Solid state wideband fourier transform infrared spectrometer

Patent metadata

Field	Value
Publication number	US-10156476-B2
Application number	US-201514825839-A
Country	US
Kind code	B2
Filing date	Aug 13, 2015
Priority date	Nov 13, 2014
Publication date	Dec 18, 2018
Grant date	Dec 18, 2018

Abstract

A compact, low cost FTIR spectrometer with no moving parts includes an interferometer having optical paths through silicon waveguides. The optical path lengths are varied by changing the temperature and/or carrier density of at least one of the waveguides. In embodiments, the interferometer is a Mach-Zehnder interferometer. Embodiments vary both optical path lengths in opposite directions. In embodiments, a germanium or InGaAs IR detector is grown on the same wafer as the waveguides. Embodiments include a laser pump, such as a COT CW diode laser, and wavelength mixer, such as an OPGaAs or OPGaP converter, for up and/or down converting measured IR wavelengths into a range compatible with the waveguide and detector materials. The wavelength mixer can be a waveguide. Embodiments include a sample compartment and an IR source such as a glowbar. In embodiments, the sample compartment can be exposed to ambient atmosphere for analysis of gases contained therein.

First claim

We claim:

1. A Fourier Transform Infrared (“FTIR”) Spectrometer, comprising:
a controller;
an optical signal input;
an optical interferometer configured to receive an FTIR input wave from said optical signal input, said optical interferometer having at least two light paths, each of said light paths being directed through a waveguide comprising a waveguide material, all of said light paths being fixed in physical length, at least one of said light paths being configured as a diode and being variable in optical length by changing an electrical bias condition of the diode under control of said controller; and
an infrared detector, configured to receive and detect an output of the optical interferometer;
said controller being further configured to analyze the detected output of the optical interferometer, and determine therefrom a Fourier transform infrared spectrum of the FTIR input wave.

2. The FTIR spectrometer of claim 1 , wherein the interferometer is a Mach-Zehnder interferometer having two light paths.

3. The FTIR spectrometer of claim 2 , wherein the optical lengths of both of the two light paths are variable in optical length under control of said controller.

4. The FTIR spectrometer of claim 1 , wherein said waveguide material is silicon.

5. The FTIR spectrometer of claim 1 , wherein the waveguide is formed on a silicon wafer, and the FTIR detector is a germanium detector that is grown on the silicon wafer.

6. The FTIR spectrometer of claim 1 , wherein the waveguide is formed on a silicon wafer, and includes heterogeneous integration of an indium gallium arsenide (InGaAs) detector diode as the FTIR detector.

7. The FTIR spectrometer of claim 1 , further comprising a wavelength converter, said wavelength converter comprising a pump laser and an optical mixing medium.

8. The FTIR spectrometer of claim 7 , wherein the optical mixing medium is OpGaAs.

9. The FTIR spectrometer of claim 7 , wherein optical mixing medium is LiNbO 4 (LN) or Zinc Germanium Phosphide.

10. The FTIR spectrometer of claim 7 , wherein the optical mixing medium is included in a mixing waveguide device.

11. The FTIR spectrometer of claim 7 , wherein the pump laser comprises a COT CW diode laser.

12. The FTIR spectrometer of claim 1 , further comprising a sample compartment configured to contain an FTIR test sample and to allow an infrared measurement wave to pass through the FTIR test sample, said FTIR input wave being derived from said infrared measurement wave.

13. The FTIR spectrometer of claim 12 , further comprising an onboard active FTIR light source configured to generate the infrared measurement wave.

14. The FTIR spectrometer of claim 13 , wherein the onboard active light source is a glowbar.

15. The FTIR spectrometer of claim 12 , wherein the sample compartment can be configured to be in gas communication with a surrounding atmosphere for analysis of the gases contained therein.

16. A method for performing Fourier Transform Infrared (“FTIR”) spectrometry comprising the steps of:
producing an infrared wave;
passing the infrared wave through a sample;
mixing the infrared wave with an incoming pump wave;
producing an auxiliary wave, wherein the auxiliary wave is produced from mixing the infrared wave with the pump wave, wherein the auxiliary wave has a wavelength within a usable range of a first waveguide, a second waveguide, and a detector, said first and second waveguides being fixed in physical length, the second waveguide being configured as a diode;
splitting the auxiliary wave into a first beam and a second beam;
passing the first beam through the first waveguide, wherein the first waveguide has a first optical length;
passing the second beam through the second waveguide, wherein the second waveguide has a second optical length;
varying an index of refraction of the second waveguide by changing an electrical bias condition of the diode under control of a controller, wherein varying the index of refraction of the second waveguide controls and varies a difference between the second optical length and the first optical length;
causing the first and second beams to converge;
using the detector to detect an interference between the first and second beams as a function of the difference between the second optical length and the first optical length; and
determining from the detected interference a Fourier transform infra-red spectrum of the sample.

17. The method of claim 16 , further comprising changing an index of refraction of the first waveguide, such that one of the first optical length and the second optical length is increased, while the other of the first optical length and the second optical length is decreased.

Assignees

• Bae Systems Information & Electronic Systems Integration Inc
• Bae Sys Inf & Elect Sys Integ

Inventors

• Moffitt Paul R
• Ketteridge Peter A

Classifications

• G01N21/3504

  for analysing gases, e.g. multi-gas analysis · CPC title

• G01B9/02015

  characterised by the beam path configuration · CPC title

• G01J3/0205

  Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows · CPC title

• G01J3/453 Primary

  by correlation of the amplitudes · CPC title

• G01N2021/3595

  using FTIR · CPC title