Method for rejecting tuning disturbances to improve lamp failure prediction quality in thermal processes

US10140394B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10140394-B2
Application numberUS-201514841365-A
CountryUS
Kind codeB2
Filing dateAug 31, 2015
Priority dateSep 25, 2014
Publication dateNov 27, 2018
Grant dateNov 27, 2018

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

Embodiments disclosed herein include methods for reducing or eliminating the impact of tuning disturbances during prediction of lamp failure. In one embodiment, the method comprises monitoring data of a lamp module for a process chamber using one or more physical sensors disposed at different locations within the lamp module, creating virtual sensors based on monitoring data of the lamp module, and providing a prediction model for the lamp module using the virtual sensors as inputs.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for lamp failure prediction, comprising: creating virtual sensors by collecting data comprising current and resistance related to an upper lamp and a lower lamp of a lamp module disposed in a semiconductor process chamber, wherein the virtual sensors are represented as equations selected from one or more of the following: first ⁢ ⁢ virtual ⁢ ⁢ sensor = log ⁢ ⁢ ( abs ⁡ ( TII k ⁢ ⁢ 1 * TIR ) + 1 ) , ⁢ second ⁢ ⁢ ⁢ virtual ⁢ ⁢ sensor = log ⁡ ( abs ⁡ ( TOI k ⁢ ⁢ 2 * TOR ) + 1 ) , ⁢ third ⁢ ⁢ virtual ⁢ ⁢ sensor = log ⁢ ⁢ ( abs ⁢ ⁢ ( BII k ⁢ ⁢ 3 * BIR ) + 1 ) , ⁢ fourth ⁢ ⁢ virtual ⁢ ⁢ sensor = log ⁢ ⁢ ( abs ⁡ ( BOI k ⁢ ⁢ 4 * BOR ) + 1 ) , ⁢ and fifth ⁢ ⁢ virtual ⁢ ⁢ sensor = log ⁡ ( abs ⁡ ( TII k ⁢ ⁢ 1 * TIR + TOI k

Assignees

Inventors

Classifications

  • G06F30/20Primary

    Design optimisation, verification or simulation (optimisation, verification or simulation of circuit designs G06F30/30) · CPC title

  • Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks · CPC title

  • Virtual sensor · CPC title

  • Logarithmic or exponential functions · CPC title

  • Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods · CPC title

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What does patent US10140394B2 cover?
Embodiments disclosed herein include methods for reducing or eliminating the impact of tuning disturbances during prediction of lamp failure. In one embodiment, the method comprises monitoring data of a lamp module for a process chamber using one or more physical sensors disposed at different locations within the lamp module, creating virtual sensors based on monitoring data of the lamp module,…
Who is the assignee on this patent?
Applied Materials Inc
What technology area does this patent fall under?
Primary CPC classification G06F30/20. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 27 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).