

  Methods for using particle spectrometers · CPC title

• H01J49/4215

  Quadrupole mass filters (H01J49/4225 takes precedence) · CPC title

• H01J49/426 Primary

  Methods for controlling ions · CPC title

• H01J49/0036 Primary

  Step by step routines describing the handling of the data generated during a measurement · CPC title

• H01J49/004

  Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn · CPC title