Surface acoustic wave device including first and second wiring electrodes crossing three-dimensionally
US-9444427-B2 · Sep 13, 2016 · US
US10135419B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10135419-B2 |
| Application number | US-201615375360-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 12, 2016 |
| Priority date | Dec 24, 2015 |
| Publication date | Nov 20, 2018 |
| Grant date | Nov 20, 2018 |
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A surface acoustic wave device includes a piezoelectric substrate, an IDT electrode, support layers, and a cover layer. A distance from a first end of a first partition-support layer to one of the outer-periphery-frame support layers closest to the first end is smaller than a distance from a second end of the first partition-support layer to one of the outer-periphery-frame support layers closest to the second end, and a distance from a first end of a second partition-support layer to one of the outer-periphery-frame support layers closest to the first end is larger than a distance from a second end of the second partition-support layer to one of the outer-periphery-frame support layers closest to the second end.
Opening claim text (preview).
What is claimed is: 1. A surface acoustic wave device comprising: a piezoelectric substrate; an interdigital transducer electrode that is disposed on a main surface of the piezoelectric substrate and that excites a surface acoustic wave; support layers each of which is vertically arranged in a region of the main surface of the piezoelectric substrate other than a region in which the interdigital transducer electrode is disposed, and each of the support layers has a height larger than a height of the interdigital transducer electrode; and a cover layer that is disposed on the support layers and that covers the interdigital transducer electrode with a hollow space interposed between the cover layer and the interdigital transducer electrode; wherein the support layers include: a plurality of outer-periphery-frame support layers that are vertically arranged on the main surface of the piezoelectric substrate around a periphery of the region in which the interdigital transducer electrode is disposed; and a plurality of partition-support layers each of which is vertically arranged in a region of the main surface, the region being surrounded by the outer-periphery-frame support layers, the plurality of partition-support layers extending, when the piezoelectric substrate is viewed in plan, straight or substantially straight in a first direction, which is parallel or substantially parallel to the main surface, and being arranged in a second direction parallel or substantially parallel to the main surface and perpendicular or substantially perpendicular to the first direction; and the plurality of partition-support layers include a first partition-support layer and a second partition-support layer that are adjacent to each other in an arrangement of the plurality of partition-support layers and that have a characteristic described below: when the piezoelectric substrate is viewed in plan, where an end of the first partition-support layer and an end of the second partition-support layer that are oriented in the first direction are referred to as first ends, and another end of the first partition-support layer and another end of the second partition-support layer that are oriented in a direction opposite to the first direction are referred to as second ends, a distance from the first end of the first partition-support layer to one of the outer-periphery-frame support layers that is closest to the first end of the first partition-support layer is smaller than a distance from the second end of the first partition-support layer to one of the outer-periphery-frame support layers that is closest to the second end of the first partition-support layer, and a distance from the first end of the second partition-support layer to one of the outer-periphery-frame support layers that is closest to the first end of the second partition-support layer is larger than a distance from the second end of the second partition-support layer to one of the outer-periphery-frame support layers that is closest to the second end of the second partition-support layer. 2. The surface acoustic wave device according to claim 1 , wherein a portion of the first partition-support layer and a portion of the second partition-support layer are superposed with each other when viewed from the second direction. 3. The surface acoustic wave device according to claim 2 , wherein a region in which the portion of the first partition-support layer and the portion of the second partition-support layer are superposed with each other has a length of about 30 μm or smaller in the first direction. 4. The surface acoustic wave device according to claim 1 , wherein the first partition-support layer and the second partition-support layer are separated from each other by a predetermined distance in the first direction when viewed from the second direction. 5. The surface acoustic wave device according to claim 4 , wherein the predetermined distance is about 30 μm or smaller. 6. The surface acoustic wave device according to claim 1 , further comprising solder bumps exposed at an outer surface of the cover layer. 7. The surface acoustic wave device according to claim 1 , wherein the interdigital electrode defines a transmission filter. 8. The surface acoustic wave device according to claim 1 , wherein the interdigital electrode defines a reception filter. 9. The surface acoustic wave device according to claim 1 , wherein the interdigital electrode defines a duplexer. 10. The surface acoustic wave device according to claim 1 , wherein the piezoelectric substrate is made of a piezoelectric single crystal. 11. The surface acoustic wave device according to claim 10 , wherein the piezoelectric single crystal is one of lithium tantalate, lithium niobate, and quartz crystal. 12. The surface acoustic wave device according to claim 1 , wherein the interdigital electrode is made of Ti, Al, Cu, Au, Pt, Ag, Pd, or Ni, or an alloy thereof. 13. The surface acoustic wave device according to claim 1 , wherein the interdigital electrode is covered by a protective film made of a dielectric material. 14. The surface acoustic wave device according to claim 1 , wherein the support layers are made of a material including at least one of a polyimide, an epoxy resin, benzocyclobutene, polybenzoxazole, a metal, and silicon oxide. 15. The surface acoustic wave device according to claim 1 , wherein the plurality of partition-support layers do not extend to any of the outer-periphery-frame support layers. 16. The surface acoustic wave device according to claim 1 , wherein the cover layer has a multilayer structure including a lower layer that is made of a material including at least one of an epoxy resin, urethane, phenol, a polyester, benzocyclobutene, and polybenzoxazole and an upper layer that is made of a material including at least one of a polyimide, an epoxy resin, benzocyclobutene, polybenzoxazole, silicon, a silicon oxide, lithium tantalate, and lithium niobate. 17. The surface acoustic wave device according to claim 1 , further comprising: a reception filter; a transmission filter; an intermediate region disposed between the reception filter and the transmission filter; wherein the reception filter and the transmission filter are defined by the interdigital transducer electrode. 18. The surface acoustic wave device according to claim 17 , wherein the first partition-support layer and the second partition-support layer are disposed in the intermediate region.
the enclosure being defined by a cover cap mounted on an element forming part of the surface acoustic wave [SAW] device on the side of the IDT's · CPC title
including surface acoustic wave [SAW] devices · CPC title
for surface acoustic wave [SAW] devices · CPC title
of strain or mechanical damage, e.g. strain due to bending influence · CPC title
consisting of mounting pads or bumps · CPC title
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