Systems, devices and methods for automatic microscope focus

Patent metadata

Field	Value
Publication number	US-10146041-B1
Application number	US-201815967802-A
Country	US
Kind code	B1
Filing date	May 1, 2018
Priority date	May 1, 2018
Publication date	Dec 4, 2018
Grant date	Dec 4, 2018

Abstract

An automatic focus system for an optical microscope that facilitates faster focusing by using at least two offset focusing cameras. Each offset focusing camera can be positioned on a different side of an image forming conjugate plane so that their sharpness curves intersect at the image forming conjugate plane. Focus of a specimen can be adjusted by using sharpness values determined from images taken by the offset focusing cameras.

First claim

What is claimed is:

1. A system for automatically focusing a microscope, comprising:
an objective;
a stage for positioning a specimen on a first image forming conjugate plane;
a first focusing camera, configured for focusing, positioned on a first side of a second image forming conjugate plane at a first offset distance;
a second focusing camera, configured for focusing, positioned on a second side of the second image forming conjugate plane at a second offset distance;
wherein the first offset distance and the second offset distance are determined so that sharpness measurements for images of the specimen captured by each of the first focusing camera and the second focusing camera, at a same distance between the objective and the stage, are equal at the second image forming conjugate plane;
a primary illumination source;
an imaging device positioned on a third image forming conjugate plane; and
a hardware processor coupled to the first focusing camera and the second focusing camera that is configured to determine that the specimen is in focus when a sharpness value of the specimen using the first focusing camera is equal to a sharpness value of the specimen using the second focusing camera.

2. The system of claim 1 , wherein the hardware processor is further configured to:
measure a first sharpness value (SA1) of the specimen at a first position (Z1) of the stage relative to the objective using the first focusing camera;
measure a second sharpness value (SB1) of the specimen at the first position (Z1) of the stage relative to the objective using the second focusing camera;
measure a third sharpness value (SA2) of the specimen at a second position (Z2) of the stage relative to the objective using the first focusing camera;
measure a fourth sharpness value (SB2) of the specimen at the second position (Z2) of the stage relative to the objective using the second focusing camera;
calculate a first slope equal to (SA2−SA1)/(Z2−Z1);
calculate a second slope equal to (SB2−SB1)/(Z2−Z1); and
adjust a distance between the objective and the stage to a third position so that a fifth sharpness value (SA3) measured for the specimen using the first focusing camera is equal to a sixth sharpness value (SB3) measured for the specimen using the second focusing camera.

3. The system of claim 1 , further comprising:
a secondary illumination source;
wherein the primary illumination source is configured to emit light in a first wavelength range that is received by the imaging device; and
wherein the secondary illumination source is configured to emit light in a second wavelength range which is different from the first wavelength range and that projects light through a focusing pattern that is positioned on a fourth image forming conjugate plane that is received by the first focusing camera and the second focusing camera.

4. The system of claim 3 , wherein the hardware processor is further configured to:
adjust a distance between the objective and the stage to a fourth position (Z4) and measure a seventh sharpness value (SA4) of the specimen using the first focusing camera and an eighth sharpness value (SB4) of the specimen using the second focusing camera;
calculate a third slope equal to (SA4−SA3)/(Z4−Z3);
calculate a fourth slope equal to (SB4−SB3)/(Z4−Z3);
determine if a direction of the third slope and a direction of the second slope are opposite; and
when the direction of the third slope and the direction of the second slope are not opposite, continue to adjust the distance between the objective and the stage so that a ninth sharpness value measured for the specimen using the first focusing camera is equal to a tenth sharpness value measured for the specimen using the second focusing camera.

5. The system of claim 3 , further comprising:
a first filter positioned in an optical path between the secondary illumination source and the imaging device to prevent light from the secondary illumination source from reaching the imaging device; and
a second filter positioned in an optical path between the first illumination source and the first focusing camera and the second focusing camera to prevent light from the primary illumination source from reaching the first focusing camera and the second focusing camera.

6. The system of claim 3 , wherein the hardware processor is further configured to:
measure a first sharpness value (SA1) of the specimen at a first position (Z1) of the stage relative to the objective using the first focusing camera;
measure a second sharpness value (SB1) of the specimen at the first position (Z1) of the stage relative to the objective using the second focusing camera;
measure a third sharpness value (SA2) of the specimen at a second position (Z2) of the stage relative to the objective using the first focusing camera;
measure a fourth sharpness value (SB2) of the specimen at the second position (Z2) of the stage relative to the objective using the second focusing camera;
calculate a first slope equal to (SA2−SA1)/(Z2−Z1);
calculate a second slope equal to (SB2−SB1)/(Z2−Z1); and
adjust a distance between the objective and the stage to a third position so that a fifth sharpness value (SA3) measured for the specimen using the first focusing camera is equal to a sixth sharpness value (SB3) measured for the specimen using the second focusing camera.

7. The system of claim 6 , wherein the hardware processor is further configured to:
adjust a distance between the objective and the stage to a fourth position (Z4) and measure a seventh sharpness value (SA4) of the specimen using the first focusing camera and an eighth sharpness value (SB4) of the specimen using the second focusing camera;
calculate a third slope equal to (SA4−SA3)/(Z4−Z3);
calculate a fourth slope equal to (SB4−SB3)/(Z4−Z3);
determine if a direction of the third slope and a direction of the second slope are opposite; and
when the direction of the third slope and the direction of the second slope are not opposite, continue to adjust the distance between the objective and the stage so that a ninth sharpness value measured for the specimen using the first focusing camera is equal to a tenth sharpness value measured for the specimen using the second focusing camera.

8. The system of claim 1 , wherein the imaging device is configured for taking images of the specimen when the specimen is determined to be in focus by the first focusing camera and the second focusing camera.

9. The system of claim 1 , wherein the hardware processor is further configured to cause at least one of the stage and the objective to be moved to achieve a coarse focus and a fine focus.

10. The system of claim 1 , wherein the hardware processor is further configured to save at least one of a position of the stage relative to the objective, an absolute position of the stage, and an absolute position of the objective.

11. A method for automatically focusing a microscope having at least an objective, a stage for positioning a specimen on a first image forming conjugate plane, a first focusing camera, configured for focusing, positioned on a first side of a second image forming conjugate plane at a first offset distance, a second focusing camera, configured for focusing, positioned on a second side of the second image forming conjugate plane at a second offset distance, a primary illumination source, an imaging device positioned on a third image forming conjugate plane, the method comprising:
setting the first offset distance and the second offset distance so that sharpness measurements for images of the specimen captured by each of the first focusing camera and the second focusing camera, at a same distance between the objective

Assignees

• Nanotronics Imaging Inc

Inventors

• Putman John B
• Putman Matthew C
• Pinskiy Vadim
• Sharoukhov Denis Y

Classifications

• H04N23/45

  for generating image signals from two or more image sensors being of different type or operating in different modes, e.g. with a CMOS sensor for moving images in combination with a charge-coupled device [CCD] for still images · CPC title

• H04N23/67

  Focus control based on electronic image sensor signals · CPC title

• G02B7/38

  measured at different points on the optical axis {, e.g. focussing on two or more planes and comparing image data} · CPC title

• G02B21/002

  Scanning microscopes (scanning near field optical microscopes G01Q60/18) · CPC title

• G02B21/244 Primary

  using image analysis techniques · CPC title