Method for calibrating a polarisation axis measuring device and method for determining polarisation axes of spectacle lenses for a polarisation axis measuring device

US10161828B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10161828-B2
Application numberUS-201615558106-A
CountryUS
Kind codeB2
Filing dateApr 15, 2016
Priority dateApr 20, 2015
Publication dateDec 25, 2018
Grant dateDec 25, 2018

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Abstract

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In a method for calibrating a polarization axis measuring device, both flat sides of a calibration element in a polarization axis measuring device are irradiated with polarized light, wherein the method involves aligning in each case at least one polarization direction of the light in a first and/or second rotational position with a principal axis in a predefined angular relationship with respect to a polarization axis of the calibration element. Determining the rotational position of an axis of the calibration element is carried out by determining an angle bisector between the first and second rotational positions of the polarization direction of the incident light. The method involves assigning a predefined angle value for the rotational position of the principal axis of the polarization direction for which the latter is in the predefined angular relationship with respect to the axis of the calibration element inserted as intended. Furthermore, the invention relates to a method for determining polarization axes of spectacle lenses, to a calibration element, and to a polarization axis measuring device comprising a calibration element.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for calibrating a polarisation axis measuring device comprising the following steps: (i) insertion of a calibration element into the polarisation axis measuring device and irradiation of a first flat side of the calibration element with polarised light, (ii) aligning at least one polarisation direction of the light in a first rotational position with a principal axis in a predefined angular relationship with respect to a polarisation axis of the calibration element, (iii) insertion of the calibration element and irradiation of a second flat side thereof with polarised light, (iv) aligning at least one polarisation direction of the light in a second rotational position with the principal axis in a predefined angular relationship with respect to the polarisation axis of the calibration element, (v) determining the rotational position of an axis of the calibration element by determining an angle bisector between the first and second rotational positions of the polarisation direction of the incident light, and (vi) assigning a predefined angle value to the rotational position of the principal axis of the polarisation direction for which the latter is in the predefined angular relationship with respect to the axis of the calibration element inserted as intended, wherein a zero value is assigned to a third rotational position of the principal axis of the polarisation direction in the predefined angular relationship with respect to the axis the calibration element is inserted. 2. The method according to claim 1 , wherein the predetermined angular relationship is a parallel or perpendicular alignment of the principal axis with respect to the polarisation axis of the calibration element. 3. The method according to claim 1 , wherein the insertion of the calibration element into the polarisation axis measuring device takes place with the first flat side thereof directed towards a polariser, which is irradiated with unpolarised light, and wherein for alignment of the polarisation direction of the light incident on the first flat side an alignment of the polariser in a first rotational position with a principal axis takes place in a predefined angular relationship with respect to the polarisation axis of the calibration element and/or alignment of a receptacle for the calibration element, wherein the insertion of the calibration element takes place with the second flat side thereof directed towards the polariser, and wherein for alignment of the polarisation direction of the light incident on the second flat side an alignment of the polariser in a second rotational position with the principal axis takes place in the predefined angular relationship with respect to the polarisation axis of the calibration element and/or the alignment of the receptacle for the calibration element, and wherein determining the rotational position of the axis of the calibration element is carried out by determining an angle bisector between the first and second rotational positions of the polariser and assigning a predefined angle value to the rotational position of the principal axis of the polariser, for which the latter is in the predefined angular relationship with respect to the axis of the calibration element inserted as intended. 4. The method according to claim 1 , wherein a polariser with a divided field of view is used which comprises at least a first region with a first polarisation axis as well as a second region with a second polarisation axis, which adjoin one another on the principal axis, and wherein the first polarisation axis and the second polarisation axis have with respect to the principal axis an angle which is the same in terms of absolute value with opposite plus/minus signs, wherein the angle is between 2° and 5°. 5. The method according to claim 4 , wherein an alignment of the principal axis of the polariser takes place by equalising a light intensity transmitted through the first region of the polariser with the first polarisation axis and a light intensity transmitted through the second region of the polariser with the second polarisation axis to the same brightness, in particular to a low brightness. 6. The method according to claim 1 , wherein a polariser is used with an undivided field of view, which comprises at least one region with a polarisation axis, wherein the polarisation axis forms the principal axis. 7. The method according to claim 6 , wherein an alignment of the principal axis of the polariser by minimising or maximising a light intensity transmitted through one region of the polariser with the polarisation axis is carried out. 8. The method according to claim 1 , wherein the calibration element is irradiated with light from at least one light source which emits polarised light, wherein for alignment of the polarisation direction of the light incident on the first flat side an alignment of the light source in a first rotational position with a principal axis takes place in a predefined angular relationship with respect to the polarisation axis of the calibration element, wherein for alignment of the polarisation direction of the light incident on the second flat side the alignment of the light source in a second rotational position with the principal axis takes place in the predefined angular relationship with respect to the polarisation axis of the calibration element, and wherein determining the rotational position of the axis of the calibration element takes place by determining an angle bisector between the first and second rotational positions of the light source and assigning a predefined angle value to the rotational position of the principal axis of the light source, for which the latter is in the predefined angular relationship with respect to the axis of the calibration element inserted as intended. 9. The method according to claim 8 , wherein light from two light sources emitting polarised light is directed onto the calibration element, with a first polarisation axis as well as a second polarisation axis, which are arranged symmetrically with respect to the principal axis, and wherein the first polarisation axis and the second polarisation axis have with respect to the principal axis an angle which is the same in terms of absolute value with opposite plus/minus signs, wherein the angle is between 2° and 5°. 10. The method according to claim 9 , wherein an alignment of the principal axis of the light sources takes place by equalising the light intensity with the first polarisation axis and the light intensity with the second polarisation axis to the same brightness, in particular to low brightness. 11. The method according to claim 8 , wherein one single polarised light source is used with a polarisation axis, wherein the polarisation axis forms the principal axis. 12. The method according to claim 11 , wherein an alignment of the principal axis of the light source takes place by minimising or maximising a light intensity with the polarisation axis. 13. The method according to claim 1 , wherein as calibration element comprises a translucent calibration body made of polarising material which is transilluminated by the incident light, having a holder for holding the calibration body, which holder has at least one positioning device for reproducible arrangement in a receptacle for a test piece, wherein the holder has a transillumination region for transillumination of the calibration body with light, and wherein the positioning device has at least two diametrically opposed positioning elements, and wherein the calibration element as test piece is inserted into the receptacle of the polarisation axis measuring

Assignees

Inventors

Classifications

  • Constitution of standards · CPC title

  • Calibration, base line adjustment, drift correction · CPC title

  • Polarisation-affecting properties (G01N21/19 takes precedence) · CPC title

  • G01N21/19Primary

    Dichroism · CPC title

  • Details of measuring devices · CPC title

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What does patent US10161828B2 cover?
In a method for calibrating a polarization axis measuring device, both flat sides of a calibration element in a polarization axis measuring device are irradiated with polarized light, wherein the method involves aligning in each case at least one polarization direction of the light in a first and/or second rotational position with a principal axis in a predefined angular relationship with respe…
Who is the assignee on this patent?
Rodenstock Gmbh
What technology area does this patent fall under?
Primary CPC classification G01N21/19. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 25 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).